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A Low-Cost Highly Reliable SEU-Tolerant SRAM: Prototype and Test Results
British Library Online Contents | 1995| -
An Approach for Designing Total-Dose Tolerant MCMs Based on Current Monitoring
British Library Conference Proceedings | 1995| -
Criteria for Static Current Estimation: How Good are They? An Approach Incorporating IC Quality Requirements
British Library Conference Proceedings | 1999|Contributors: Lubaszewski, M. -
Design and Validation of Configurable Online Aging Sensors in Nanometer-Scale FPGAs
British Library Online Contents | 2013| -
Design of Built-In Current Sensors for Concurrent Checking in Radiation Environments
British Library Online Contents | 1993| -
Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations
British Library Online Contents | 2016| -
Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations
British Library Online Contents | 2016| -
Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach
British Library Online Contents | 2012| -
Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip
Online Contents | 2005| -
Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip
British Library Online Contents | 2005| -
Generalised trade-off model for energy-efficient WSN synchronisation
British Library Online Contents | 2015| -
Hybrid Soft Error Detection by Means of Infrastructure IP Cores
British Library Conference Proceedings | 2004| -
Hybrid solutions for leveraging SoC robustness in EMI-exposed environments
British Library Conference Proceedings | 2006| -
Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits
British Library Online Contents | 2016| -
Improving Reconfigurable Systems Reliability by Combining Periodical Test and Redundancy Techniques: A Case Study
British Library Online Contents | 2001| -
Improving Reconfigurable Systems Reliability by Combining Periodical Test and Redundancy Techniques: A Case Study
British Library Conference Proceedings | 2003| -
Introducing SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: Are They A Good Remedy
British Library Conference Proceedings | 2003| -
Modeling and Simulation of Time Domain Faults in Digital Systems
British Library Conference Proceedings | 2004|
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