IEEE transactions on reliability
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
Table of contents
- 701
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Accelerated Destructive Degradation Tests Robust to Distribution MisspecificationShuen-Lin Jeng, / Bei-Ying Huang, / Meeker, W. Q. et al. | 2011
- 701
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Acceleration - Accelerated Destructive Degradation Tests Robust to Distribution MisspecificationJeng, S-L et al. | 2011
- 712
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Modeling and Planning of Step-Stress Accelerated Life Tests With Independent Competing RisksXiao Liu, / Wei Shen Qiu, et al. | 2011
- 721
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Burn-In - Burn-in for Systems Operating in a Shock EnvironmentCha, J H et al. | 2011
- 721
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Burn-in for Systems Operating in a Shock EnvironmentJi Hwan Cha, / Finkelstein, M. et al. | 2011
- 729
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Yield Prediction for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial DefectsTao Yuan, / Ramadan, S. Z. / Bae, S. J. et al. | 2011
- 729
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Integrated Circuit Reliability - Yield Prediction for Integrated Circuits Manufacturing Through Hierarchical Bayesian Modeling of Spatial DefectsYuan, T et al. | 2011
- 742
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An Efficient SER Estimation Method for Combinational CircuitsKehl, N. / Rosenstiel, W. et al. | 2011
- 748
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Birnbaum-Saunders Mixed Models for Censored Reliability Data AnalysisVillegas, C. / Paula, G. A. / Leiva, V. et al. | 2011
- 748
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Lifetime Data Analysis - Birnbaum-Saunders Mixed Models for Censored Reliability Data AnalysisVillegas, C et al. | 2011
- 759
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Modeling and Assessment of Aging and Efficiency of Corrective and Planned Preventive MaintenanceDoyen, L. / Gaudoin, O. et al. | 2011
- 759
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Maintenance - Modeling and Assessment of Aging and Efficiency of Corrective and Planned Preventive MaintenanceDoyen, L et al. | 2011
- 770
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A Multi-Objective Optimization of Imperfect Preventive Maintenance Policy for Dependent Competing Risk Systems With Hidden FailureYaping Wang, / Hoang Pham, et al. | 2011
- 782
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Imperfect Repair Proportional Intensity Models for Maintained SystemsSyamsundar, A. / Naikan, V. N. A. et al. | 2011
- 788
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Fast Efficient Design of Shared Backup Path Protected Networks Using a Multi-Flow Optimization ModelTodd, B. / Doucette, J. et al. | 2011
- 788
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Networks and Systems - Fast Efficient Design of Shared Backup Path Protected Networks Using a Multi-Flow Optimization ModelTodd, B et al. | 2011
- 801
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An Analytic Hierarchy Process-Based Risk Assessment Method for Wireless NetworksHsin-Yi Tsai, / Yu-Lun Huang, et al. | 2011
- 817
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The Dynamic Signature of Coherent SystemsMahmoudi, M. / Asadi, M. et al. | 2011
- 823
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Highly Available Path Routing in Mesh Networks Under Multiple Link FailuresShengli Yuan, / Bin Wang, et al. | 2011
- 833
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Optimal Reliability Demonstration Test Plans for Formula Not Shown -out-of- Formula Not Shown Systems of Gamma Distributed ComponentsFernández, A. J. et al. | 2011
- 833
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Optimal Reliability Demonstration Test Plans for $k$-out-of-$n$ Systems of Gamma Distributed ComponentsFernández, A. J. et al. | 2011
- 845
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Polynomial-Time Topological Reductions That Preserve the Diameter Constrained Reliability of a Communication NetworkCancela, H. / El Khadiri, M. / Petingi, L. A. et al. | 2011
- 852
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Prediction - An Approach to Reliability Assessment Under Degradation and Shock ProcessWang, Z et al. | 2011
- 852
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An Approach to Reliability Assessment Under Degradation and Shock ProcessZhonglai Wang, / Hong-Zhong Huang, / Yanfeng Li, et al. | 2011
- 864
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Prognostice Health Management - Mahalanobis-Taguchi System as a Multi-Sensor Based Decision Making Prognostics Tool for Centrifugal Pump FailuresSoylemezoglu, A et al. | 2011
- 864
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Mahalanobis-Taguchi System as a Multi-Sensor Based Decision Making Prognostics Tool for Centrifugal Pump FailuresSoylemezoglu, A. / Jagannathan, S. / Saygin, C. et al. | 2011
- 879
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Have you visited lately? www.ieee.org| 2011
- 880
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Institutional Listings| 2011
- 881
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2011 Index IEEE Transactions on Reliability Vol. 60| 2011
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Table of contents| 2011
- C2
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IEEE Transactions on Reliability publication information| 2011
- C3
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IEEE Transactions on Reliability institutional listings| 2011