Characterization of crystal faces of polycrystalline HFCVD diamond films by STM/STS (English)
- New search for: Schirach, R.-J.
- New search for: Kolbesen, B. O.
- New search for: Aderhold, D. D.
- New search for: Comes, F. J.
- New search for: Schirach, R.-J.
- New search for: Kolbesen, B. O.
- New search for: Aderhold, D. D.
- New search for: Comes, F. J.
In:
Fresenius' Journal of Analytical Chemistry
;
358
, 1-2
; 335-338
;
1997
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ISSN:
- Article (Journal) / Print
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Title:Characterization of crystal faces of polycrystalline HFCVD diamond films by STM/STS
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Contributors:Schirach, R.-J. ( author ) / Kolbesen, B. O. ( author ) / Aderhold, D. D. ( author ) / Comes, F. J. ( author )
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Published in:Fresenius' Journal of Analytical Chemistry ; 358, 1-2 ; 335-338
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Publisher:
- New search for: Springer-Verlag
- New search for: Springer
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Place of publication:Berlin
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Publication date:1997
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ISSN:
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ZDBID:
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DOI:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
- New search for: 42.03 / 35.23 / 35.71
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Keywords:
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Source:
Table of contents – Volume 358, Issue 1-2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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9th Applied Surface Analysis Workshop (AOFA 9).Lueth, H. et al. | 1997
- 1
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9th Applied Surface Analysis Workshop (AOFA 9) Aachen, 24–27 June, 1996Lüth, H. / Rottmann, J. et al. | 1997
- 3
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Surface analysis by nondestructive testing techniques.Kroening, M. et al. | 1997
- 10
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Optical spectroscopy for in situ characterisation of semiconductor interfaces and layers.Zahn, D.R.T. et al. | 1997
- 15
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Electron energy loss spectroscopy and its application in material science.Rizzi, A. et al. | 1997
- 25
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Quantitative depth profiling of thin layers.Wetzig, K. et al. | 1997
- 32
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Identification of ultra-thin layers by cross-sectional Raman spectroscopy.Werninghaus, T. et al. | 1997
- 36
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Different techniques for determining the coating weight of phosphate layers on galvanized steel by means of FT-IR-spectrometry.Molt, K. et al. | 1997
- 42
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On the quantification of SNMS analyses of silicate glasses and oxide coatingsSchmitz, R. / Frischat, G. H. / Paulus, H. / Müller, K.-H. et al. | 1997
- 47
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Comparative studies of SIMS and SNMS analyses during the build up of sputter equilibrium under oxygen and rare gas ion bombardmentBreuer, U. / Holzbrecher, H. / Gastel, M. / Becker, J. S. / Dietze, H.-J. et al. | 1997
- 51
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Development and applications of a new IR-radiation heating in thermal desorption mass spectrometry TDMSPaulus, H. / Lammers, M. / Venema, G. / Müller, K.-H. / Scholz, J. / Züchner, H. et al. | 1997
- 54
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Nanoscale characterization of semiconductor surfaces by spatially resolved photocurrent measurements.Hiesgen, R. et al. | 1997
- 59
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Characterization of the interdiffusion in Au-Al layers by RBS.Markwitz, A. et al. | 1997
- 64
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Interface analysis of noble dental casting alloys.Reusch, B. et al. | 1997
- 67
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XPS, SIMS and SNMS applied to a combined analysis of aerosol particles from a region of considerable air pollution in the upper Rhine valleyFaude, F. / Goschnick, J. et al. | 1997
- 73
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Scanning Reactance Microscopy on organic materialsMüller, F. / Müller, A.-D. / Hietschold, M. et al. | 1997
- 77
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A combined ultrahigh vacuum scanning tunneling-scanning electron microscope systemHodel, U. / Memmert, U. / Hartmann, U. et al. | 1997
- 80
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In-situ investigations on the SILAR-growth of ZnS films as studied by tapping mode atomic force microscopyResch, R. / Friedbacher, G. / Grasserbauer, M. / Kanniainen, T. / Lindroos, S. / Leskelä, M. / Niinistö, L. et al. | 1997
- 85
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Interface characterization of PICVD-coated polymer substratesRupertus, V. / Berresheim, K. / Ottermann, C. / Thiel, S. / Kopnarski, M. / Bange, K. et al. | 1997
- 89
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X-ray absorption spectroscopy (NEXAFS) of polymer surfacesUnger, W. E. S. / Lippitz, A. / Wöll, C. / Heckmann, W. et al. | 1997
- 93
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Molecular weight determination of bulk polymer surfaces by static secondary ion mass spectrometryReihs, K. / Voetz, M. / Kruft, M. / Wolany, D. / Benninghoven, A. et al. | 1997
- 96
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Preparation and characterization of thin TiO2-films on gold/micaGrunwaldt, J.-D. / Göbel, U. / Baiker, A. et al. | 1997
- 101
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Optimization of III/V binary growth with RHEED in MOMBEUngermanns, C. / v. d. Ahe, M. / Carius, R. / Förster, A. / Hollfelder, M. / Hardtdegen, H. / Matt, M. / Nicoll, K. / Schmidt, R. / Setzer, B. et al. | 1997
- 105
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Electron microscopic characterization of SrTiO3 films obtained by anodic spark depositionSchlottig, F. / Dietrich, D. / Schreckenbach, J. / Marx, G. et al. | 1997
- 108
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Self assembled molecular monolayers on oxidized inhomogeneous aluminum surfacesBram, C. / Jung, C. / Stratmann, M. et al. | 1997
- 112
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XPS-investigations on laser-modified Si3N4 ceramics.Oswald, S. et al. | 1997
- 116
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3D-Atom-probe study of oxygen-adsorption on stepped platinum surfaces.Tieber, W. et al. | 1997
- 119
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Characterization of thin-film surfaces by fractal geometryZahn, W. / Zösch, A. et al. | 1997
- 122
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TEM and SNMS studies on the oxidation behaviour of NiCrAlY-based coatingsClemens, D. / Vosberg, V. R. / Penkalla, H. J. / Breuer, U. / Quadakkers, W. J. / Nickel, H. et al. | 1997
- 127
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Stresses in alumina scales on high-temperature alloys measured by X-ray and optical methods.Vosberg, V.R. et al. | 1997
- 131
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SNMS depth profiling in oxide scales on Fe-20Cr-5Al alloysGöbel, M. / Borchardt, G. / Weber, S. / Scherrer, S. et al. | 1997
- 135
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Characterisation of intermediate layers in hot-dip zinc coated steelsKarduck, P. / Wirth, T. / Pries, H. et al. | 1997
- 141
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Clean and ordered surfaces of CeNi2Ge2 layers on W(110).Schmied, B. et al. | 1997
- 143
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Practical experiences with electron gun charge-compensation during SIMS-analysisReger, N. / Stadermann, F. J. / Ortner, H. M. et al. | 1997
- 145
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Depth profiling analysis of thick Ni- and Co-doped oxide layers on Cr-based alloys of the interconnector of a solid oxide fuel cell using rf GDMS.Saprykin, A.I. et al. | 1997
- 148
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Combined use of lattice source interferences and divergent beam X-ray interferences to investigate the microstructure of ion-bombarded Cu-Sn-diffusion zonesDäbritz, S. / Langer, E. / Hauffe, W. et al. | 1997
- 153
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A new high luminosity UHV orange type magnetic spectrometer used for depth selective Moessbauer spectroscopy.Stahl, B. et al. | 1997
- 153
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A new high luminosity UHV orange type magnetic spectrometer used for depth selective Mössbauer spectroscopyStahl, B. / Gellert, R. / Klingelhöfer, G. / Müller, M. / Teucher, R. / Kankeleit, E. et al. | 1997
- 155
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Influence of the topography of zinc coated sheet on the results of electron probe microanalysis.Busch, P. et al. | 1997
- 159
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Progress in the accuracy enhancement for elemental analysis by quadrupole-based plasma-SNMS.Goschnick, J. et al. | 1997
- 163
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Model electrodes with defined mesoscopic structure.Friedrich, K.A. et al. | 1997
- 165
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Wavelet filtering for analytical data.Wolkenstein, M. et al. | 1997
- 169
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Surface composition of PtCo alloys.Hofer, W. et al. | 1997
- 169
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Surface composition of PtCo alloys Results of improved thermodynamic calculations incorporating data from a bulk critical stateHofer, W. / Mezey, L. Z. et al. | 1997
- 171
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3D analysis of solids using sputtered MCs+ ions.Gnaser, H. et al. | 1997
- 175
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C 1s and Au 4f7/2 referenced XPS binding energy data obtained with different aluminium oxides, -hydroxides and -fluoridesBöse, O. / Kemnitz, E. / Lippitz, A. / Unger, W. E. S. et al. | 1997
- 179
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Electrical and optical properties of melting Au-Si eutectics on Si(111).Brueggemann, M. et al. | 1997
- 182
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Adsorption of triallylamine on Si(111) and its coadsorption with triethylgallium - A combined HREELS and XPS study.Freundt, D. et al. | 1997
- 187
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Decomposition of methane on polycrystalline thick films of Ga2O3 investigated by thermal desorption spectroscopy with a mass spectrometer.Becker, F. et al. | 1997
- 189
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Surface structural and chemical characterization of Pt-Ru composite electrodes: a combined study by XPS, STM and IR spectroscopy.Cramm, S. et al. | 1997
- 193
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Cosegregation-induced formation of surface compounds on (110) and (111) oriented surfaces of bcc alloys with 3d and 4d metalsViljoen, E. C. / Eltester, B. / Uebing, C. et al. | 1997
- 193
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Cosegregation-induced formation of surface compounds on (110) and (111) oriented surfaces of bee alloys with 3d and 4d metalsViljoen, E. C. / Eltester, B. / Uebing, C. et al. | 1997
- 196
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AES and LEED investigation of Al segregation and oxidation of the (100) face of Fe85Al15 single crystals.Eltester, B. et al. | 1997
- 201
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Chemical stability of (NH4)2S-passivated InP(001) surfaces - investigations by XPS and XPD.Peisert, H. et al. | 1997
- 203
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SIMS depth profiling of vertical p-channel Si-MOS transistor structuresZastrow, U. / Loo, R. / Szot, K. / Moers, J. / Grabolla, T. / Behammer, D. / Vescan, L. et al. | 1997
- 207
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Depth profile analysis of thin film solar cells using SNMS and SIMS.Gastel, M. et al. | 1997
- 210
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New insights into the ZnO-a-SiC:H(B) interface using XPS analysis.Boehmer, E. et al. | 1997
- 214
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Application of RF GDMS for trace element analysis of nonconducting La0.65Sr0.3MnO3 ceramic layersJäger, R. / Becker, J. S. / Dietze, H.-J. / Broekaert, J. A. C. et al. | 1997
- 217
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Investigation of water diffusion into quartz using ion beam analysis techniques.Dersch, O. et al. | 1997
- 219
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Topographical and microanalytical investigation of corrosion processes on the solid material in the system metal-metalloid glassy alloy (Fe,Cr)80(P,C,Si)20, aqueous FeCl3 solution, and air in the region of the “amorphous solid/liquid/air” phase interfaceForkel, K. / Köcher, C. / Schierhorn, E. / Adam, K. / Wihsmann, F. G. / Bartos, P. J. M. et al. | 1997
- 225
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Plasma SNMS investigations on powder metallurgical Cr and Ti-48Al-2Cr after oxidation in air and ^1^5N^1^8O~2 atmosphereJenett, H. / Sunderkoetter, J. D. / Stroosnijder, M. F. et al. | 1997
- 225
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Plasma SNMS investigations on powder metallurgical Cr and Ti-48Al-2Cr after oxidation in air and 15N2-18O2 atmosphere.Jenett, H. et al. | 1997
- 230
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Oxidation behavior of mechanically alloyed chromium based alloys.Haensel, M. et al. | 1997
- 233
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Investigation of the synthesis and internal structure of protective oxide layers on high-purity chromium with SIMS scanning techniquesBrunner, C. / Hutter, H. / Piplits, K. / Wilhartitz, P. / Stroosnijder, R. / Grasserbauer, M. et al. | 1997
- 236
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Experiments on the analysis of thick, non-conductive metallic oxide layers on sheet using HF-SNMSSommer, D. / Essing, Alfons / Patotzki, Herbert et al. | 1997
- 240
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Characterization of chemically modified silica by infrared and solid state nuclear magnetic resonance spectroscopyHeger, K. / Marx, G. / Brendler, E. / Thomas, B. et al. | 1997
- 242
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Characterization of SiO2 protective coatings on polycarbonate.Jakobs, S. et al. | 1997
- 244
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Flow sorption calorimetry, a powerful tool to investigate the acid-base character of organic polymer surfacesSchneider, S. / Simon, F. / Pleul, D. / Jacobasch, H.-J. et al. | 1997
- 248
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Chemical analysis of the interface between Al thin films and polymer surfaces pretreated with KrF-excimer laser radiation.Wesner, D.A. et al. | 1997
- 251
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Surface analysis of polyethyleneterephthalate by ESCA and TOF-SIMS.Lang, F.R. et al. | 1997
- 255
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Characterisation of pure or coated metal surfaces with streaming potential measurementsBellmann, C. / Opfermann, A. / Jacobasch, H.-J. / Adler, H.-J. et al. | 1997
- 258
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Characterization of vapor phase deposited organic molecules on silicon surfacesDieckhoff, S. / Höper, R. / Schlett, V. / Gesang, T. / Possart, W. / Hennemann, O.-D. / Günster, J. / Kempter, V. et al. | 1997
- 262
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Characterisation of adsorbed layers on sulphide minerals by photoelectron spectroscopy.Schaufuss, A. et al. | 1997
- 265
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ESCA-Analysis of tin compounds on the surface of hydroxyapatite.Schenk-Meuser, K. et al. | 1997
- 268
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Investigation of aerosol particles by atomic force microscopy.Koellensperger, G. et al. | 1997
- 273
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Examination of organosilicon impregnating mixtures by static SIMS and diffuse reflectance FT-IR.Bruchertseifer, C. et al. | 1997
- 275
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Low energy ion bombardment of Ti and TiNx filmsEggs, C. / Wulff, H. / Hippler, R. et al. | 1997
- 278
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Examination of wear mechanisms of hard coatingsNiebuhr, T. / Bubert, H. / Steffens, H.-D. / Haumann, D. / Kauder, K. / Dämgen, U. et al. | 1997
- 281
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Scratch test measurement of tribological hard coatings in practice.Berg, G. et al. | 1997
- 285
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Corrosion behaviour of coated materialsPajonk, G. / Steffens, H.-D. et al. | 1997
- 290
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Density and Young's modulus of thin TiO2 films.Anderson, O. et al. | 1997
- 290
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Redistribution of zinc in MeV-implanted InP studied by SNMS and PIXE/RBS/channellingKrause, H. / Boerner, H. / Flagmeyer, R.-H. et al. | 1997
- 293
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SIMS-analysis on B, N, and C containing layers.Griesser, M. et al. | 1997
- 296
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CEMS studies of thermally treated Fe-TiN coatings on Si(1,0,0).Hanzel, D. et al. | 1997
- 300
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On the dynamic range in depth profiling with electron-gas SNMSBock, W. / Kopnarski, M. / Oechsner, H. et al. | 1997
- 304
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Characterization of Laser-Arc deposited multilayer systems by means of AES, Factor Analysis and XPS.John, A. et al. | 1997
- 308
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Preparation of polycrystalline Ti-Al-O films by magnetron sputtering ion plating: constitution, structure and morphologyv. Richthofen, A. / Cremer, Rainer / Domnick, Ralph / Neuschütz, Dieter et al. | 1997
- 312
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Preparation of cuprite (Cu2O), paramelaconite (Cu32+Cu21+O4) and tenorite (CuO) with magnetron sputtering ion plating: characterization by EPMA, XRD, HEED and SEMv. Richthofen, A. / Domnick, R. / Cremer, Rainer et al. | 1997
- 318
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Characterization of interfaces of alumina - high alloyed steels by SST and AES depth profiling.van-den-Berg, A.H.J. et al. | 1997
- 322
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Characterization of the stoichiometry of coevaporated FeSix films by AES, EDX, RBS, and electron microscopySchöpke, A. / Selle, B. / Sieber, I. / Reinsperger, G.-U. / Stauß, P. / Herz, K. / Powalla, M. et al. | 1997
- 325
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Characterization of rhenium-silicon thin filmsThomas, J. / Schumann, Joachim / Pitschke, Wolfram et al. | 1997
- 329
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Investigation of argon ion bombarded RexSi1-x thin film composites by XPS, SEM and AES.Reiche, R. et al. | 1997
- 333
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Grazing incidence X-ray diffraction analysis of surface modified SiC layers.Neuhaeuser, J. et al. | 1997
- 335
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Characterization of crystal faces of polycrystalline HFCVD diamond films by STM-STS.Schirach, R.J. et al. | 1997
- 338
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AFM and STM investigations of hydrogenated amorphous silicon: topography and barrier heightsHerion, J. / Szot, K. / Barzen, S. / Siebke, F. / Teske, M. et al. | 1997
- 341
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Correction of STM tip convolution effects in particle size and distance determination of metal-C:H filmsSchiffmann, K. I. / Fryda, Matthias / Goerigk, Günther / Lauer, Rolf / Hinze, Peter et al. | 1997
- 344
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Atomic resolution of defects in graphite studied by STM.Atamny, F. et al. | 1997
- 349
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Glass fracture surfaces seen with an atomic force microscopeWünsche, C. / Rädlein, Edda / Frischat, Günther Heinz et al. | 1997
- 352
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Investigation of surface changes on mica induced by atomic force microscopy imaging under liquids.Resch, R. et al. | 1997
- 355
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AES depth profiles of thin SiC-layers – simulation of ion beam induced mixingEcke, G. / Rößler, H. / Cimalla, V. / Liday, J. et al. | 1997
- 358
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AES Depth profiling of semiconducting multilayer structures using an ion beam bevelling techniqueProcop, M. / Klein, A. / Rechenberg, I. / Krüger, D. et al. | 1997