Reliability of industrial packaging for microsystems (English)
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In:
Reliability of Electron Devices, Failure Physics and Analysis, 1998
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1251-1260
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1998
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ISSN:
- Conference paper / Print
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Title:Reliability of industrial packaging for microsystems
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Contributors:De Reus, R. ( author ) / Christensen, C. ( author ) / Weichel, S. ( author ) / Bouwstra, S. ( author ) / Janting, J. ( author ) / Friis Eriksen, G. ( author ) / Dyrbye, K. ( author ) / Romedahl Brown, T. ( author ) / Krog, J.P. ( author ) / Sondergard Jensen, O. ( author )
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Published in:Microelectronics Reliability ; 38, 6-8 ; 1251-1260
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Publisher:
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Publication date:1998
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Size:10 Seiten, 20 Quellen
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ISSN:
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Coden:
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DOI:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source: