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Optical frequency metrology in the bending modes region
Free accessBASE | 2020|Keywords: Optical metrology -
High-precision contactless optical 3D-metrology of silicon sensors
Elsevier | 2019|Keywords: Optical metrology -
Numerical and experimental study of the characteristic functions of polygon scanners [7390-42]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Modelling of laser range measurement of underwater objects in maritime environment [7390-39]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Talbot effect with aberrated beams [7390-38]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Method of matrix Riccati equation for nanoshape control of diffraction gratings [7390-19]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Spatial elliptical polariscope for polarization distribution measurements [7390-08]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Reduced basis method for fast and robust simulation of electromagnetic scattering problems [7390-17]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Temperature sensitivity of TE double-negative metamaterial optical sensor [7390-09]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Digital sinusoidal fringe pattern generation: Defocusing binary patterns VS focusing sinusoidal patterns
Elsevier | 2009|Keywords: Optical metrology -
Fabrication of tunable grating with silver nanoparticles [7390-46]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Modeling of adaptive compensation of aberrations of optical system using deformable mirror [7390-35]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Estimation of 3D reconstruction errors in a stereo-vision system [7390-32]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Analysis of the positioning error on lateral shearing surface reconstruction with a Fizeau interferometer [7390-22]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Shape measurement of diffuse and transparent objects by two wavelength contouring using phase retrieval [7390-12]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Depth-of-field extension and 3D reconstruction in digital holographic microscopy [7390-49]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Inverse optical design: building and testing an artificial eye [7390-04]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Determination of phase and modulation transfer function (PTF and MTF) of a printer by the convolution of transmission function measurement [7390-41]
British Library Conference Proceedings | 2009|Keywords: Optical metrology -
Optical testing of a parabolic trough solar collector by a null screen with stitching [7390-37]
British Library Conference Proceedings | 2009|Keywords: Optical metrology
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