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A novel model for calculating the inter-electrode capacitance of wedge-strip anode
American Institute of Physics | 2016| -
Method for solving hard mask layer silicon nitride residue on dual active region graphic wafer
Free accessEuropean Patent Office | 2015| -
Method for measuring automatic-adjustment casual inspection frequency according to integrated circuit process capability indexes
Free accessEuropean Patent Office | 2015| -
Method for monitoring cleanliness of vacuum cavity of electron microscope
Free accessEuropean Patent Office | 2015| -
Ion release deficiency improvement method based on model
Free accessEuropean Patent Office | 2015| -
Defect detecting method for detecting photoresist residue at bottom of pattern
Free accessEuropean Patent Office | 2015|
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