IEEE transactions on reliability
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Table of contents
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Populations? ...And Influence PeopleEvans, R. A. et al. | 1994
- 1
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Populations?| 1994
- 1
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...And Influence People| 1994
- 1
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EDITORIALSEvans, R.A. et al. | 1994
- 2
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Failure-mechanism models for material aging due to interdiffusionLi, J. et al. | 1994
- 11
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Implementing a relational database for an accelerated-life-test facilityBarton, R. et al. | 1994
- 22
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The nature of defect patterns on integrated-circuit wafer mapsTyagi, A. et al. | 1994
- 29
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Opinion Items| 1994
- 30
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Supply-current diagnosis of VLSI circuitsFrenzel, J. et al. | 1994
- 30
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Power-supply current diagnosis of VLSI circuitsFrenzel, J.F. et al. | 1994
- 38
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Free Proceedings| 1994
- 39
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Network s-t reliability bounds using a 2-dimensional reliability polynomialBulka, D. et al. | 1994
- 46
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Customer-driven reliability models for multistate coherent systemsBoedigheimer, R. et al. | 1994
- 51
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Reliability polynominals and link importance in networksPage, L.B. / Perry, J.E. et al. | 1994
- 51
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Reliability polynomials and link importance in networksPage, L. et al. | 1994
- 59
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Comment on "Cut set analysis of networks using basic minimal paths and network decomposition"Prasad, V.C. / Sankar, V. / Prakasa Rao, K.S. et al. | 1994
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Manuscripts Received| 1994
- 61
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Simultaneous confidence intervals for all ratios to the best: The exponential distributionKumar, N. et al. | 1994
- 65
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A class of subset selection procedures for Weibull populationsGill, A. et al. | 1994
- 70
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Reliability-Centered MaintenanceSmith, A.M. et al. | 1994
- 71
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Reliability of a standby system with beta-distributed component livesPham, T. et al. | 1994
- 76
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The Lorenz and scaled total-time-on-test-transform curves: A unified approachPham, T. et al. | 1994
- 84
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1994 P.K. McElroy Award| 1994
- 85
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A 2-level environmental-stress-screening (ESS) model: A mixed-distribution approachReddy, R. et al. | 1994
- 91
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Average type-II censoring times for the 2-parameter Weibull distributionHsieh, H. et al. | 1994
- 97
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Structures of systems with exponential life and HNBUE componentsCai, J. et al. | 1994
- 100
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Publications Price List for 1994| 1994
- 101
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Reliability of k-out-of-n:G systems with imperfect fault-coverageAkhtar, S. et al. | 1994
- 107
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Reliability of a large consecutive-k-out-of-r-from-n:F system with unequal component reliabilityCai, J. et al. | 1994
- 112
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Computer-assisted fault-tree construction using a knowledge-based approachElliott, M. et al. | 1994
- 121
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MetaPrime: An interactive fault-tree analyzerCoudert, O. et al. | 1994
- 128
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Bayes estimation of the piece-wise exponential distributionGamerman, D. et al. | 1994
- 132
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Bayes credibility intervals for reliability of series systems with very reliable componentsTang, J. et al. | 1994
- 138
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Bayes reliability estimation using multiple sources of prior information: Binomial samplingSavchuk, V. et al. | 1994
- 145
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Process characterization & optimization based on censored data from highly fractionated experimentsLu, J. et al. | 1994
- 145
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Process characterization and optimization based on censored data from highly fractionated experimentsLu, J.C. / Unal, C. et al. | 1994
- 156
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Improvement deterioration, and optimal replacement under age-replacement with minimal repairBagai, I. et al. | 1994
- 163
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The number of working periods of a repairable Markov system during a finite time intervalCsenki, A. et al. | 1994
- 169
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Invitation to Membership in the Reliability Society| 1994
- 170
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Shunt capacitor effect on electrical distribution system reliabilitySallam, A. et al. | 1994
- 176
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Past Editors| 1994
- 177
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Referee list| 1994
- 183
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Information for Readers & Authors| 1994
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BOOK REVIEWSEvans, R.A. et al. | 1994