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Characterization of sputtered titanium silicide ohmic contacts on n-type 6H-silicon carbide
British Library Conference Proceedings | 1999| -
Characterization of sputtered titanium silicide ohmic contacts on n-type 6H-silicon carbide
British Library Online Contents | 1999| -
Depth Profiling of Thin TiSi~x-Films on Silicon Carbide by SNMS
British Library Online Contents | 1998| -
Depth Profiling of Thin TiSi~x-Films on Silicon Carbide by SNMS
British Library Conference Proceedings | 1998| -
Detection in the ppm range and high-resolution depth profiling with the new SNMS instrument INA-X
Online Contents | 2003| -
Detection in the ppm range and high-resolution depth profiling with the new SNMS instrument INA-X
Springer Verlag | 2003| -
Detection in the ppm range and high-resolution depth profiling with the new SNMS instrument INA-X
Online Contents | 2003| -
Detection in the ppm range and high-resolution depth profiling with the new SNMS instrument INA-X
British Library Online Contents | 2004| -
High resolution depth profiling of non-conducting samples with SNMS
British Library Conference Proceedings | 1995|Contributors: Oechsner, H. -
High resolution depth profiling of non-conducting samples with SNMS
National licenceSpringer Verlag | 1995| -
High resolution depth profiling of non-conducting samples with SNMS
British Library Online Contents | 1995|Contributors: Oechsner, H. -
On the dynamic range in depth profiling with electron-gas SNMS
National licenceSpringer Verlag | 1997| -
On the dynamic range in depth profiling with electron-gas SNMS
British Library Conference Proceedings | 1997| -
On the dynamic range in depth profiling with electron-gas SNMS
British Library Online Contents | 1997|
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