Influence of temperature on the saturation of the forward voltage drift in SiC pin diodes (English)
- New search for: Caldwell, Joshua D.
- New search for: Stahlbush, Robert E.
- New search for: Glembocki, Orest J.
- New search for: Hobart, Karl D.
- New search for: Caldwell, Joshua D.
- New search for: Stahlbush, Robert E.
- New search for: Glembocki, Orest J.
- New search for: Hobart, Karl D.
In:
Meeting of the Electrochemical Society (ECS Meeting), 212, Symposium on Wide Bandgap Semiconductor Materials and Devices, 8
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239-245
;
2007
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ISBN:
- Conference paper / Print
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Title:Influence of temperature on the saturation of the forward voltage drift in SiC pin diodes
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Contributors:Caldwell, Joshua D. ( author ) / Stahlbush, Robert E. ( author ) / Glembocki, Orest J. ( author ) / Hobart, Karl D. ( author )
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Published in:ECS Transactions ; 11, 5 ; 239-245
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Publisher:
- New search for: Electrochemical Society
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Place of publication:Pennington
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Publication date:2007
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Size:7 Seiten, 3 Bilder, 14 Quellen
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ISBN:
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DOI:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
Table of contents conference proceedings
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