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Development of a scanning electron microscopy with polarization analysis system for magnetic imaging with ns time resolution and phase-sensitive detection
American Institute of Physics | 2018|Keywords: Microscopy and Imaging -
Optically coupled methods for microwave impedance microscopy
American Institute of Physics | 2018|Keywords: Microscopy and Imaging -
Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques
American Institute of Physics | 2018|Keywords: Microscopy and Imaging -
Electron diffraction and imaging for atom probe tomography
American Institute of Physics | 2018|Keywords: Microscopy and Imaging -
A high-resolution combined scanning laser and widefield polarizing microscope for imaging at temperatures from 4 K to 300 K
American Institute of Physics | 2017|Keywords: Microscopy and Imaging -
Development of a spectroscopic Mueller matrix imaging ellipsometer for nanostructure metrology
American Institute of Physics | 2016|Keywords: Microscopy and Imaging -
Upgrade of a commercial four-probe scanning tunneling microscopy system
American Institute of Physics | 2017|Keywords: Microscopy and Imaging -
Development of a tomographic Mueller-matrix scatterometer for nanostructure metrology
American Institute of Physics | 2018|Keywords: Microscopy and Imaging -
Scanning microwave microscopy applied to semiconducting GaAs structures
American Institute of Physics | 2018|Keywords: Microscopy and Imaging -
The ReactorAFM: Non-contact atomic force microscope operating under high-pressure and high-temperature catalytic conditions
Free accessAmerican Institute of Physics | 2015|Keywords: Microscopy and Imaging -
Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy
Free accessAmerican Institute of Physics | 2017|Keywords: Microscopy and Imaging -
Metrological large range magnetic force microscopy
Free accessAmerican Institute of Physics | 2018|Keywords: Microscopy and Imaging -
Definition of design guidelines, construction, and performance of an ultra-stable scanning tunneling microscope for spectroscopic imaging
American Institute of Physics | 2018|Keywords: Microscopy and Imaging -
Parallel 2D FFT implementation on FPGA suitable for real-time MR image processing
American Institute of Physics | 2018|Keywords: Microscopy and Imaging -
Improved algorithm for processing grating-based phase contrast interferometry image sets
American Institute of Physics | 2014|Keywords: Microscopy and Imaging -
A direct electron detector for time-resolved MeV electron microscopy
American Institute of Physics | 2017|Keywords: Microscopy and Imaging -
From dull to shiny: A novel setup for reflectance difference analysis under catalytic conditions
American Institute of Physics | 2017|Keywords: Microscopy and Imaging -
Electron-bombarded 〈110〉-oriented tungsten tips for stable tunneling electron emission
American Institute of Physics | 2016|Keywords: Microscopy and Imaging -
Ambient-pressure atomic force microscope with variable pressure from ultra-high vacuum up to one bar
American Institute of Physics | 2018|Keywords: Microscopy and Imaging -
Cryogenic STM in 3D vector magnetic fields realized through a rotatable insert
American Institute of Physics | 2017|Keywords: Microscopy and Imaging
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