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Polyimide Surface Characteristics for Adhesion Strength at the Interface Between Polyimide and Mold Resin
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Quantitative Analysis of Voids in LSI Packages by Spectroscopy Technique in Scanning Acoustic Tomograph
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Plating Structure, Cracking Resistance and Dewetting at Heel Portion of Leads
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Voltage Contrast Application for Hybrid Circuit Analysis
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
A New Degradation Mechanism of Al-Si-Pd/TiN/Ti/PtSi Contacted Shallow P-N Junction Under Forward Current Stress
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
A Comparative Study of the Gate-to-Drain Overlap Effects on the Hot-carrier Immunity of LDD N-and P-Channel MOSFET's
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
YAG Laser Cutter Optimization
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Tin Migration During Pressure Cooker Test
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Extendability of Key Interconnection Elements to Meet Future Packaging Requirements (Invited Paper)
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Electrostatic Discharge Failures in Input Protection Networks - A Comparative Study
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Chemically Enhanced Etching with a Focused Ion Beam: Applications to IC Failure Analysis and Device Modification
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Leakage Failures Induced by Outgassing from Conductive IC Packaging Tubes
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
A Spectroscopic Emission Microsocpy System for Analysis Avalanche Breakdown of n-Channel MOSFETs
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
A Model Relating Wearout and Breakdown in Thin Silicon Oxide Films
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
A Method for Predicting Properties of Suitable Molding Compounds for IC Packages
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Dark lines - Are They Always the Same?
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Pop-Corn Package Cracking: Critical Review and New Findings
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Real Time EOS/ESD Testing Under EMMI
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
VLSI-Circuit-Design for Reliability: Managing Physical Failure Mechanisms on Circuit Level
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y.
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