DEFECT DETECTION METHOD AND APPARATUS FOR SEMICONDUCTOR DEVICE, AND READABLE STORAGE MEDIUM (Chinese)
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- New search for: OKAZAKI SHINJI
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2021
- Patent / Electronic Resource
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Title:DEFECT DETECTION METHOD AND APPARATUS FOR SEMICONDUCTOR DEVICE, AND READABLE STORAGE MEDIUM
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Additional title:PROCÉDÉ ET APPAREIL DE DÉTECTION DE DÉFAUT POUR DISPOSITIF À SEMI-CONDUCTEUR, ET SUPPORT DE STOCKAGE LISIBLE
一种半导体器件的缺陷检查方法、装置和可读存储介质 -
Patent number:WO2021159627
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Patent applicant:
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Patent family:
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Contributors:OKAZAKI SHINJI ( author ) / LU YIFEI ( author ) / ZHAO YUHANG ( author ) / LI MING ( author ) / WANG JIANGUO ( author )
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Publisher:
- New search for: Europäisches Patentamt
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Publication date:2021-08-19
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Type of media:Patent
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Type of material:Electronic Resource
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Language:Chinese
- New search for: G06T
- Further information on International Patent Classification
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Classification:
IPC: G06T Bilddatenverarbeitung oder Bilddatenerzeugung allgemein, IMAGE DATA PROCESSING OR GENERATION, IN GENERAL -
Source: