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A 16-bit Brent-Kung Adder scheme for linear array photon counting circuit
American Institute of Physics | 2023|Keywords: ELECTRONIC AND COMPUTER ENGINEERING -
Laser line detection for groove butt joint type based on vision system
American Institute of Physics | 2023|Keywords: ELECTRONIC AND COMPUTER ENGINEERING -
Hybrid non scan with built-in self-test for fault coverage improvement
American Institute of Physics | 2023|Keywords: ELECTRONIC AND COMPUTER ENGINEERING -
Pedestrian attribute recognition: Upper body clothing classification
American Institute of Physics | 2023|Keywords: ELECTRONIC AND COMPUTER ENGINEERING -
Malicious traffic classification using hybrid heuristic-payload based technique with machine learning
American Institute of Physics | 2023|Keywords: ELECTRONIC AND COMPUTER ENGINEERING -
High-throughput and low-latency ASIC implementation of lightweight cryptography
American Institute of Physics | 2023|Keywords: ELECTRONIC AND COMPUTER ENGINEERING -
Foreword to the special issue on ionizing-radiation effects in microelectronics
Springer Verlag | 2008Keywords: Electronic and Computer Engineering -
Estimating IC susceptibility to single-event latchup
Springer Verlag | 2008|Keywords: Electronic and Computer Engineering -
A new RREQ message forwarding technique based on Bayesian probability theory
Free accessBASE | 2012|Keywords: Electronic and Computer Engineering -
Tungstic acid-assisted thermal oxidation of GaAs
Springer Verlag | 2007|Keywords: Electronic and Computer Engineering -
Using collaborative computing technologies to enable the sharing and integration of simulation services for product design
Free accessBASE | 2012|Keywords: Electronic and Computer Engineering -
Simulating the response of SOS CMOS building blocks to pulsed ionizing irradiation
Springer Verlag | 2008|Keywords: Electronic and Computer Engineering -
Evaluating the effect of temperature on the accuracy of laser simulation of the transient radiation response in semiconductor devices and circuits
Springer Verlag | 2008|Keywords: Electronic and Computer Engineering -
Achieving sub-1.6-nm resolutions of a low-voltage microscopic focused-ion-beam system not involving aberration correction
Springer Verlag | 2008|Keywords: Electronic and Computer Engineering -
Method for online nondestructive hardness assurance for CMOS LSI circuits realized in SOS technology
Springer Verlag | 2008|Keywords: Electronic and Computer Engineering -
The algorithmic model of a pipelined analog-to-digital converter
Springer Verlag | 2007|Keywords: Electronic and Computer Engineering -
Modeling of deep grooving of silicon in the process of plasmochemical cyclic etching/passivation
Springer Verlag | 2007|Keywords: Electronic and Computer Engineering -
Kinetics and mechanisms of Cl2 or HCl plasma etching of copper
Springer Verlag | 2007|Keywords: Electronic and Computer Engineering -
Flip-chip bump-lead fabrication: A review
Springer Verlag | 2008|Keywords: Electronic and Computer Engineering -
Microwave method for SOS quality testing
Springer Verlag | 2008|Keywords: Electronic and Computer Engineering
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