Fractal processing of AFM images of rough ZnO films (English)
- New search for: Sun Xia
- New search for: Fu, Zhuxi
- New search for: Wu, Ziqin
- New search for: Sun Xia
- New search for: Fu, Zhuxi
- New search for: Wu, Ziqin
In:
Materials Characterization
;
48
, 2-3
;
169-175
;
2002
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ISSN:
- Article (Journal) / Print
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Title:Fractal processing of AFM images of rough ZnO films
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Contributors:
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Published in:Materials Characterization ; 48, 2-3 ; 169-175
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Publisher:
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Publication date:2002
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Size:7 Seiten, 15 Quellen
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
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Keywords:
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Source:
Table of contents – Volume 48, Issue 2-3
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 115
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PrefaceXu, J. B. et al. | 2002
- 117
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Quantitative complex electrical impedance microscopy by scanning evanescent microwave microscopeXiang, X. D. / Gao, C. et al. | 2002
- 127
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Fluorinated fullerene thin films on Si(111)-(7x7) surfaceSadowski, J. T. / Fujikawa, Y. / Kelly, K. F. / Nakayama, K. / Sakurai, T. / Mickelson, E. T. / Hauge, R. H. / Margrave, J. L. et al. | 2002
- 133
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Comparison of strain gage and interferometric detection for measurement and control of piezoelectric actuatorsColchero, L. / Colchero, J. / Gomez Herrero, J. / Prieto, E. / Baro, A. / Huang, W. H. et al. | 2002
- 141
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Evaluation of surface and subsurface cracks in nanoscale-machined single-crystal silicon by scanning force microscope and scanning laser microscopeSumomogi, T. / Nakamura, M. / Endo, T. / Goto, T. / Kaji, S. et al. | 2002
- 147
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Characterization of materials' nanomechanical properties by force modulation and phase imaging atomic force microscopy with soft cantileversSnitka, V. / Ulcinas, A. / Mizariene, V. et al. | 2002
- 153
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Magnetic force microscopy study of domain structures in magnetoresistance (Ni74Fe16Co10)xAg1-x granular filmsWang, H. / Li, W. Q. / Wong, S. P. / Cheung, W. Y. / Ke, N. / Xu, J. B. / Lu, X. / Yan, X. et al. | 2002
- 159
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Purity-dependent structures of Al nanoclusters on HOPG observed by STMEndo, T. / Sunada, T. / Sumomogi, T. / Maeta, H. et al. | 2002
- 163
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Surface oxidation of a Nb(100) single crystal by scanning tunneling microscopyLi, Y. / An, B. / Fukuyama, S. / Yokogawa, K. / Yoshimura, M. et al. | 2002
- 169
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Fractal processing of AFM images of rough ZnO filmsSun, X. / Fu, Z. / Wu, Z. et al. | 2002
- 177
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Sample refinement and manipulation of silicon nanowires: A step towards single wire characterizationHe, J.Z. / Xu, J.B. / Xie, Z. / Chiah, M.F. / Ke, N. / Cheung, W.Y. / Wilson, I.H. / Ma, X.L. / Tang, Y.H. / Wang, N. et al. | 2002
- 177
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Sample refinement and manipulation of silicon nanowiresHe, J. Z. / Xu, J. B. / Xie, Z. / Chiah, M. F. / Ke, N. / Cheung, W. Y. / Wilson, I. H. / Ma, X. L. / Tang, Y. H. / Wang, N. et al. | 2002
- 183
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B-induced reconstruction on Si(100)-(2x1) surface studied with scanning tunneling microscopyHu, Y. f. / Yang, J. s. / Cai, Q. et al. | 2002
- 189
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Investigation of Si and Ge growth on Si3N4/SiWang, L. / Wang, X. S. / Tang, J. C. / Cue, N. et al. | 2002
- 195
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Application of atomic force microscopy in the study of microbiologically influenced corrosionXu, L. C. / Chan, K. Y. / Fang, H. H. et al. | 2002
- 205
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Studying the high-field electron conduction of tetrahedral amorphous carbon thin films by conducting atomic force microscopyLuo, E. Z. / Lin, S. / Xie, Z. / Xu, J. B. / Wilson, I. H. / Yu, Y. H. / Yu, L. J. / Wang, X. et al. | 2002
- 211
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Studies of nanobubbles produced at liquid/solid interfacesLou, S. / Gao, J. / Xiao, X. / Li, X. / Li, G. / Zhang, Y. / Li, M. / Sun, J. / Hu, J. et al. | 2002
- 215
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Ferroelectric domain configuration and piezoelectric responses in (001)-oriented PMN-PT filmsWang, J. / Luo, E. Z. / Wong, K. H. / Chan, H. L. / Xu, J. B. / Wilson, I. H. / Choy, C. L. et al. | 2002
- 221
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Preparation of crystalline TiC thin films grown by pulsed Nd:YAG laser deposition using Ti target in methane gasSuda, Y. / Kawasaki, H. / Doi, K. / Nanba, J. / Ohshima, T. et al. | 2002
- 229
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Surface and interface morphology of CoSi2 films formed by multilayer solid-state reactionRu, G. P. / Li, B. Z. / Jiang, G. B. / Qu, X. P. / Liu, J. / Van Meirhaeghe, R. L. / Cardon, F. et al. | 2002
- 237
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Nanotube-like structures naturally formed on HOPG surfaceSun, J. / Xiao, X. / Chen, C. / Hu, J. / Li, M. / Wang, Z. / Gan, F. et al. | 2002
- 241
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Scaling analysis of Fe-implanted Ge surfaces using atomic force microscopyVenugopal, R. / Sundaravel, B. / Wilson, I. H. / Xu, J. B. et al. | 2002
- 249
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Study of polarization switching in PZT films with RuO2 electrodes by conducting atomic force microscopyWang, B. / Kwok, K. W. / Chan, H. L. / Choy, C. L. / Tong, K. Y. / Luo, E. Z. / Xu, J. B. / Wilson, I. H. et al. | 2002