The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
<
Volume 39,
Issue 7
Volume 39,
Issue 6
Volume 39,
Issue 5
Volume 39,
Issue 4
Volume 39,
Issue 3
Volume 39,
Issue 2
Volume 39,
Issue 1
Volume 38,
Issue 12
Volume 38,
Issue 11
Volume 38,
Issue 10
Volume 38,
Issue 9
Volume 38,
Issue 8
Volume 38,
Issue 7
Volume 38,
Issue 6
Volume 38,
Issue 5
Volume 38,
Issue 4
Volume 38,
Issue 3
Volume 38,
Issue 2
Volume 38,
Issue 1
Volume 37,
Issue 12
Volume 37,
Issue 11
Volume 37,
Issue 10
Volume 37,
Issue 9
Volume 37,
Issue 8
Volume 37,
Issue 7
Volume 37,
Issue 6
Volume 37,
Issue 5
Volume 37,
Issue 4
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 12
Volume 36,
Issue 11
Volume 36,
Issue 10
Volume 36,
Issue 9
Volume 36,
Issue 8
Volume 36,
Issue 7
Volume 36,
Issue 6
Volume 36,
Issue 5
Volume 36,
Issue 4
Volume 36,
Issue 3
Volume 36,
Issue 2
Volume 36,
Issue 1
Volume 35,
Issue 12
Volume 35,
Issue 11
Volume 35,
Issue 10
Volume 35,
Issue 9
Volume 35,
Issue 8
Volume 35,
Issue 6
Volume 34,
Issue 8
Volume 34,
Issue 7
Volume 34,
Issue 6
Volume 34,
Issue 5
Volume 34,
Issue 4
Volume 34,
Issue 3
Volume 34,
Issue 2
Volume 34,
Issue 1
Volume 33,
Issue 12
Volume 33,
Issue 11
Volume 33,
Issue 10
Volume 33,
Issue 9
Volume 33,
Issue 8
Volume 33,
Issue 7
Volume 33,
Issue 6
Volume 33,
Issue 5
Volume 33,
Issue 4
Volume 33,
Issue 3
Volume 33,
Issue 2
Volume 33,
Issue 1
Volume 32,
Issue 12
Volume 32,
Issue 11
Volume 32,
Issue 10
Volume 32,
Issue 9
Volume 32,
Issue 8
Volume 32,
Issue 7
Volume 32,
Issue 6
Volume 32,
Issue 5
Volume 32,
Issue 4
Volume 32,
Issue 3
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 12
Volume 31,
Issue 11
Volume 31,
Issue 10
Volume 31,
Issue 9
Volume 31,
Issue 8
Volume 31,
Issue 7
Volume 31,
Issue 6
Volume 31,
Issue 5
Volume 31,
Issue 4
Volume 31,
Issue 3
Volume 31,
Issue 2
Volume 31,
Issue 1
Volume 30,
Issue 12
Volume 30,
Issue 11
Volume 30,
Issue 10
Volume 30,
Issue 9
Volume 30,
Issue 8
Volume 30,
Issue 7
Volume 30,
Issue 6
Volume 30,
Issue 5
Volume 30,
Issue 4
Volume 30,
Issue 3
Volume 30,
Issue 2
Volume 30,
Issue 1
Volume 29,
Issue 12
Volume 29,
Issue 11
Volume 29,
Issue 10
Volume 29,
Issue 9
Volume 29,
Issue 8
Volume 29,
Issue 7
Volume 29,
Issue 6
Volume 29,
Issue 5
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 12
Volume 28,
Issue 11
Volume 28,
Issue 10
Volume 28,
Issue 9
Volume 28,
Issue 8
Volume 28,
Issue 7
Volume 28,
Issue 6
Volume 28,
Issue 5
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 12
Volume 27,
Issue 11
Volume 27,
Issue 10
Volume 27,
Issue 9
Volume 27,
Issue 8
Volume 27,
Issue 7
Volume 27,
Issue 6
Volume 27,
Issue 5
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 12
Volume 26,
Issue 11
Volume 26,
Issue 10
Volume 26,
Issue 9
Volume 26,
Issue 8
Volume 26,
Issue 7
Volume 26,
Issue 6
Volume 26,
Issue 5
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 12
Volume 25,
Issue 11
Volume 25,
Issue 10
Volume 25,
Issue 9
Volume 25,
Issue 8
Volume 25,
Issue 7
Volume 25,
Issue 6
Volume 25,
Issue 5
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 12
Volume 24,
Issue 11
Volume 24,
Issue 10
Volume 24,
Issue 9
Volume 24,
Issue 8
Volume 24,
Issue 7
Volume 24,
Issue 6
Volume 24,
Issue 5
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 23,
Issue 12
Volume 23,
Issue 11
Volume 23,
Issue 10
Volume 23,
Issue 9
Volume 23,
Issue 8
Volume 23,
Issue 7
Volume 23,
Issue 6
Volume 23,
Issue 5
Volume 23,
Issue 4
Volume 23,
Issue 3
Volume 23,
Issue 2
Volume 23,
Issue 1
Volume 22,
Issue 12
Volume 22,
Issue 11
Volume 22,
Issue 10
Volume 22,
Issue 9
Volume 22,
Issue 8
Volume 22,
Issue 7
Volume 22,
Issue 6
Volume 22,
Issue 5
Volume 22,
Issue 4
Volume 22,
Issue 3
Volume 22,
Issue 2
Volume 22,
Issue 1
Volume 21,
Issue 12
Volume 21,
Issue 11
Volume 21,
Issue 10
Volume 21,
Issue 9
Volume 21,
Issue 8
Volume 21,
Issue 7
Volume 21,
Issue 6
Volume 21,
Issue 5
Volume 21,
Issue 4
Volume 21,
Issue 3
Volume 21,
Issue 2
Volume 21,
Issue 1
Volume 20,
Issue 12
Volume 20,
Issue 11
Volume 20,
Issue 10
Volume 20,
Issue 9
Volume 20,
Issue 8
Volume 20,
Issue 7
Volume 20,
Issue 6
Volume 20,
Issue 5
Volume 20,
Issue 4
Volume 20,
Issue 3
Volume 20,
Issue 2
Volume 20,
Issue 1
Volume 19,
Issue 12
Volume 19,
Issue 11
Volume 19,
Issue 10
Volume 19,
Issue 9
Volume 19,
Issue 8
Volume 19,
Issue 7
Volume 19,
Issue 6
Volume 19,
Issue 5
Volume 19,
Issue 4
Volume 19,
Issue 3
Volume 19,
Issue 2
Volume 19,
Issue 1
Volume 18,
Issue 12
Volume 18,
Issue 11
Volume 18,
Issue 10
Volume 18,
Issue 9
Volume 18,
Issue 8
Volume 18,
Issue 7
Volume 18,
Issue 6
Volume 18,
Issue 5
Volume 18,
Issue 4
Volume 18,
Issue 3
Volume 18,
Issue 2
Volume 18,
Issue 1
Volume 17,
Issue 12
Volume 17,
Issue 11
Volume 17,
Issue 10
Volume 17,
Issue 9
Volume 17,
Issue 8
Volume 17,
Issue 7
Volume 17,
Issue 6
Volume 17,
Issue 5
Volume 17,
Issue 4
Volume 17,
Issue 3
Volume 17,
Issue 2
Volume 17,
Issue 1
Volume 16,
Issue 12
Volume 16,
Issue 11
Volume 16,
Issue 10
Volume 16,
Issue 9
Volume 16,
Issue 8
Volume 16,
Issue 7
Volume 16,
Issue 6
Volume 16,
Issue 5
Volume 16,
Issue 4
Volume 16,
Issue 3
Volume 16,
Issue 2
Volume 16,
Issue 1
Volume 15,
Issue 12
Volume 15,
Issue 11
Volume 15,
Issue 10
Volume 15,
Issue 9
Volume 15,
Issue 8
Volume 15,
Issue 7
Volume 15,
Issue 6
Volume 15,
Issue 5
Volume 15,
Issue 4
Volume 15,
Issue 3
Volume 15,
Issue 2
Volume 15,
Issue 1
Volume 14,
Issue 12
Volume 14,
Issue 11
Volume 14,
Issue 10
Volume 14,
Issue 9
Volume 14,
Issue 8
Volume 14,
Issue 7
Volume 14,
Issue 6
Volume 14,
Issue 5
Volume 14,
Issue 4
Volume 14,
Issue 3
Volume 14,
Issue 2
Volume 14,
Issue 1
Volume 13,
Issue supp
Volume 13,
Issue a
Volume 13,
Issue 12
Volume 13,
Issue 11
Volume 13,
Issue 10
Volume 13,
Issue 9
Volume 13,
Issue 8a
Volume 13,
Issue 8
Volume 13,
Issue 7
Volume 13,
Issue 6
Volume 13,
Issue 5
Volume 13,
Issue 4
Volume 13,
Issue 3
Volume 13,
Issue 2
Volume 13,
Issue 1
Volume 12,
Issue 12
Volume 12,
Issue 11
Volume 12,
Issue 10
Volume 12,
Issue 9
Volume 12,
Issue 8
Volume 12,
Issue 7
Volume 12,
Issue 6
Volume 12,
Issue 5
Volume 12,
Issue 4
Volume 12,
Issue 3
Volume 12,
Issue 2
Volume 12,
Issue 1
Volume 11,
Issue sup
Volume 11,
Issue 12
Volume 11,
Issue 11s
Volume 11,
Issue 11
Volume 11,
Issue 10
Volume 11,
Issue 9
Volume 11,
Issue 8
Volume 11,
Issue 7
Volume 11,
Issue 6
Volume 11,
Issue 5
Volume 11,
Issue 4
Volume 11,
Issue 3
Volume 11,
Issue 2
Volume 11,
Issue 1
Volume 10,
Issue 12
Volume 10,
Issue 11
Volume 10,
Issue 10
Volume 10,
Issue 9
Volume 10,
Issue 8
Volume 10,
Issue 7
Volume 10,
Issue 6
Volume 10,
Issue 5
Volume 10,
Issue 4
Volume 10,
Issue 3
Volume 10,
Issue 2
Volume 10,
Issue 1
Volume 9,
Issue sup
Volume 9,
Issue s
Volume 9,
Issue 12
Volume 9,
Issue 11s
Volume 9,
Issue 11
Volume 9,
Issue 10
Volume 9,
Issue 9
Volume 9,
Issue 8
Volume 9,
Issue 7
Volume 9,
Issue 6
Volume 9,
Issue 5s
Volume 9,
Issue 5
Volume 9,
Issue 4
Volume 9,
Issue 3
Volume 9,
Issue 2
Volume 9,
Issue 1
Volume 8,
Issue sup
Volume 8,
Issue 12
Volume 8,
Issue 11
Volume 8,
Issue 10
Volume 8,
Issue 9
Volume 8,
Issue 8
Volume 8,
Issue 7
Volume 8,
Issue 6s
Volume 8,
Issue 6
Volume 8,
Issue 5
Volume 8,
Issue 4
Volume 8,
Issue 3
Volume 8,
Issue 2
Volume 8,
Issue 1s
Volume 8,
Issue 1
Volume 7,
Issue 12
Volume 7,
Issue 11
Volume 7,
Issue 10
Volume 7,
Issue 9
Volume 7,
Issue 8
Volume 7,
Issue 7
Volume 7,
Issue 6
Volume 7,
Issue 5
Volume 7,
Issue 4
Volume 7,
Issue 3b
Volume 7,
Issue 3
Volume 7,
Issue 2
Volume 7,
Issue 1a
Volume 7,
Issue 1
Volume 6,
Issue 12c
Volume 6,
Issue 12
Volume 6,
Issue 11
Volume 6,
Issue 10b
Volume 6,
Issue 10
Volume 6,
Issue 9a
Volume 6,
Issue 9
Volume 6,
Issue 8
Volume 6,
Issue 7
Volume 6,
Issue 6
Volume 6,
Issue 5
Volume 6,
Issue 4
Volume 6,
Issue 3
Volume 6,
Issue 2
Volume 6,
Issue 1
Volume 5,
Issue 12
Volume 5,
Issue 11
Volume 5,
Issue 10
Volume 5,
Issue 9
Volume 5,
Issue 8
Volume 5,
Issue 7
Volume 5,
Issue 6
Volume 5,
Issue 5
Volume 5,
Issue 4
Volume 5,
Issue 3s
Volume 5,
Issue 3
Volume 5,
Issue 2
Volume 5,
Issue 1
Volume 4,
Issue 12
Volume 4,
Issue 11
Volume 4,
Issue 10
Volume 4,
Issue 9
Volume 4,
Issue 8
Volume 4,
Issue 7
Volume 4,
Issue 6
Volume 4,
Issue 5
Volume 4,
Issue 4
Volume 4,
Issue 3
Volume 4,
Issue 2
Volume 4,
Issue 1
Volume 3,
Issue 12
Volume 3,
Issue 11
Volume 3,
Issue 10
Volume 3,
Issue 9
Volume 3,
Issue 8
Volume 3,
Issue 7
Volume 3,
Issue 6
Volume 3,
Issue 5
Volume 3,
Issue 4
Volume 3,
Issue 3
Volume 3,
Issue 2
Volume 3,
Issue 1
Volume 2,
Issue 12
Volume 2,
Issue 11
Volume 2,
Issue 10
Volume 2,
Issue 9
Volume 2,
Issue 8
Volume 2,
Issue 7
Volume 2,
Issue 6
Volume 2,
Issue 5
Volume 2,
Issue 4
Volume 2,
Issue 3
Volume 2,
Issue 2
Volume 2,
Issue 1
Volume 1,
Issue 6
Volume 1,
Issue 5
Volume 1,
Issue 4
Volume 1,
Issue 3
Volume 1,
Issue 2
Volume 1,
Issue 1
>
Table of contents
06LT01
Modelling of interband transitions in GaAs tunnel diode
K Louarn
/ C Fontaine
/ A Arnoult
et al.
| 2016
063001
Antimony selenide thin-film solar cells
Kai Zeng
/ Ding-Jiang Xue
/ Jiang Tang
et al.
| 2016
063002
Resistive switching memories based on metal oxides: mechanisms, reliability and scaling
Daniele Ielmini
et al.
| 2016
064001
Assessing the thermoelectric properties of single InSb nanowires: the role of thermal contact resistance
S Yazji
/ M Y Swinkels
/ M De Luca
et al.
| 2016
064002
Composition measurement of epitaxial Scx Ga1−x N films
H C L Tsui
/ L E Goff
/ N P Barradas
et al.
| 2016
065001
Preparation of p-type Na-doped Cu2 O by electrodeposition for a p-n homojunction thin film solar cell
Nezar G Elfadill
/ M R Hashim
/ Khaled M Chahrour
et al.
| 2016
065002
Analysis of current instabilities of thin AlN/GaN/AlN double heterostructure high electron mobility transistors
Ch Zervos
/ A Adikimenakis
/ A Bairamis
et al.
| 2016
065003
Estimation of frequency conversion efficiency of THz devices using a ballistic electron wave swing circuit model
Christian Schildbach
/ Duu Sheng Ong
/ Hans Hartnagel
et al.
| 2016
065004
Investigation of the induced gate noise of nanoscale MOSFETs in the very high frequency region
Jongwook Jeon
/ Yoon Kim
/ Myounggon Kang
et al.
| 2016
065005
Impact of substrate and thermal boundary resistance on the performance of AlGaN/GaN HEMTs analyzed by means of electro-thermal Monte Carlo simulations
S García
/ I Íñiguez-de-la-Torre
/ J Mateos
et al.
| 2016
065006
Chlorine-based dry etching of β -Ga2 O3
Jack E Hogan
/ Stephen W Kaun
/ Elaheh Ahmadi
et al.
| 2016
065007
Defect energy levels in p-type GaAsBi and GaAs grown by MBE at low temperatures
P M Mooney
/ M C Tarun
/ V Bahrami-Yekta
et al.
| 2016
065008
High electron mobility recovery in AlGaN/GaN 2DEG channels regrown on etched surfaces
Silvia H Chan
/ Stacia Keller
/ Maher Tahhan
et al.
| 2016
065009
Photoluminescence fatigue and inhomogeneous line broadening in semi-insulating Tl6 SeI4 single crystals
S S Kostina
/ J A Peters
/ W Lin
et al.
| 2016
065010
Growth and characterization of α -phase Ga2−x Snx O3 thin films for solar-blind ultraviolet applications
Xiaolong Zhao
/ Zhenping Wu
/ Daoyou Guo
et al.
| 2016
065011
Technology of integrated self-aligned E/D-mode n++ GaN/InAlN/AlN/GaN MOS HEMTs for mixed-signal electronics
M Blaho
/ D Gregušová
/ Š Haščík
et al.
| 2016
065012
Analytical band Monte Carlo analysis of electron transport in silicene
K H Yeoh
/ D S Ong
/ C H Raymond Ooi
et al.
| 2016
065013
N-type ohmic contacts to undoped GaAs/AlGaAs quantum wells using only front-sided processing: application to ambipolar FETs
D Taneja
/ F Sfigakis
/ A F Croxall
et al.
| 2016
065014
Effect of interface and bulk traps on the C–V characterization of a LPCVD-SiNx /AlGaN/GaN metal-insulator-semiconductor structure
Qilong Bao
/ Sen Huang
/ Xinhua Wang
et al.
| 2016
065015
Design considerations of biaxially tensile-strained germanium-on-silicon lasers
Xiyue Li
/ Zhiqiang Li
/ Simon Li
et al.
| 2016
065016
A theoretical study of charge-transport parameters for a hydrogen-bonded organic semiconductor: the indigo and s-indaceno [1,2-b:5,6-b′] dithiophene-4,9-dione derivatives
Hui-Ling Wei (魏慧玲)
/ Ya-Rui Shi (时雅瑞)
/ Yu-Fang Liu (刘玉芳)
et al.
| 2016
065017
Sidewall spacer optimization for steep switching junctionless transistors
Manish Gupta
/ Abhinav Kranti
et al.
| 2016
065018
The hydride vapor phase epitaxy of GaN on silicon covered by nanostructures
U Jahn
/ M Musolino
/ J Lähnemann
et al.
| 2016
065019
Coplanar metal–semiconductor–metal light-emitting devices with an n++ InGaN layer and their application to display
H Long
/ Y P Zeng
/ Y Mei
et al.
| 2016
065020
Characterization of p-GaN1−x Asx /n-GaN PN junction diodes
H Qian
/ K B Lee
/ S Hosseini Vajargah
et al.
| 2016
065021
The contact and photoconductivity characteristics between Co doped amorphous carbon and GaAs: n-type low-resistivity and semi-insulated high-resistivity GaAs
Zhangyin Zhai
/ Hualing Yu
/ Fen Zuo
et al.
| 2016
065022
Compact-device model development for the energy-delay analysis of magneto-electric magnetic tunnel junction structures
N Sharma
/ J P Bird
/ P A Dowben
et al.
| 2016
065023
Anomalous capacitance in temperature and frequency characteristics of a TiW/p -InP Schottky barrier diode
Qingsong Wang
/ Jun Chen
/ Hengjing Tang
et al.
| 2016
065024
A new modeling and simulation method for important statistical performance prediction of single photon avalanche diode detectors
Yue Xu
/ Ping Xiang
/ Xiaopeng Xie
et al.
| 2016
065025
Understanding the effects of TCO work function on the performance of organic solar cells by numerical simulation
Aqing Chen
/ Kaigui Zhu
/ Qingyi Shao
et al.
| 2016
069601
Erratum: Electron channeling in TiO
2 coated Cu layers (2016
Semiconductor Science and Technology 31 055005)
Pengyuan Zheng
/ Tianji Zhou
/ Daniel Gall
et al.
| 2016