The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
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Volume 96,
Issue 3
Volume 96,
Issue 2
Volume 96,
Issue 1
Volume 95,
Issue 3
Volume 95,
Issue 2
Volume 95,
Issue 1
Volume 94,
Issue 3
Volume 94,
Issue 2
Volume 94,
Issue 1
Volume 93,
Issue 3
Volume 93,
Issue 2
Volume 93,
Issue 1
Volume 92,
Issue 3
Volume 92,
Issue 2
Volume 92,
Issue 1
Volume 91,
Issue 3
Volume 91,
Issue 2
Volume 91,
Issue 1
Volume 90,
Issue 3
Volume 90,
Issue 2
Volume 90,
Issue 1
Volume 89,
Issue 3
Volume 89,
Issue 2
Volume 89,
Issue 1
Volume 88,
Issue 3
Volume 88,
Issue 2
Volume 88,
Issue 1
Volume 87,
Issue 3
Volume 87,
Issue 2
Volume 87,
Issue 1
Volume 86,
Issue 3
Volume 86,
Issue 2
Volume 86,
Issue 1
Volume 85,
Issue 3
Volume 85,
Issue 2
Volume 85,
Issue 1
Volume 84,
Issue 3
Volume 84,
Issue 2
Volume 84,
Issue 1
Volume 83,
Issue 3
Volume 83,
Issue 2
Volume 83,
Issue 1
Volume 82,
Issue 3
Volume 82,
Issue 2
Volume 82,
Issue 1
Volume 81,
Issue 3
Volume 81,
Issue 2
Volume 81,
Issue 1
Volume 80,
Issue 3
Volume 80,
Issue 2
Volume 80,
Issue 1
Volume 79,
Issue 3
Volume 79,
Issue 2
Volume 79,
Issue 1
Volume 78,
Issue 3
Volume 78,
Issue 2
Volume 78,
Issue 1
Volume 77,
Issue 3
Volume 77,
Issue 2
Volume 77,
Issue 1
Volume 76,
Issue 3
Volume 76,
Issue 2
Volume 76,
Issue 1
Volume 75,
Issue 3
Volume 75,
Issue 2
Volume 75,
Issue 1
Volume 74,
Issue 3
Volume 74,
Issue 2
Volume 74,
Issue 1
Volume 73,
Issue 3
Volume 73,
Issue 2
Volume 73,
Issue 1
Volume 72,
Issue 3
Volume 72,
Issue 2
Volume 72,
Issue 1
Volume 71,
Issue 3
Volume 71,
Issue 2
Volume 71,
Issue 1
Volume 70,
Issue 3
Volume 70,
Issue 2
Volume 70,
Issue 1
Volume 69,
Issue 3
Volume 69,
Issue 2
Volume 69,
Issue 1
Volume 68,
Issue 3
Volume 68,
Issue 2
Volume 68,
Issue 1
Volume 67,
Issue 3
Volume 67,
Issue 2
Volume 67,
Issue 1
Volume 66,
Issue 3
Volume 66,
Issue 2
Volume 66,
Issue 1
Volume 65,
Issue 3
Volume 65,
Issue 2
Volume 65,
Issue 1
Volume 64,
Issue 3
Volume 64,
Issue 2
Volume 64,
Issue 1
Volume 63,
Issue 3
Volume 63,
Issue 2
Volume 63,
Issue 1
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 3
Volume 61,
Issue 2
Volume 61,
Issue 1
Volume 60,
Issue 3
Volume 60,
Issue 2
Volume 60,
Issue 1
Volume 59,
Issue 3
Volume 59,
Issue 2
Volume 59,
Issue 1
Volume 58,
Issue 3
Volume 58,
Issue 2
Volume 58,
Issue 1
Volume 57,
Issue 3
Volume 57,
Issue 2
Volume 57,
Issue 1
Volume 56,
Issue 3
Volume 56,
Issue 2
Volume 56,
Issue 1
Volume 55,
Issue 3
Volume 55,
Issue 2
Volume 55,
Issue 1
Volume 54,
Issue 3
Volume 54,
Issue 2
Volume 54,
Issue 1
Volume 53,
Issue 3
Volume 53,
Issue 2
Volume 53,
Issue 1
Volume 52,
Issue 3
Volume 52,
Issue 2
Volume 52,
Issue 1
Volume 51,
Issue 3
Volume 51,
Issue 2
Volume 51,
Issue 1
Volume 50,
Issue 3
Volume 50,
Issue 2
Volume 50,
Issue 1
Volume 49,
Issue 3
Volume 49,
Issue 2
Volume 49,
Issue 1
Volume 48,
Issue 3
Volume 48,
Issue 2
Volume 48,
Issue 1
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 3
Volume 46,
Issue 2
Volume 46,
Issue 1
Volume 45,
Issue 3
Volume 45,
Issue 2
Volume 45,
Issue 1
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 3
Volume 43,
Issue 2
Volume 43,
Issue 1
Volume 42,
Issue 3
Volume 42,
Issue 2
Volume 42,
Issue 1
Volume 41,
Issue 3
Volume 41,
Issue 2
Volume 41,
Issue 1
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 3
Volume 36,
Issue 2
Volume 36,
Issue 1
Volume 35,
Issue 3
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 3
Volume 27,
Issue 1
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue 3
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
Volume 9,
Issue 3
Volume 9,
Issue 2
Volume 9,
Issue 1
Volume 8,
Issue 6
Volume 8,
Issue 3
Volume 8,
Issue 2
Volume 8,
Issue 1
Volume 7,
Issue 3
Volume 7,
Issue 2
Volume 7,
Issue 1
Volume 6,
Issue 3
Volume 6,
Issue 2
Volume 6,
Issue 1
Volume 5,
Issue 3
Volume 5,
Issue 2
Volume 5,
Issue 1
Volume 4,
Issue 3
Volume 4,
Issue 2
Volume 4,
Issue 1
Volume 3,
Issue 3
Volume 3,
Issue 2
Volume 3,
Issue 1
Volume 2,
Issue 3
Volume 2,
Issue 2
Volume 2,
Issue 1
Volume 1,
Issue 3
Volume 1,
Issue 2
Volume 1,
Issue 1
>
Table of contents
87
Evidence of phase transition in porous silicon
Elhouichet, H.
/ Oueslati, M.
et al.
| 2001
91
Infrared near-field study of a localised absorption in a thin film
Gross, N.
/ Dazzi, A.
/ Ortega, J. M.
et al.
| 2001
99
AC conductivity and dielectric properties of In2 S3 films
Seyam, M. A. M.
/ Bekheet, A. E.
/ Elfalaky, A.
et al.
| 2001
105
High frequency model of stacked film capacitors
Talbert, T.
/ Joubert, C.
/ Daude, N.
et al.
| 2001
113
Design and characterization of high voltage devices integrated in a standard CMOS technology
Villard, B.
/ Calmon, F.
/ Gontrand, C.
et al.
| 2001
121
Two-dimensional modelling of CH4 -H2 radio-frequency discharges for a-C:H deposition
Leroy, O.
/ Videlot, H.
/ Jolly, J.
et al.
| 2001
131
Numerical modeling of the transmission of breakdown plasma generated in water during laser shock processing
Sollier, A.
/ Berthe, L.
/ Fabbro, R.
et al.
| 2001
141
Polystyrene thin films treatment under DC pulsed discharges conditions in oxygen
Clément, F.
/ Held, B.
/ Soulem, N.
et al.
| 2001
149
Aerodynamic focusing of clusters into a high intensity and low divergence supersonic beam
Vahedi Tafreshi, H.
/ Benedek, G.
/ Piseri, P.
et al.
| 2001
157
Void fraction prevision in LCM parts
Labat, L.
/ Bréard, J.
/ Pillut-Lesavre, S.
et al.
| 2001