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Industrial glass X-ray tube and preparation method thereof
Free accessEuropean Patent Office | 2024| -
Lámpara que comprende diseños y construcciones de múltiples componentes
Free accessEuropean Patent Office | 2024| -
METHOD FOR VERIFYING EMISSION AXIS OF ELECTRON BEAM EMITTED FROM PHOTOCATHODE, AND METHOD FOR ALIGNING EMISSION AXIS OF ELECTRON BEAM EMITTED FROM PHOTOCATHODE
Free accessEuropean Patent Office | 2024| -
UV/VUV-EMITTING PLASMA LAMP, ITS USE AND METHOD OF FORMING IT
Free accessEuropean Patent Office | 2024| -
MULTI-BEAM GENERATING UNIT WITH INCREASED FOCUSING POWER
Free accessEuropean Patent Office | 2024| -
Microscopy imaging method for 3D tomography with predictive drift tracking for multiple charged particle beams
Free accessEuropean Patent Office | 2024| -
Industrial hemispherical metal glass X-ray tube and preparation method thereof
Free accessEuropean Patent Office | 2024| -
Mass spectrometer with charge up determiner using ion intensity signal
Free accessEuropean Patent Office | 2024| -
X-RAY SYSTEM WITH INTERNAL COLLIMATION AND EXTERNAL COLLIMATION
Free accessEuropean Patent Office | 2024| -
MINIATURE ELECTRON OPTICAL COLUMN WITH A LARGE FIELD OF VIEW
Free accessEuropean Patent Office | 2024| -
Method of processing sample, particle beam system and computer program product
Free accessEuropean Patent Office | 2024| -
Vielstrahl-Teilchenmikroskop mit verbessertem Strahlrohr
Free accessEuropean Patent Office | 2024| -
BEAM DETECTOR MULTI-CHARGED PARTICLE BEAM IRRADIATION DEVICE AND METHOD OF ADJUSTING BEAM DETECTOR
Free accessEuropean Patent Office | 2024 -
Transmission charged particle microscope with an electron energy loss spectroscopy detector
Free accessEuropean Patent Office | 2024| -
Vacuum high-pressure X-ray tube and preparation process thereof
Free accessEuropean Patent Office | 2024| -
Detector comprising transmission secondary electron emission means
Free accessEuropean Patent Office | 2024| -
Ray tube capable of improving conversion efficiency of single-energy X-rays
Free accessEuropean Patent Office | 2024| -
Sample Inspection Apparatus, Inspection System, Thin Piece Sample Fabrication Apparatus, and Method for Inspecting Sample
Free accessEuropean Patent Office | 2024| -
Scanning electron microscope device and electron beam inspection apparatus
Free accessEuropean Patent Office | 2024| -
Swirler for laser-sustained plasma light source with reverse vortex flow
Free accessEuropean Patent Office | 2024| -
- - THE SYSTEMS AND THE METHODS FOR COMPENSATING FOR THE DISPERSION OF THE BEAM SPLITTER AT THE SINGLE-BEAM OR THE MULTI-BEAM APPARATUS
Free accessEuropean Patent Office | 2024 -
DISTURBANCE COMPENSATION FOR CHARGED PARTICLE BEAM DEVICES
Free accessEuropean Patent Office | 2024| -
Methods and apparatuses for adjusting beam condition of charged particles
Free accessEuropean Patent Office | 2024|
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