REAL-TIME ANALYSIS AND CONTROL OF ELECTRON BEAM MANUFACTURING PROCESS THROUGH X-RAY COMPUTED TOMOGRAPHY (English)
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- New search for: MITCHELL STEVEN WYLIE
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2017
- Patent / Electronic Resource
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Title:REAL-TIME ANALYSIS AND CONTROL OF ELECTRON BEAM MANUFACTURING PROCESS THROUGH X-RAY COMPUTED TOMOGRAPHY
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Additional title:ANALYSE EN TEMPS RÉEL ET COMMANDE DE PROCÉDÉ DE PRODUCTION DE FAISCEAU D'ÉLECTRONS PAR TOMOGRAPHIE AUX RAYONS X ASSISTÉE PAR ORDINATEUR
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Patent number:WO2017015115
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Patent applicant:
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Patent family:
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Contributors:MITCHELL STEVEN WYLIE ( author )
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2017-01-26
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Type of media:Patent
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Type of material:Electronic Resource
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Language:English
- New search for: G06T / H01J
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