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Observation of dislocations in hen egg‐white lysozyme crystals by synchrotron monochromatic‐beam X‐ray topography
Wiley | 2009|Keywords: 61.72.Dd -
Characterization of dislocations in orthorhombic hen egg‐white lysozyme crystals by synchrotron X‐ray topography
Wiley | 2007|Keywords: 61.72.Dd -
Sensitivity of triple‐crystal X‐ray diffractometers to microdefects in silicon
Wiley | 2009|Keywords: 61.72.Dd -
Study by XRD of the lattice swelling of PuGa alloys induced by self-irradiation
Elsevier | 2007|Keywords: 61.72.Dd -
Characterization of InP porous layer by high‐resolution X‐ray diffraction
Wiley | 2007|Keywords: 61.72.Dd -
The effect of TiO2 on the microstructural and electrical properties of low voltage varistor based on (Sn,Ti)O2 ceramics
Wiley | 2010|Keywords: 61.72.Dd -
Application of positron annihilation spectroscopy on the ion implantation damaged Fe–Cr alloys
Elsevier | 2008|Keywords: 61.72.Dd -
Structural defects in homoepitaxial diamond layers grown on off‐axis Ib HPHT substrates
Wiley | 2006|Keywords: 61.72.Dd -
X‐ray synchrotron diffraction studies of III–V semiconductor compounds implanted with hydrogen
Wiley | 2006|Keywords: 61.72.Dd -
Elliptical micropipes in SiC revealed by computer simulating phase contrast images
Wiley | 2009|Keywords: 61.72.Dd -
Bulk growth of SiC – review on advances of SiC vapor growth for improved doping and systematic study on dislocation evolution
Wiley | 2008|Keywords: 61.72.Dd -
High resolution X‐ray diffraction analyses of ion‐implanted GaN/AlN/Si heterostructures
Wiley | 2007|Keywords: 61.72.Dd -
Electrical resistivity evolution in the annealed amorphous Fe78Si9B13 ribbons
Elsevier | 2008|Keywords: 61.72.Dd -
High‐resolution X‐ray diffraction study of CZ‐grown GaAsP crystals
Wiley | 2007|Keywords: 61.72.Dd -
Synchrotron X‐ray diffraction studies of large sapphire crystal grown by Kyropoulos‐like method
Wiley | 2010|Keywords: 61.72.Dd -
X‐ray diffraction peaks from misfit dislocations in double‐ and triple‐crystal diffractometry
Wiley | 2007|Keywords: 61.72.Dd
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