IEEE transactions on reliability
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
Table of contents
- 35
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Predicting field-performance of automotive electronic productsAgarwal, R. et al. | 1996
- 353
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Rituals - The Quick & Easy WayEvans, R. et al. | 1996
- 42
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Opinion Items| 1996
- 354
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What is software failure ?Chillarege, R. et al. | 1996
- 355
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Knowledge vs understandingGottfried, P. et al. | 1996
- 356
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Comment on the Editorial: What Was Measured?!Yellman, T.W. et al. | 1996
- 357
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Tutorials: Real reliability . Difficulties with reliability incentives| 1996
- 358
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1997 Symposium -- 20 Tutorials during 3.5 days (at no extra charge)| 1996
- 359
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Mean residual life for discrete random variablesSalvia, A. et al. | 1996
- 359
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Some results on discrete mean residual lifeSalvia, A.A. et al. | 1996
- 362
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Engineering notion of mean-residual-life & hazard-rate for finite populations with known distributionsEbrahimi et al. | 1996
- 362
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Engineering notion of mean-residual-life and hazard-rate for finite populations with known distributionsEbrahimi, N. et al. | 1996
- 369
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Estimating the cumulative downtime distribution of a highly reliable componentJeske, D. et al. | 1996
- 374
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1996 P. K. McElroy Award . 1996 Alan O. Plait Award| 1996
- 375
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A system-based component test plan for a series system, with type-II censoringRajgopal, J. et al. | 1996
- 379
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Development test programs for 1-shot systems: 2-state reliability and binary development-test resultsHuang, Mu-Yeh / McBeth, D. / Vardeman, S.B. et al. | 1996
- 379
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Development test program for 1-shot systems: 2-State reliability and binaryHuang et al. | 1996
- 386
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Proportional hazards modeling of time-dependent covariates using linear regression: A case studyKumar et al. | 1996
- 386
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Proportional hazards modeling of time-dependent covariates using linear regression: a case study (mine power cable reliability)Kumar, D. / Westberg, U. et al. | 1996
- 392
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Publications Price List for 1996| 1996
- 393
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Computational algebra applications in reliability theoryHartless, G. et al. | 1996
- 400
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The use of precautionary loss-functions in risk analysisNorstrom, J. et al. | 1996
- 403
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Invitation to Membership in the Reliability Society| 1996
- 404
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Time-constrained scheduling during high-level synthesis of fault-secure VLSI digital signalKarri et al. | 1996
- 404
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Time-constrained scheduling during high-level synthesis of fault-secure VLSI digital signal processorsKarri, R. / Orailoglu, A. et al. | 1996
- 413
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A cut-based method for terminal-pair reliabilityChen, Y. et al. | 1996
- 416
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Free Proceedings| 1996
- 417
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Applications & extensions of the chains-of-rare-events modelBarraza, N. et al. | 1996
- 417
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Applications and extensions of the chains-of-rare-events modelBarraza, R. / Cernuschi-Frias, B. / Cernuschi, F. et al. | 1996
- 498
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Correction to: A unified domination approach for reliability analysis of networks with arbitrary logic| 1996
- 422
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A linear-time algorithm to find modules of fault treesDutuit, Y. et al. | 1996
- 421
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Tutorial Papers -- Physics & Chemistry of Failure| 1996
- 426
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An efficient stiffness-insensitive method for transient analysis of Markov availability modelsMalhotra, M. et al. | 1996
- 429
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A fast algorithm for repair-depot reliability-evaluationLinton, D. et al. | 1996
- 433
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Age-dependent models for evaluating risks & costs of surveillance & maintenance ofMartorell et al. | 1996
- 433
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Age-dependent models for evaluating risks and costs of surveillance and maintenance of componentsMartorell, S. / Munoz, A. / Serradell, V. et al. | 1996
- 442
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Manuscripts Received| 1996
- 443
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Fault injection for formal testing of fault toleranceAvresky, D. et al. | 1996
- 456
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Using neural networks to predict software faults during testingKhosgoftaar, T. et al. | 1996
- 463
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Generalized linear models in software reliability: Parametric & semi-parametric approachesEl Aroui et al. | 1996
- 463
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Generalized linear models in software reliability: parametric and semi-parametric approachesEl Aroui, M.A. / Lavergne, C. et al. | 1996
- 471
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Bayes estimation for the Pareto failure-model using Gibbs samplingTiwari, R. et al. | 1996
- 476
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Corrections to: Plastic packaging is highly reliable| 1996
- 477
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Hierarchical Bayes estimation for the exponential-multinomial model in reliabilityPapadopoulos et al. | 1996
- 477
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Hierarchical Bayes estimation for the exponential-multinomial model in reliability and competing risksPapadopoulos, A.S. / Tiwari, R.C. / Zalkikar, J.N. et al. | 1996
- 485
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Predictive Bayes design of scram systems: Related mathematics and philosophical implicationsClarotti et al. | 1996
- 491
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A Bayes approach to step-stress accelerated life testingDorp, J.van et al. | 1996
- 499
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A Bayes ranking of survival distributions using accelerated or correlated dataZimmer, W. et al. | 1996
- 505
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A reliability-growth model in a Bayes-decision frameworkCalabria, R. / Guida, M. / Pulcini, G. et al. | 1996
- 511
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Information for Readers & Authors| 1996