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TIB reading rooms collection
LUH institutes collection
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2007 IEEE International Test Conference : [ITC 2007]; Santa Clara, CA, 21 - 26 October 2007; [at ITC Test Week; Test Week: October 21 - 26, conference & exhibition: October 23 - 25] / [sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section] ; [2]
TIBKAT | 2007| -
2009 International Conference on Test and Measurement : (ICTM 2009); Hong Kong, 5 - 6 December 2009 / [co-sponsored by Institute of Electrical and Electronics Engineers, USA; IEEE Instrumentation and Measurement Society; Intelligent Information Technology Application Research Association, Hong Kong]. Ed.: Qi Luo ... ; Vol. 1
TIBKAT | 2009| -
2009 International Conference on Test and Measurement : (ICTM 2009); Hong Kong, 5 - 6 December 2009 / [co-sponsored by Institute of Electrical and Electronics Engineers, USA; IEEE Instrumentation and Measurement Society; Intelligent Information Technology Application Research Association, Hong Kong]. Ed.: Qi Luo ... ; Vol. 2
TIBKAT | 2009|
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Freely accessible part of the collaborative K10plus catalogue with materials relevant for interlibrary loan and direct delivery services.