Low Earth Orbit Space Environment Testing of Extreme Temperature 6H-SiC JFETs on the International Space Station (English)
- New search for: Neudeck, Philip G.
- New search for: Prokop, Norman F.
- New search for: Greer, Lawrence C., III
- New search for: Chen, Liang-Yu
- New search for: Krasowski, Michael J.
- New search for: Neudeck, Philip G.
- New search for: Prokop, Norman F.
- New search for: Greer, Lawrence C., III
- New search for: Chen, Liang-Yu
- New search for: Krasowski, Michael J.
In:
Proceedings of the Materials Science Forum
;
679-690
;
2010
- Conference paper / No indication
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Title:Low Earth Orbit Space Environment Testing of Extreme Temperature 6H-SiC JFETs on the International Space Station
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Contributors:Neudeck, Philip G. ( author ) / Prokop, Norman F. ( author ) / Greer, Lawrence C., III ( author ) / Chen, Liang-Yu ( author ) / Krasowski, Michael J. ( author )
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Conference:European Conference on Silicon Carbide and Related Materials ; 2010 ; Oslo, Norway
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Published in:
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Publisher:
- New search for: NASA National Aeronautics and Space Administration
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Publication date:2010-08-29
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Type of media:Conference paper
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Type of material:No indication
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Language:English
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Contract Number:GRC-WO-667827; 20150022227
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Keywords:
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Source: