IEEE transactions on reliability
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
Table of contents
- 194
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A bibliography of accelerated test plansNelson, W.B. et al. | 2005
- 194
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Burn-in and Accelerated Testing - A Bibliography of Accelerated Test PlansNelson, W.B. et al. | 2005
- 198
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Burn-in and Accelerated Testing - On Optimal Burn -- In Procedures -- A Generalized ModelCha, J.H. et al. | 2005
- 198
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On optimal burn-in procedures - a generalized modelJi Hwan Cha, et al. | 2005
- 207
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Some considerations on system burn-inKim, K.O. / Kuo, W. et al. | 2005
- 207
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Burn-in and Accelerated Testing - Some Considerations on System Burn-inKim, K.O. et al. | 2005
- 215
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Test power reductions through computationally efficient, decoupled scan chain modificationsSinanoglu, O. / Orailoglu, A. et al. | 2005
- 215
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Burn-in and Accelerated Testing - Test Power Reductions Through Computationally Efficient, Decoupled Scan Chain ModificationsSinanoglu, O. et al. | 2005
- 224
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A hierarchical model for estimating the early reliability of complex systemsJohnson, V.E. / Moosman, A. / Cotter, P. et al. | 2005
- 224
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Networks and Systems - A Hierarchical Model for Estimating the Early Reliability of Complex SystemsJohnson, V.E. et al. | 2005
- 232
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Reliability analysis for various communication schemes in wireless CORBAXinyu Chen, / Lyu, M.R. et al. | 2005
- 232
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Networks and Systems - Reliability Analysis for Various Communication Schemes in Wireless CORBAChen, X. et al. | 2005
- 243
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Optimal design of reliable network systems in presence of uncertaintyMarseguerra, M. / Zio, E. / Podofillini, L. et al. | 2005
- 243
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Reliability Optimization - Optimal Design of Reliable Network Systems in Presence of UncertaintyMarseguerra, M. et al. | 2005
- 254
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A new dynamic programming method for reliability & redundancy allocation in a parallel-series systemYalaoui, A. / Chatelet, E. / Chengbin Chu, et al. | 2005
- 254
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Reliability Optimization - A New Dynamic Programming Method for Reliability & Redundancy Allocation in a Parallel-Series SystemYalaoui, A. et al. | 2005
- 262
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A practical method for obtaining prior distributions in reliabilityGutierrez-Pulido, H. / Aguirre-Torres, V. / Christen, J.A. et al. | 2005
- 262
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Parametric Reliability - A Practical Method for Obtaining Prior Distributions in ReliabilityGutérrez-Pulido, H. et al. | 2005
- 270
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Bathtub shaped failure rates from mixtures: a practical point of viewWondmagegnehu, E.T. / Navarro, J. / Hernandez, P.J. et al. | 2005
- 270
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Parametric Reliability - Bathtub Shaped Failure Rates From Mixtures: A Practical Point of ViewWondmagegnehu, E.T. et al. | 2005
- 276
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Origins, properties, and parameters estimation of the hyperbolic reliability modelErto, P. / Palumbo, B. et al. | 2005
- 276
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Parametric Reliability - Origins, Properties, and Parameters Estimation of the Hyperbolic Reliability ModelErto, P. et al. | 2005
- 282
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Parameter estimation of incomplete data in competing risks using the EM algorithmPark, C. et al. | 2005
- 282
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Parametric Reliability - Parameter Estimation of Incomplete Data in Competing Risks Using the EM AlgorithmPark, C. et al. | 2005
- 291
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Parametric Reliability - Data Mapping and the Prediction of Common Cause Failure ProbabilityXie, L. et al. | 2005
- 291
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Data mapping and the prediction of common cause failure probabilityLiyang Xie, / Jinyu Zhou, / Xuemin Wang, et al. | 2005
- 297
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Maintenance and Degradation Modeling - Reliability Modeling of Multi-State Degraded Systems With Multi-Competing Failures and Random ShocksLi, W. et al. | 2005
- 297
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Reliability modeling of multi-state degraded systems with multi-competing failures and random shocksWenjian Li, / Hoang Pham, et al. | 2005
- 304
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Integrating preventive maintenance planning and production scheduling for a single machineCassady, C.R. / Kutanoglu, E. et al. | 2005
- 304
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Maintenance and Degradation Modeling - Integrating Preventive Maintenance Planning and Production Scheduling for a Single MachineCassady, C.R. et al. | 2005
- 310
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An alternative degradation reliability modeling approach using maximum likelihood estimationWei Huang, / Dietrich, D.L. et al. | 2005
- 310
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Maintenance and Degradation Modeling - An Alternative Degradation Reliability Modeling Approach Using Maximum Likelihood EstimationHuang, W. et al. | 2005
- 318
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An inspection-maintenance model for systems with multiple competing processesWenjian Li, / Hoang Pham, et al. | 2005
- 318
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Maintenance and Degradation Modeling - An Inspection-Maintenance Model for Systems With Multiple Competing ProcessesLi, W. et al. | 2005
- 328
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Maintenance and Degradation Modeling - Repairable Consecutive-k-Out-of-n: G Systems With r RepairmenWu, Y. et al. | 2005
- 328
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Repairable consecutive-k-out-of-n: G systems with r repairmenYueqin Wu, / Jiancheng Guan, et al. | 2005
- 338
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Optimal maintenance policies under different operational schedulesShaomin Wu, / Clements-Croome, D. et al. | 2005
- 338
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Maintenance and Degradation Modeling - Optimal Maintenance Policies Under Different Operational SchedulesWu, S. et al. | 2005
- 347
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Optimal policies with decreasing probability of imperfect maintenanceShey-Huei Sheu, / Yuh-Bin Lin, / Gwo-Liang Liao, et al. | 2005
- 347
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Maintenance and Degradation Modeling - Optimal Policies With Decreasing Probability of Imperfect MaintenanceSheu, S.-H. et al. | 2005
- 358
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Maintenance and Degradation Modeling - Identify Unrepairability to Speed-Up Spare Allocation for Repairing MemoriesLiang, H.-C. et al. | 2005
- 358
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Identify unrepairability to speed-up spare allocation for repairing memoriesHsing-Chung Liang, / Wen-Chin Ho, / Ming-Chieh Cheng, et al. | 2005
- 366
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Correction to "A Comparison of Two Simple Prediction Intervals for Exponential Distribution"Balakrishnan, N. / Lin, C.-T. / Chan, P.-S. et al. | 2005
- 366
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COMMENTS AND CORRECTIONS - Correction to "A Comparison of Two Simple Prediction Intervals for Exponentail Distribution"Balakrishnan, N. et al. | 2005
- 367
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Special issue on reliability studies on nanotechnology| 2005
- 367
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ANNOUNCEMENTS - Call for Papers| 2005
- c1
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Table of contents| 2005
- c2
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IEEE Transactions on Reliability publication information| 2005