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Last year at the HP82000 Users Group Meeting, Sandia National Laboratories gave a presentation on I(sub DDQ) testing. This year, we will present some advances on this testing including DUT board fixturing, external DC PMU measurement, and automatic IDD-All circuit calibration. This paper is geared more toward implementation than theory, with results presented from Sandia tests. After a brief summary I(sub DDQ) theory and testing concepts, we will describe how the break (hold state) vector and data formatting present a test vector generation concern for the HP82000. We than discuss fixturing of the DUT board for both types of I(sub DDQ) measurement, and how the continuity test and test vector generation must be taken into account. Results of a test including continuity, IDD-All and I(sub DDQ) Value measurements will be shown. Next, measurement of low current using an external PMU is discussed, including noise considerations, implementation and some test results showing nA-range measurements. We then present a method for automatic calibration of the IDD-All analog comparator circuit using RM BASIC on the HP82000, with implementation and measurement results. Finally, future directions for research in this area will be explored. 14 refs., 16 figs.