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Fully Integrated Linear Single Photon Avalanche Diode (SPAD) Array with Parallel Readout Circuit in a Standard 180 nm CMOS Process
American Institute of Physics | 2011| -
The effect of spatial filtering on the performance of TOF imaging systems
British Library Online Contents | 1997| -
Robotic-assisted gynaecological surgery-establishing training criteria; minimizing operative time and blood loss
British Library Online Contents | 2008| -
Coherent detection of enchanced back-scatter from rough surfaces and particle suspensions
British Library Online Contents | 1998| -
Full-field heterodyne interference microscope with spatially incoherent illumination
British Library Online Contents | 2004| -
Coherent detection of enhanced back-scatter from rough surfaces and particle suspensions
National licenceTaylor & Francis Verlag | 1998| -
Surface plasmon-assisted widefield non-linear imaging of gold structures
British Library Online Contents | 2008| -
Wide-field surface plasmon microscopy with solid immersion excitation
National licenceAmerican Institute of Physics | 2004| -
Surface-plasmon microscopy with a two-piece solid immersion lens: bright and dark fields
British Library Online Contents | 2006| -
Phase sensitive array detection with polarisation modulated differential sensing
British Library Online Contents | 2006| -
A comparison of the performance of spatial-filtering and time-of-flight imaging systems
British Library Conference Proceedings | 1996| -
Characterization of layered scattering media using polarized light measurements and neural networks
British Library Online Contents | 2003| -
Remote photoacoustic detection of liquid contamination of a surface
British Library Online Contents | 2003| -
Measurement of polarization fluctuations in polydispersions of small spheroids [3754-08]
British Library Conference Proceedings | 1999| -
Total internal reflection microscopy for live imaging of cellular uptake of sub-micron non-fluorescent particles
British Library Online Contents | 2008| -
Sub-pixel image correlation: an alternative to SAM and dye penetrant for crack detection and mechanical stress localisation in semiconductor packages
British Library Online Contents | 2004| -
Wide-field surface plasmon microscopy with solid immersion excitation
British Library Online Contents | 2004|
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