AUTOTESTCON '89 Conference Record: 'The Systems Readiness Technology Conference'. 'Automatic Testing in the Next Decade and the 21st Century', 25-28 Sept. 1989, Philadelphia, PA, USA
(English)
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The following topics are dealt with: functions vs. parametric testing, TLM (two-level maintenance) concept tradeoffs and logistic implications, directions on downsizing commercial instruments, status of vehicle technology enabling TLM, concurrent engineering, ATE (automatic test equipment) system architecture, software tools, embedded software, advances in modular instrumentation and systems, vehicle BIT/BITE (built-in test/built-in test equipment) allowing TLM, and the self-maintenance.
AUTOTESTCON '89 Conference Record: 'The Systems Readiness Technology Conference'. 'Automatic Testing in the Next Decade and the 21st Century', 25-28 Sept. 1989, Philadelphia, PA, USA
Additional title:
AUTOTESTCON '89 Konf.-Ber.: Konf. über System-Verfügbarkeits-Technologie, automatisches Prüfen in der nächsten Dekade u. im 21. Jahrhundert, 25. - 28. Sep. 1989, Philadelphia, USA