IEEE transactions on reliability
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
Table of contents
- 105
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EDITORIALS - Models, models, everywhere, and not a one to use The new-reliability eraEvans, R.A. et al. | 1998
- 106
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FROM THE EDITORS - 50-th Anniversary Celebration| 1998
- 107
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FROM THE EDITORS - Tutorial Papers -- Physics & Chemistry of Failure| 1998
- 107
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FROM THE EDITORS - Opinion Items| 1998
- 108
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Thinking clearly about software-reliability and repairable-systemsSherwin, D. et al. | 1998
- 108
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COMMENTARY & PERSPECTIVE - Thinking clearly about software-reliability and repairable-systemsSherwin, D. et al. | 1998
- 110
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A critique of the Reliability-Analysis-Center failure-rate-model for plastic encapsulated microciruitsSinnadurai, N. / Shukla, A. / Pecht, M. et al. | 1998
- 110
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COMMENTARY & PERSPECTIVE - A critique of the Reliability-Analysis-Center failure-rate-model for plastic encapsulated microciruitsSinnadurai, N. et al. | 1998
- 114
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Pitfalls of accelerated testingMeeker, W. / Escobar, L. et al. | 1998
- 114
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TUTORIAL & REVIEW - Pitfalls of accelerated testingMeeker Jr, W. et al. | 1998
- 119
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Reliability life-testing and failure-analysis of GaAs monolithic Ku-band driver amplifiersMittereder, J.A. / Roussos, J.A. / Christianson, K.A. et al. | 1998
- 119
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Reliability life-testing & failure-analysis of GaAs monolithic Ku-band driver amplifiersMittereder, J. / Roussos, J. / Christianson, K. et al. | 1998
- 119
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SYSTEM RELIABILITY -- MEASURES, PREDICTION, OPTIMIZATION, ESTIMATION - Reliability life-testing & failure-analysis of GaAs monolithic Ku-band driver amplifiersMittereder, J. et al. | 1998
- 126
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SYSTEM RELIABILITY -- MEASURES, PREDICTION, OPTIMIZATION, ESTIMATION - Predicting system-failure risk from unanticpated fiber-breaks in manufacturingKher, S. et al. | 1998
- 126
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Predicting system-failure risk from unanticipated fiber-breaks in manufacturingKher, S.N. / Bubel, G.M. et al. | 1998
- 126
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Predicting system-failure risk from unanticpated fiber-breaks in manufacturingKher, S. / Bubel, G. et al. | 1998
- 131
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A new model for step-stress testingKhamis, I. / Higgins, J. et al. | 1998
- 131
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ACCELERATED TESTING & SCREENING - A new model for step-stress testingKhamis, I. et al. | 1998
- 135
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Accelerated life-testing for micro-machined chemical sensorsBosc, J. / Guo, Y. / Sarihan, V. et al. | 1998
- 135
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ACCELERATED TESTING & SCREENING - Accelerated life-testing for micro-machined chemical sensorsBosc, J. et al. | 1998
- 142
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ACCELERATED TESTING & SCREENING - Inferences on a simple step-stress model with type-II censored exponential dataXiong, C. et al. | 1998
- 142
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Inferences on a simple step-stress model with type-II censored exponential dataXiong, C. et al. | 1998
- 147
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A metric for estimating the fault-secure behavior of digital circuitsMcNamer, M. / Kanopoulos, N. et al. | 1998
- 147
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MICROCIRCUITS -- DESIGN, PACKAGING, MANUFACTURE, TEST, USE - A metric for estimating the fault-secure behavior of digital circuitsMcNamer, M. et al. | 1998
- 155
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MICROCIRCUITS -- DESIGN, PACKAGING, MANUFACTURE, TEST, USE - Radiation hardness of static-random-access-memory tested using dose-to-failure and gamma-ray exposureChang-Liao, K. et al. | 1998
- 155
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Radiation hardness of static-random-access-memory tested using dose-to-failure and gamma-ray exposureChang-Liao, K. / Feng, K. et al. | 1998
- 159
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Series-parallel reductions in Monte Carlo network-reliability evaluationCancela, H. / El Khadiri, M. et al. | 1998
- 159
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NETWORK-SYSTEM COMPUTATION & ANALYSIS - Series-parallel reductions in Monte Carlo network-reliability evaluationCancela, H. et al. | 1998
- 165
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NETWORK-SYSTEM COMPUTATION & ANALYSIS - Redundancy optimization for series-parallel multi-state systemsLevitin, G. et al. | 1998
- 165
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Redundancy optimization for series-parallel multi-state systemsLevitin, G. / Lisnianski, A. / Ben-Haim, H. et al. | 1998
- 173
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An implicit method for incorporating common-cause failures in system analysisVaurio, J. et al. | 1998
- 173
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NETWORK-SYSTEM COMPUTATION & ANALYSIS - An implicit method for incorporating common-cause failures in system analysisVaurio, J. et al. | 1998
- 181
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NETWORK-SYSTEM COMPUTATION & ANALYSIS - Continuous-state system-reliability: An interpolation approachBrunelle, R. et al. | 1998
- 181
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Continuous-state system-reliability: An interpolation approachBrunelle, R. / Kapur, K. et al. | 1998
- 188
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Parameter estimation for the 3-parameter Gamma distribution using the continuation methodHirose, H. et al. | 1998
- 188
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DISTRIBUTIONS -- PROBABILITY AND STATISTICAL-INFERENCE - Parameter estimation for the 3-parameter Gamma distribution using the continuation methodHirose, H. et al. | 1998
- 197
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Testing exponentiality of the residual life, based on dynamic Kullback-Lieber informationEbrahimi, N. et al. | 1998
- 197
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DISTRIBUTIONS -- PROBABILITY AND STATISTICAL-INFERENCE - Testing exponentiality of the residual life, based on dynamic Kullback-Lieber informationEbrahimi, N. et al. | 1998
- 202
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BOOK REVIEWS - How to Tell the Liars from the StatisticiansEvans, R.A. et al. | 1998
- 203
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FEATURES - Invitation to Membership in the Reliability Society| 1998
- 203
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FEATURES - Free Proceedings| 1998
- 204
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FEATURES - Manuscripts Received| 1998
- 207
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FEATURES - Information for Readers & Authors| 1998
- SP333
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Communications reliability: a historical perspectiveMalec, H.A. et al. | 1998
- SP346
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Evolution of component-qualification methods for local component-manufacturers for telecom applicationsSettur, S. / Kumar, A.K.M. / Lakshmi, Y.V.S. et al. | 1998
- SP355
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Space-system reliability: a historical perspectiveLalli, V.R. et al. | 1998
- SP361
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Probabilistic-risk-assessment applications in the nuclear-power industryZamanali, J. et al. | 1998