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Ellipsometric analysis of Cd1−xZnxSe thin films prepared by a thermal evaporation technique
National licenceIOP Institute of Physics | 2011| -
Effect of thermal annealing on the structural and optical properties of ZnO thin films deposited by the reactive e-beam evaporation technique
National licenceIOP Institute of Physics | 2010| -
Photoluminescence and structural analysis of wurtzite (ZnO)1−x(V2O5)x composite
PaperIOP Institute of Physics | 2018| -
Texture of the nano-crystalline AlN thin films and the growth conditions in DC magnetron sputtering
Free accessDOAJ | 2015|
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