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Semi-quantitative analysis of the depth distribution of radiative recombination centers in silicon power devices by cross-sectional cathodoluminescence
National licenceAmerican Institute of Physics | 2012| -
Semi-quantitative analysis of the depth distribution of radiative recombination centers in silicon power devices by cross-sectional cathodoluminescence (5 pages)
British Library Online Contents | 2012| -
Raman scattering in AlAs/GaP and AlAs/AlP strained short-period superlattices
British Library Online Contents | 2005| -
Structure Analysis of In-Grown Stacking Faults and Investigation of the Cause for High Reverse Current of 4H-SiC Schottky Barrier Diode
British Library Conference Proceedings | 2009| -
Structure Analysis of In-Grown Stacking Faults and Investigation of the Cause for High Reverse Current of 4H-SiC Schottky Barrier Diode
British Library Online Contents | 2009| -
Optical Discrimination of TSDs and TEDs in 4H-SiC Substrates and Epitaxial Layers by Phase Contrast Microscopy Method
British Library Conference Proceedings | 2019| -
Expansion of Stacking Faults by Electron-Beam Irradiation in 4H-SiC Diode Structure
British Library Conference Proceedings | 2009| -
Characterization of Threading Dislocation in Si-doped GaN Films by High Spatial Resolution Cathodoluminescence Spectroscopy
British Library Conference Proceedings | 2003| -
Characterization of silicon nanostructures by near-field Raman spectroscopy
British Library Conference Proceedings | 2008| -
Expansion of Stacking Faults by Electron-Beam Irradiation in 4H-SiC Diode Structure
British Library Online Contents | 2009| -
Measurement of temperature-dependent stress in copper-filled silicon vias using polarized Raman spectroscopy (6 pages)
British Library Online Contents | 2013| -
Characterization of Carrier Concentration and Stress Distributions in Compound Semiconductor Devices by Raman and Cathodoluminescence Spectroscopies
British Library Conference Proceedings | 2000| -
Characterization of carrier and stress distributions in semiconductor devices by cathodoluminescence spectroscopy and Raman microprobe
British Library Conference Proceedings | 2000| -
Cathodoluminescence Microcharacterization of Radiative Recombination Centers in Lifetime-Controlled Insulated Gate Bipolar Transistors (4 pages)
British Library Online Contents | 2010|
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