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Synonyms were used for: AIP
Search without synonyms: keywords:(AIP)
Used synonyms:
- arzt im praktikum
- turnusarzt
-
W-band antenna in package module with hybrid glass-compound WLFO process
Emerald Group Publishing | 2022|Keywords: AIP -
Status of Non-contact Electrical Measurements
British Library Conference Proceedings | 2003|Keywords: AIP -
Characterization of Ion-Implantation in Silicon by Using Laser Infrared Photo-Thermal Radiometry (PTR)
British Library Conference Proceedings | 2003|Keywords: AIP -
Status and Prospects for VUV Ellipsometry (Applied to High-kappa and Low-kappa Materials)
British Library Conference Proceedings | 2003|Keywords: AIP -
In Situ Sputtering Rate Measurement by Laser Interferometer Applied to SIMS Analyses
British Library Conference Proceedings | 2003|Keywords: AIP -
Ultra-shallow Depth Profiling by Secondary Ion Mass Spectrometry Techniques
British Library Conference Proceedings | 2003|Keywords: AIP -
X-Ray Porosimetry as a Metrology to Characterize the Pore Structure of Low-kappa Dielectric Films
British Library Conference Proceedings | 2003|Keywords: AIP -
Characterization of Barrier Layer Phase and Morphology as a Function of Differing Dielectric Substrate Conditions by AFM and Grazing Angle XRD
British Library Conference Proceedings | 2003|Keywords: AIP -
Analysis and Control of Copper Plating Bath Additives and By-Products
British Library Conference Proceedings | 2003|Keywords: AIP -
Measurement of Gate-Oxide Film Thicknesses by X-Ray Photoelectron Spectroscopy
British Library Conference Proceedings | 2003|Keywords: AIP -
Non-contact Electrical Doping Profiling
British Library Conference Proceedings | 2003|Keywords: AIP -
Practical Fab Applications of X-Ray Metrology
British Library Conference Proceedings | 2003|Keywords: AIP -
Characterization of Porous, Low-kappa Dielectric Thin-Films Using X-Ray Reflectivity
British Library Conference Proceedings | 2003|Keywords: AIP -
Quantification of Local Elastic Properties Using Ultrasonic Force Microscopy
British Library Conference Proceedings | 2003|Keywords: AIP -
Characterization of Organic Contaminants Outgassed from Materials Used in Semiconductor Fabs/Processing
British Library Conference Proceedings | 2003|Keywords: AIP -
Optical Properties of Jet-Vapor-Deposited TiAlO and HfAlO Determined by Vacuum Ultraviolet Spectroscopic Ellipsometry
British Library Conference Proceedings | 2003|Keywords: AIP -
Material Characterization and the Formation of Nanoporous PMSSQ Low-kappa Dielectrics
British Library Conference Proceedings | 2003|Keywords: AIP -
Correlation of Surface and Film Chemistry with Mechanical Properties in Interconnects
British Library Conference Proceedings | 2003|Keywords: AIP -
Advanced Mask Inspection and Metrology
British Library Conference Proceedings | 2003|Keywords: AIP
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