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Factors affecting the dissociation width of dissociated dislocations in FCC metals and alloys
British Library Online Contents | 2016| -
Electron microscope study of dislocations introduced by deformation in a Si between 77 and 873 K
Springer Verlag | 2012| -
Electron microscope study of dislocations introduced by deformation in a Si between 77 and 873 K
Online Contents | 2012| -
Electron microscope study of dislocations introduced by deformation in a Si between 77 and 873 K
Online Contents | 2012| -
Transmission electron microscopy observation of thin foil specimens prepared by means of a focused ion beam
American Institute of Physics | 1998| -
Toughening of a brittle material by means of dislocation subboundaries
National licenceTaylor & Francis Verlag | 2000| -
Experimental evidence for Suzuki segregation to the stacking fault of an extended dislocation in a Cu-Si alloy
National licenceTaylor & Francis Verlag | 1983| -
Electron microscope study of dislocations introduced by deformation in a Si between 77 and 873 K
British Library Online Contents | 2013| -
Burgers vector determination of dislocations in an elastically anisotropic crystal by high-order reflection imaging technique in a HVEM
National licenceTaylor & Francis Verlag | 1984| -
Impact of a Combined Use of Focused Ion Beam Technique and Transmission Electron Microscopy on Materials Characterization
British Library Online Contents | 2005| -
REVIEWS - In situ observation of solid-liquid interfaces by transmission electron microscopy
Online Contents | 2005|
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