IEEE transactions on reliability
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
Table of contents
- 445
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Recovery schemes for mesh arrays utilizing dedicated sparesGoldberg, S. / Upadhyaya, S.J. / Fuchs, W.K. et al. | 2004
- 445
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Maintenance - Recovery Schemes for Mesh Arrays Utilizing Dedicated SparesGoldberg, S. et al. | 2004
- 452
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Maintenance - An Optimal Replacement Policy for a Three-State Repairable System With a Monotone Process ModelZhang, Y.L. et al. | 2004
- 452
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An optimal replacement policy for a three-state repairable system with a monotone process modelYuan Lin Zhang, et al. | 2004
- 458
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Human Reliability - Human-Reliability Analysis of Cooperative Redundancy to Support DiagnosisVanderhaegen, F. et al. | 2004
- 458
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Human-reliability analysis of cooperative redundancy to support diagnosisVanderhaegen, F. / Jouglet, D. / Piechowiak, S. et al. | 2004
- 465
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Software Reliability - A Scenario-Based Reliability Analysis Approach for Component-Based SoftwareYacoub, S. et al. | 2004
- 465
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A scenario-based reliability analysis approach for component-based softwareYacoub, S. / Cukic, B. / Ammar, H.H. et al. | 2004
- 481
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Network and Systems Reliability - Sequential Capacity Determination of Subnetworks in Network Performance AnalysisLee, S.M. et al. | 2004
- 481
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Sequential capacity determination of subnetworks in network performance analysisSeung Min Lee, / Chong Hyung Lee, / Dong Ho Park, et al. | 2004
- 487
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Network and Systems Reliability - Sequential Diagnosis of Processor Array SystemsZhao, J. et al. | 2004
- 487
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Sequential diagnosis of processor array systemsJun Zhao, / Meyer, F.J. / Park, N. et al. | 2004
- 499
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Network and Systems Reliability - Modular Solution of Dynamic Multi-Phase SystemsOu, Y. et al. | 2004
- 499
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Modular solution of dynamic multi-phase systemsYong Ou, / Dugan, J.B. et al. | 2004
- 509
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Network and Systems Reliability - Dependability Modeling and Evaluation of Multiple-Phased Systems Using DEEMBondavalli, A. et al. | 2004
- 509
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Dependability modeling and evaluation of multiple-phased systems using DEEMBondavalli, A. / Chiaradonna, S. / Di Giandomenico, F. et al. | 2004
- 523
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Network and Systems Reliability - Combined k-Out-of-n:G, and Consecutive kc-Out-of-n:G SystemsGera, A.E. et al. | 2004
- 523
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Combined k-out-of-n:G, and consecutive k/sub c/-out-of-n:G systemsGera, A.E. et al. | 2004
- 532
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Network and Systems Reliability - Telecommunication Access Network Design With Reliability ConstraintsSoni, S. et al. | 2004
- 532
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Telecommunication access network design with reliability constraintsSoni, S. / Narasimhan, S. / LeBlanc, L.J. et al. | 2004
- 542
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Network and Systems Reliability - Bounding the Times to Failure of 2-Component SystemsBerleant, D. et al. | 2004
- 542
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Bounding the times to failure of 2-component systemsBerleant, D. / Jianzhong Zhang, et al. | 2004
- 551
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Reliability improvement of Internet web servers through statistical process controlMichlin, Y. / Sedan, B. / Ingman, D. et al. | 2004
- 551
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Network and Systems Reliability - Reliability Improvement of Internet Web Servers Through Statistical Process ControlMichlin, Y. et al. | 2004
- 557
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EWMA forecast of normal system activity for computer intrusion detectionNong Ye, / Qiang Chen, / Borror, C.M. et al. | 2004
- 557
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Network and Systems Reliability - EWMA Forecast of Normal System Activity for Computer Intrusion DetectionYe, N. et al. | 2004
- 567
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Network and Systems Reliability - Optimal Design of k-out-of-n:G Subsystems Subjected to Imperfect Fault-CoverageAmari, S.V. et al. | 2004
- 567
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Optimal design of k-out-of-n:G subsystems subjected to imperfect fault-coverageAmari, S.V. / Hoang Pham, / Dill, G. et al. | 2004
- 576
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IEEE Transactions on Reliability information for authors| 2004
- 576
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Information for Readers and Authors| 2004
- 579
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2004 Index| 2004
- 578
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Have you visited lately? www.ieee.org| 2004
- 588
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IEEE Member Digital Library| 2004
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Table of contents| 2004
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IEEE Transactions on Reliability publication information| 2004