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Thirtieth Anniversary of Biannual International Conference on Ion Beam Modification of Materials, IBMM - From "Ion Implantation" to "Ion Beam Modification"
British Library Online Contents | 2009| -
Thirtieth Anniversary of Biannual International Conference on Ion Beam Modification of Materials, IBMM - From "Ion Implantation" to "Ion Beam Modification"
British Library Conference Proceedings | 2009| -
Wedge etching by anodic oxidation and determination of shallow boron profile by ion beam analysis
Online Contents | 2008| -
Wedge etching by anodic oxidation and determination of shallow boron profile by ion beam analysis
Online Contents | 2008| -
The ``EOTVOS'' Program in Space Research - 1979-1986
British Library Conference Proceedings | 2010| -
Transfer of Scientific Results into Industry: A Controversial Problem in Central and Eastern Europe
British Library Conference Proceedings | 1997| -
Damage Production and Self-Annealing During Molecular Implantation Analyzed by RBS and Ellipsometry
Online Contents | 1996| -
Materials Science and its Importance in Middle and Central Europe
British Library Conference Proceedings | 1995| -
Lattice location calculation of elements implanted in Si by miedema parameters
National licenceElsevier | 1987| -
Shallow, titanium‐silicided p+n junction formation by triple germanium amorphization
National licenceAmerican Institute of Physics | 1992| -
Behavior of antimony above solid solubility in silicon produced by implantation and laser annealing
National licenceTaylor & Francis Verlag | 1980| -
Wedge etching by anodic oxidation and determination of shallow boron profile by ion beam analysis
British Library Online Contents | 2008| -
Electron inelastic mean free path (IMFP) in single crystal BeO by Rutherford backscattering (RBS) and Auger electron spectroscopy (AES)
American Institute of Physics | 1983| -
Phase separation in interactions of tantalum–chromium alloy on Si
American Institute of Physics | 1983| -
Considerations on effect of local temperature on primary defect production
British Library Conference Proceedings | 1996| -
Considerations on effect of local temperature on primary defect production
British Library Online Contents | 1995| -
Ion‐induced amorphous and crystalline phase formation in Al/Ni, Al/Pd, and Al/Pt thin films
National licenceAmerican Institute of Physics | 1983| -
Considerations on effect of local temperature on primary defect production
British Library Conference Proceedings | 1995| -
Evaluation of Silicon Nitride Layers of Various Composition by Backscattering and Channeling‐Effect Measurements
National licenceAmerican Institute of Physics | 1971| -
Analysis of Amorphous Layers on Silicon by Backscattering and Channelling Effect Measurements
Free accessBASE | 1999|
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