Scanning Microscopies: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences Conference 2013 Scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 30 April - 1 May 2013, Baltimore, Maryland, United States ; [part of SPIE defense, security + sensing] List of contributions 2012 Scanning microscopies 2012: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 24 - 26 April 2012, Baltimore, Maryland, United States ; [the Scanning Microscopies: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences Conference ... merged with the SPIE Defense, Security and Sensing (DSS 2012) Conference] List of contributions