Radiation tolerant VLSI circuits in standard deep submicron CMOS technologies for the LHC experiments: practical design aspects (English)
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In:
IEEE Nuclear and Space Radiation Effects Conference, 1999
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1690-1696
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1999
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ISSN:
- Conference paper / Print
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Title:Radiation tolerant VLSI circuits in standard deep submicron CMOS technologies for the LHC experiments: practical design aspects
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Contributors:Anelli, G. ( author ) / Campbell, M. ( author ) / Delmastro, M. ( author ) / Faccio, F. ( author ) / Floria, S. ( author ) / Giraldo, A. ( author ) / Heijne, E. ( author ) / Jarron, P. ( author ) / Kloukinas, K. ( author ) / Marchioro, A. ( author )
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Published in:IEEE Transactions on Nuclear Science ; 46, 6, pt.1 ; 1690-1696
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Publisher:
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Publication date:1999
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Size:7 Seiten, 16 Quellen
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ISSN:
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Coden:
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DOI:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source: