IEEE transactions on reliability
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
Table of contents
- 191
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IEEE copyright form| 2005
- 2
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Comment on: a hazard function approximation used in reliability theoryAmari, S.V. et al. | 2005
- 2
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COMMENTARY - Comment on: A Hazard Function Approximation Used in Reliability TheoryAmari, S.V. et al. | 2005
- 3
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Lifetime distribution based degradation analysisZehua Chen, / Shurong Zheng, et al. | 2005
- 3
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Lifetime Data Analysis - Lifetime Distribution Based Degradation AnalysisChen, Z. et al. | 2005
- 11
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Lifetime Data Analysis - The Trunsored Model and Its Applications to Lifetime Analysis: Unified Censored and Truncated ModelsHirose, H. et al. | 2005
- 11
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The trunsored model and its applications to lifetime analysis: unified censored and truncated modelsHirose, H. et al. | 2005
- 22
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Lifetime Data Analysis - Testing Exponentiality Based on the Kullback-Leibler Information With the Type II Censored DataPark, S. et al. | 2005
- 22
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Testing exponentiality based on the Kullback-Leibler information with the type II censored dataSangun Park, et al. | 2005
- 27
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Lifetime Data Analysis - A Comparison of Two Simple Prediction Intervals for Exponential DistributionBalakrishnan, N. et al. | 2005
- 27
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A comparison of two simple prediction intervals for exponential distributionBalakrishnan, N. / Lin, C.-T. / Ping-Shing Chan, et al. | 2005
- 34
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Lifetime Data Analysis - Estimation of Parameters of Life From Progressively Censored Data Using Burr-XII ModelSoliman, A.A. et al. | 2005
- 34
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Estimation of parameters of life from progressively censored data using Burr-XII modelSoliman, A.A. et al. | 2005
- 43
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Lognormal and Weibull accelerated life test plans under distribution misspecificationPascual, F.G. / Montepiedra, G. et al. | 2005
- 43
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Life Testing - Lognormal and Weibull Accelerated Life Test Plans Under Distribution MisspecificationPascual, F.G. et al. | 2005
- 53
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Accelerated life tests at higher usage ratesGuangbin Yang, et al. | 2005
- 53
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Life Testing - Accelerated Life Tests at Higher Usage RatesYang, G. et al. | 2005
- 58
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Life Testing - A Multiple Objective Framework for Planning Accelerated Life TestsTang, L.-C. et al. | 2005
- 58
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A multiple objective framework for planning accelerated life testsLoon-Ching Tang, / Kai Xu, et al. | 2005
- 64
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Optimal simple step-stress plan for cumulative exposure model using log-normal distributionAlhadeed, A.A. / Shie-Shien Yang, et al. | 2005
- 64
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Life Testing - Optimal Simple Step-Stress Plan for Cumulative Exposure Model Using Log-Normal DistributionAlhadeed, A.A. et al. | 2005
- 69
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A concurrent built-in self-test architecture based on a self-testing RAMVoyiatzis, I. / Paschalis, A. / Gizopoulos, D. et al. | 2005
- 69
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Life Testing - A Concurrent Built-In Self-Test Architecture Based on a Self-Testing RAMVoyiatzis, I. et al. | 2005
- 79
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Effect of CVD-SiO/sub 2/ film on reliability of GaAs MESFET with Ti/Pt/Au gate metalSaito, Y. / Hashinaga, T. / Nakajima, S. et al. | 2005
- 79
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Effect of CVD - SiO~2 Film on Reliability of GaAs MESFET With Ti/Pt/Au Gate MetalSaito, Y. / Hashinaga, T. / Nakajima, S. et al. | 2005
- 79
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Physics of Failure - Effect of CVD -- SiO2 Film on Reliability of GaAs MESFET With Ti-Pt-Au Gate MetalSaito, Y. et al. | 2005
- 83
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A probabilistic approach to evaluate the reliability of piezoelectric micro-actuatorsZhimin He, / Han Tong Loh, / Eng Hong Ong, et al. | 2005
- 83
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Physics of Failure - A Probabilistic Approach to Evaluate the Reliability of Piezoelectric Micro-ActuatorsHe, Z. et al. | 2005
- 92
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Optimal age-replacement policy for nonrepairable products under renewing free-replacement warrantyYeh, R.H. / Gaung-Cheng Chen, / Ming-Yuh Chen, et al. | 2005
- 92
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Maintenance - Optimal Age-Replacement Policy for Nonrepairable Products Under Renewing Free-Replacement WarrantyYeh, R.H. et al. | 2005
- 98
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Toward a deeper understanding of the availability of series-systems without aging during repairsSchneeweiss, W.G. et al. | 2005
- 98
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Maintenance - Toward a Deeper Understanding of the Availability of Series-Systems Without Aging During RepairsSchneeweiss, W.G. et al. | 2005
- 100
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Modeling and analysis of correlated software failures of multiple typesYuan-Shun Dai, / Min Xie, / Kim-Leng Poh, et al. | 2005
- 100
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Software Reliability - Modeling and Analysis of Correlated Software Failures of Multiple TypesDai, Y.-S. et al. | 2005
- 107
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Adjusting software failure rates that are estimated from test dataJeske, D.R. / Xuemei Zhang, / Pham, L. et al. | 2005
- 107
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Software Reliability - Adjusting Software Failure Rates That Are Estimated From Test DataJeske, D.R. et al. | 2005
- 115
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On failure recoverability of client-server applications in mobile wireless environmentsChen, I.-R. / Baoshan Gu, / George, S.E. et al. | 2005
- 115
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Network Reliability - On Failure Recoverability of Client-Server Applications in Mobile Wireless EnvironmentsChen, I.-R. et al. | 2005
- 123
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A spare bandwidth sharing scheme based on network reliabilityKyu-Seek Sohn, / Seung Yeob Nam, / Sung, D.K. et al. | 2005
- 123
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Network Reliability - A Spare Bandwidth Sharing Scheme Based on Network ReliabilitySohn, K.-S. et al. | 2005
- 133
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Network Reliability - An Efficient Cutset Approach for Evaluating Communication-Network Reliability With Heterogeneous Link-CapacitiesSoh, S. et al. | 2005
- 133
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An efficient cutset approach for evaluating communication-network reliability with heterogeneous link-capacitiesSieteng Soh, / Rai, S. et al. | 2005
- 145
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Network Reliability - Computing Reliability and Message Delay for Cooperative Wireless Distributed Sensor Networks Subject to Random FailuresAboElFotoh, H.M.F. et al. | 2005
- 145
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Computing reliability and message delay for Cooperative wireless distributed sensor networks subject to random failuresAboElFotoh, H.M.F. / Iyengar, S.S. / Chakrabarty, K. et al. | 2005
- 156
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A m log m algorithm to compute the most probable configurations of a system with multi-mode independent componentsRauzy, A. et al. | 2005
- 156
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Systems Reliability - A m log m Algorithm to Compute the Most Probable Configurations of a System With Multi-Mode Independent ComponentsRauzy, A. et al. | 2005
- 159
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A method to take account of inhomogeneity in mechanical component reliability calculationsJian-Ping Li, / Thompson, G. et al. | 2005
- 159
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Systems Reliability - A Method to Take Account of Inhomogeneity in Mechanical Component Reliability CalculationsLi, J.-P. et al. | 2005
- 169
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Systems Reliability - A Hierarchy of Importance IndicesHwang, F.K. et al. | 2005
- 169
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A hierarchy of importance indicesHwang, F.K. et al. | 2005
- 173
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Stochastic fault tree analysis with self-loop basic eventsJenab, K. / Dhillon, B.S. et al. | 2005
- 173
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Systems Reliability - Stochastic Fault Tree Analysis With Self-Loop Basic EventsJenab, K. et al. | 2005
- 181
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Applications - View Through the Door of the SOFIA ProjectFrank, M.V. et al. | 2005
- 181
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View through the door of the SOFIA projectFrank, M.V. et al. | 2005
- 189
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INFORMATION FOR READERS AND AUTHORS| 2005
- 189
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IEEE Transactions on Reliability information for authors| 2005
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Table of contents| 2005
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IEEE Transactions on Reliability publication information| 2005