MOTION FREE CT SAMPLING WITH ELECTRON BEAM SCANNING AND TIME DELAY INTEGRATION DETECTOR (English)
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- New search for: ZHANG TIEZHI
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2023
- Patent / Electronic Resource
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Title:MOTION FREE CT SAMPLING WITH ELECTRON BEAM SCANNING AND TIME DELAY INTEGRATION DETECTOR
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Patent number:US2023141925
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Patent applicant:
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Patent family:
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Contributors:
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2023-05-11
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Type of media:Patent
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Type of material:Electronic Resource
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Language:English
- New search for: A61B
- Further information on International Patent Classification
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Classification:
IPC: A61B DIAGNOSIS, Diagnostik -
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