The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
<
Volume 432,
Issue pb
Volume 432,
Issue pa
Volume 427,
Issue pb
Volume 427,
Issue pa
Volume 424,
Issue 3
Volume 424,
Issue 2
Volume 424,
Issue 1
Volume 421,
Issue b
Volume 421,
Issue a
Volume 418,
Issue a
Volume 285,
Issue pb
Volume 258,
Issue 24
Volume 258,
Issue 23
Volume 258,
Issue 22
Volume 258,
Issue 21
Volume 258,
Issue 20
Volume 258,
Issue 19
Volume 258,
Issue 18
Volume 258,
Issue 17
Volume 258,
Issue 16
Volume 258,
Issue 15
Volume 258,
Issue 14
Volume 258,
Issue 13
Volume 258,
Issue 12
Volume 258,
Issue 11
Volume 258,
Issue 10
Volume 258,
Issue 9
Volume 258,
Issue 8
Volume 258,
Issue 7
Volume 258,
Issue 6
Volume 258,
Issue 5
Volume 258,
Issue 4
Volume 258,
Issue 3
Volume 258,
Issue 2
Volume 258,
Issue 1
Volume 257,
Issue 24
Volume 257,
Issue 23
Volume 257,
Issue 22
Volume 257,
Issue 21
Volume 257,
Issue 20
Volume 257,
Issue 19
Volume 257,
Issue 18
Volume 257,
Issue 17
Volume 257,
Issue 16
Volume 257,
Issue 15
Volume 257,
Issue 14
Volume 257,
Issue 13
Volume 257,
Issue 12
Volume 257,
Issue 11
Volume 257,
Issue 10
Volume 257,
Issue 9
Volume 257,
Issue 8
Volume 257,
Issue 7
Volume 257,
Issue 6
Volume 257,
Issue 5
Volume 257,
Issue 4
Volume 257,
Issue 3
Volume 257,
Issue 2
Volume 257,
Issue 1
Volume 256,
Issue 24
Volume 256,
Issue 23
Volume 256,
Issue 22
Volume 256,
Issue 21
Volume 256,
Issue 20
Volume 256,
Issue 19
Volume 256,
Issue 18
Volume 256,
Issue 17
Volume 256,
Issue 16
Volume 256,
Issue 15
Volume 256,
Issue 14
Volume 256,
Issue 13
Volume 256,
Issue 12
Volume 256,
Issue 11
Volume 256,
Issue 10
Volume 256,
Issue 9
Volume 256,
Issue 8
Volume 256,
Issue 7
Volume 256,
Issue 6
Volume 256,
Issue 5
Volume 256,
Issue 4
Volume 256,
Issue 3
Volume 256,
Issue 2
Volume 256,
Issue 1
Volume 255,
Issue 24
Volume 255,
Issue 23
Volume 255,
Issue 22
Volume 255,
Issue 21
Volume 255,
Issue 20
Volume 255,
Issue 19
Volume 255,
Issue 18
Volume 255,
Issue 17
Volume 255,
Issue 16
Volume 255,
Issue 15
Volume 255,
Issue 14
Volume 255,
Issue 13
Volume 255,
Issue 12
Volume 255,
Issue 11
Volume 255,
Issue 10
Volume 255,
Issue 9
Volume 255,
Issue 8
Volume 255,
Issue 7
Volume 255,
Issue 6
Volume 255,
Issue 5
Volume 255,
Issue 4
Volume 255,
Issue 3
Volume 255,
Issue 2
Volume 255,
Issue 1
Volume 254,
Issue 24
Volume 254,
Issue 23
Volume 254,
Issue 22
Volume 254,
Issue 21
Volume 254,
Issue 20
Volume 254,
Issue 19
Volume 254,
Issue 18
Volume 254,
Issue 17
Volume 254,
Issue 16
Volume 254,
Issue 15
Volume 254,
Issue 14
Volume 254,
Issue 13
Volume 254,
Issue 12
Volume 254,
Issue 11
Volume 254,
Issue 10
Volume 254,
Issue 9
Volume 254,
Issue 8
Volume 254,
Issue 7
Volume 254,
Issue 6
Volume 254,
Issue 5
Volume 254,
Issue 4
Volume 254,
Issue 3
Volume 254,
Issue 2
Volume 254,
Issue 1
Volume 253,
Issue 24
Volume 253,
Issue 23
Volume 253,
Issue 22
Volume 253,
Issue 21
Volume 253,
Issue 20
Volume 253,
Issue 19
Volume 253,
Issue 18
Volume 253,
Issue 17
Volume 253,
Issue 16
Volume 253,
Issue 15
Volume 253,
Issue 14
Volume 253,
Issue 13
Volume 253,
Issue 12
Volume 253,
Issue 11
Volume 253,
Issue 10
Volume 253,
Issue 9
Volume 253,
Issue 8
Volume 253,
Issue 7
Volume 253,
Issue 6
Volume 253,
Issue 5
Volume 253,
Issue 4
Volume 253,
Issue 3
Volume 253,
Issue 2
Volume 253,
Issue 1
Volume 252,
Issue 24
Volume 252,
Issue 23
Volume 252,
Issue 22
Volume 252,
Issue 21
Volume 252,
Issue 20
Volume 252,
Issue 19
Volume 252,
Issue 18
Volume 252,
Issue 17
Volume 252,
Issue 16
Volume 252,
Issue 15
Volume 252,
Issue 14
Volume 252,
Issue 13
Volume 252,
Issue 12
Volume 252,
Issue 11
Volume 252,
Issue 10
Volume 252,
Issue 9
Volume 252,
Issue 8
Volume 252,
Issue 7
Volume 252,
Issue 6
Volume 252,
Issue 5
Volume 252,
Issue 4
Volume 252,
Issue 3
Volume 252,
Issue 2
Volume 252,
Issue 1
Volume 251,
Issue 4
Volume 251,
Issue 1
Volume 250,
Issue 4
Volume 250,
Issue 1
Volume 249,
Issue 4
Volume 249,
Issue 1
Volume 248,
Issue 4
Volume 248,
Issue 1
Volume 247,
Issue 4
Volume 247,
Issue 1
Volume 246,
Issue 4
Volume 246,
Issue 3
Volume 246,
Issue 1
Volume 245,
Issue 4
Volume 245,
Issue 1
Volume 244,
Issue 4
Volume 244,
Issue 1
Volume 243,
Issue 4
Volume 243,
Issue 1
Volume 242,
Issue 4
Volume 242,
Issue 3
Volume 242,
Issue 2
Volume 242,
Issue 1
Volume 241,
Issue 4
Volume 241,
Issue 3
Volume 241,
Issue 2
Volume 241,
Issue 1
Volume 240,
Issue 4
Volume 240,
Issue 1
Volume 239,
Issue 4
Volume 239,
Issue 3
Volume 239,
Issue 2
Volume 239,
Issue 1
Volume 238,
Issue 4
Volume 238,
Issue 1
Volume 237,
Issue 4
Volume 237,
Issue 1
Volume 236,
Issue 4
Volume 236,
Issue 1
Volume 235,
Issue 4
Volume 235,
Issue 3
Volume 235,
Issue 2
Volume 235,
Issue 1
Volume 234,
Issue 4
Volume 234,
Issue 1
Volume 233,
Issue 4
Volume 233,
Issue 1
Volume 232,
Issue jun
Volume 232,
Issue 2004
Volume 232,
Issue 15
Volume 231,
Issue jun
Volume 231,
Issue 2004
Volume 231,
Issue 15
Volume 230,
Issue 4
Volume 230,
Issue 1
Volume 229,
Issue 4
Volume 229,
Issue 1
Volume 228,
Issue 4
Volume 228,
Issue 1
Volume 227,
Issue 4
Volume 227,
Issue 1
Volume 226,
Issue 4
Volume 226,
Issue 3
Volume 226,
Issue 1
Volume 225,
Issue 4
Volume 225,
Issue 1
Volume 224,
Issue 4
Volume 224,
Issue 1
Volume 223,
Issue 4
Volume 223,
Issue 3
Volume 223,
Issue 1
Volume 222,
Issue 4
Volume 222,
Issue 1
Volume 221,
Issue 4
Volume 221,
Issue 1
Volume 220,
Issue 4
Volume 220,
Issue 1
Volume 219,
Issue 4
Volume 219,
Issue 3
Volume 219,
Issue 2
Volume 219,
Issue 1
Volume 218,
Issue 4
Volume 218,
Issue 1
Volume 217,
Issue 4
Volume 217,
Issue 1
Volume 216,
Issue spec
Volume 216,
Issue 4
Volume 216,
Issue 1
Volume 215,
Issue spec
Volume 215,
Issue 4
Volume 215,
Issue 1
Volume 214,
Issue 4
Volume 214,
Issue 1
Volume 213,
Issue spec
Volume 212,
Issue spec
Volume 212,
Issue 1
Volume 211,
Issue 4
Volume 211,
Issue 1
Volume 210,
Issue spec
Volume 210,
Issue 4
Volume 210,
Issue 3
Volume 210,
Issue 2
Volume 210,
Issue 1
Volume 209,
Issue 1
Volume 208,
Issue 1
Volume 207,
Issue 4
Volume 207,
Issue 1
Volume 206,
Issue 4
Volume 206,
Issue 1
Volume 205,
Issue 4
Volume 205,
Issue 1
Volume 204,
Issue jan
Volume 204,
Issue 2003
Volume 204,
Issue 15
Volume 203,
Issue jan
Volume 203,
Issue 2003
Volume 203,
Issue 15
Volume 202,
Issue 4
Volume 202,
Issue 3
Volume 202,
Issue 2
Volume 202,
Issue 1
Volume 201,
Issue 4
Volume 201,
Issue 1
Volume 200,
Issue 4
Volume 200,
Issue 1
Volume 199,
Issue 4
Volume 199,
Issue 1
Volume 196,
Issue 4
Volume 196,
Issue 1
Volume 195,
Issue 4
Volume 195,
Issue 1
Volume 194,
Issue 4
Volume 194,
Issue 1
Volume 193,
Issue 4
Volume 193,
Issue 1
Volume 192,
Issue 4
Volume 192,
Issue 1
Volume 191,
Issue 4
Volume 191,
Issue 1
Volume 190,
Issue 4
Volume 190,
Issue 1
Volume 189,
Issue 4
Volume 189,
Issue 3
Volume 189,
Issue 2
Volume 189,
Issue 1
Volume 188,
Issue 4
Volume 188,
Issue 3
Volume 188,
Issue 2
Volume 188,
Issue 1
Volume 187,
Issue 4
Volume 187,
Issue 3
Volume 187,
Issue 2
Volume 187,
Issue 1
Volume 186,
Issue 4
Volume 186,
Issue 1
Volume 185,
Issue 4
Volume 185,
Issue 3
Volume 185,
Issue 2
Volume 185,
Issue 1
Volume 184,
Issue 4
Volume 184,
Issue 1
Volume 183,
Issue 4
Volume 183,
Issue 3
Volume 183,
Issue 2
Volume 183,
Issue 1
Volume 182,
Issue 4
Volume 182,
Issue 3
Volume 182,
Issue 2
Volume 182,
Issue 1
Volume 181,
Issue 4
Volume 181,
Issue 3
Volume 181,
Issue 2
Volume 181,
Issue 1
Volume 180,
Issue 4
Volume 180,
Issue 3
Volume 180,
Issue 2
Volume 180,
Issue 1
Volume 179,
Issue 4
Volume 179,
Issue 1
Volume 178,
Issue 4
Volume 178,
Issue 1
Volume 177,
Issue 4
Volume 177,
Issue 3
Volume 177,
Issue 2
Volume 177,
Issue 1
Volume 175,
Issue 1
Volume 174,
Issue 4
Volume 174,
Issue 3
Volume 174,
Issue 2
Volume 174,
Issue 1
Volume 173,
Issue 4
Volume 173,
Issue 3
Volume 173,
Issue 2
Volume 173,
Issue 1
Volume 172,
Issue 4
Volume 172,
Issue 3
Volume 172,
Issue 2
Volume 172,
Issue 1
Volume 171,
Issue 4
Volume 171,
Issue 3
Volume 171,
Issue 2
Volume 171,
Issue 1
Volume 168,
Issue 4
Volume 168,
Issue 1
Volume 167,
Issue 4
Volume 167,
Issue 3
Volume 167,
Issue 2
Volume 167,
Issue 1
Volume 166,
Issue 4
Volume 166,
Issue 1
Volume 165,
Issue 4
Volume 165,
Issue 3
Volume 165,
Issue 2
Volume 165,
Issue 1
Volume 164,
Issue 4
Volume 164,
Issue 1
Volume 162,
Issue 1
Volume 161,
Issue 4
Volume 161,
Issue 3
Volume 161,
Issue 2
Volume 161,
Issue 1
Volume 160,
Issue 1
Volume 159,
Issue 1
Volume 158,
Issue 4
Volume 158,
Issue 3
Volume 158,
Issue 2
Volume 158,
Issue 1
Volume 157,
Issue 4
Volume 157,
Issue 3
Volume 157,
Issue 2
Volume 157,
Issue 1
Volume 156,
Issue 4
Volume 156,
Issue 1
Volume 153,
Issue 4
Volume 153,
Issue 3
Volume 153,
Issue 2
Volume 153,
Issue 1
Volume 152,
Issue 4
Volume 152,
Issue 3
Volume 152,
Issue 2
Volume 152,
Issue 1
Volume 151,
Issue 4
Volume 151,
Issue 3
Volume 151,
Issue 2
Volume 151,
Issue 1
Volume 150,
Issue complete
Volume 150,
Issue 4
Volume 150,
Issue 1
Volume 149,
Issue 4
Volume 149,
Issue 1
Volume 148,
Issue 4
Volume 148,
Issue 3
Volume 148,
Issue 2
Volume 148,
Issue 1
Volume 147,
Issue 4
Volume 147,
Issue 1
Volume 146,
Issue 4
Volume 146,
Issue 1
Volume 144,
Issue 1
Volume 143,
Issue 4
Volume 143,
Issue 1
Volume 142,
Issue 4
Volume 142,
Issue 1
Volume 141,
Issue 4
Volume 141,
Issue 3
Volume 141,
Issue 2
Volume 141,
Issue 1
Volume 140,
Issue 4
Volume 140,
Issue 3
Volume 140,
Issue 2
Volume 140,
Issue 1
Volume 137,
Issue 4
Volume 137,
Issue 1
Volume 136,
Issue 4
Volume 136,
Issue 3
Volume 136,
Issue 2
Volume 136,
Issue 1
Volume 135,
Issue 4
Volume 135,
Issue 1
Volume 134,
Issue 4
Volume 134,
Issue 1
Volume 133,
Issue 4
Volume 133,
Issue 3
Volume 133,
Issue 2
Volume 133,
Issue 1
Volume 132,
Issue 4
Volume 132,
Issue 1
Volume 130,
Issue 4
Volume 130,
Issue 1
Volume 129,
Issue 4
Volume 129,
Issue 1
Volume 127,
Issue 4
Volume 127,
Issue 1
Volume 126,
Issue 4
Volume 126,
Issue 3
Volume 126,
Issue 2
Volume 126,
Issue 1
Volume 125,
Issue 4
Volume 125,
Issue 3
Volume 125,
Issue 2
Volume 125,
Issue 1
Volume 122,
Issue 4
Volume 122,
Issue 1
Volume 121,
Issue 4
Volume 121,
Issue 1
Volume 120,
Issue 4
Volume 120,
Issue 3
Volume 120,
Issue 2
Volume 120,
Issue 1
Volume 119,
Issue 4
Volume 119,
Issue 3
Volume 119,
Issue 2
Volume 119,
Issue 1
Volume 118,
Issue com
Volume 117,
Issue com
Volume 116,
Issue com
Volume 116,
Issue 1
Volume 115,
Issue 4
Volume 115,
Issue 3
Volume 115,
Issue 2
Volume 115,
Issue 1
Volume 114,
Issue com
Volume 113,
Issue com
Volume 112,
Issue com
Volume 111,
Issue complete
Volume 111,
Issue com
Volume 110,
Issue complete
Volume 110,
Issue com
Volume 110,
Issue 3
Volume 109,
Issue complete
Volume 109,
Issue com
Volume 108,
Issue 4
Volume 108,
Issue 3
Volume 108,
Issue 2
Volume 108,
Issue 1
Volume 107,
Issue com
Volume 106,
Issue com
Volume 105,
Issue com
Volume 104,
Issue com
Volume 103,
Issue 4
Volume 103,
Issue 3
Volume 103,
Issue 2
Volume 103,
Issue 1
Volume 102,
Issue com
Volume 101,
Issue complete
Volume 101,
Issue com
Volume 100,
Issue complete
Volume 100,
Issue com
Volume 99,
Issue 4
Volume 99,
Issue 3
Volume 99,
Issue 2
Volume 99,
Issue 1
Volume 98,
Issue complete
Volume 98,
Issue com
Volume 96,
Issue complete
Volume 96,
Issue com
Volume 95,
Issue complete
Volume 95,
Issue com
Volume 94,
Issue complete
Volume 94,
Issue com
Volume 93,
Issue 4
Volume 93,
Issue 3
Volume 93,
Issue 2
Volume 93,
Issue 1
Volume 92,
Issue 4
Volume 92,
Issue 1
Volume 91,
Issue com
Volume 90,
Issue 4
Volume 90,
Issue 3
Volume 90,
Issue 2
Volume 90,
Issue 1
Volume 89,
Issue 4
Volume 89,
Issue 3
Volume 89,
Issue 2
Volume 89,
Issue 1
Volume 88,
Issue com
Volume 87,
Issue com
Volume 86,
Issue com
Volume 85,
Issue com
Volume 84,
Issue 4
Volume 84,
Issue 3
Volume 84,
Issue 2
Volume 84,
Issue 1
Volume 83,
Issue com
Volume 82,
Issue com
Volume 81,
Issue 4
Volume 81,
Issue 3
Volume 81,
Issue 2
Volume 81,
Issue 1
Volume 80,
Issue complete
Volume 80,
Issue com
Volume 79,
Issue complete
Volume 79,
Issue com
Volume 78,
Issue 4
Volume 78,
Issue 3
Volume 78,
Issue 2
Volume 78,
Issue 1
Volume 77,
Issue complete
Volume 77,
Issue com
Volume 77,
Issue 2
Volume 76,
Issue complete
Volume 76,
Issue com
Volume 76,
Issue 2
Volume 75,
Issue ii
Volume 75,
Issue com
Volume 75,
Issue 4
Volume 75,
Issue 1
Volume 74,
Issue i
Volume 74,
Issue 4
Volume 74,
Issue 3
Volume 74,
Issue 2
Volume 74,
Issue 1
Volume 73,
Issue complete
Volume 72,
Issue 4
Volume 72,
Issue 3
Volume 72,
Issue 2
Volume 72,
Issue 1
Volume 71,
Issue part
Volume 71,
Issue com
Volume 71,
Issue b
Volume 71,
Issue a
Volume 70,
Issue part
Volume 70,
Issue com
Volume 70,
Issue b
Volume 70,
Issue a
Volume 69,
Issue 4
Volume 69,
Issue 1
Volume 68,
Issue 4
Volume 68,
Issue 3
Volume 68,
Issue 2
Volume 68,
Issue 1
Volume 67,
Issue com
Volume 67,
Issue 4
Volume 67,
Issue 1
Volume 66,
Issue com
Volume 65,
Issue com
Volume 64,
Issue 4
Volume 64,
Issue 3
Volume 64,
Issue 2
Volume 64,
Issue 1
Volume 63,
Issue 4
Volume 63,
Issue 1
Volume 62,
Issue 4
Volume 62,
Issue 3
Volume 62,
Issue 2
Volume 62,
Issue 1
Volume 61,
Issue 4
Volume 61,
Issue 1
Volume 60,
Issue 4
Volume 60,
Issue 1
Volume 59,
Issue 4
Volume 59,
Issue 3
Volume 59,
Issue 2
Volume 59,
Issue 1
Volume 55,
Issue 4
Volume 55,
Issue 3
Volume 55,
Issue 2
Volume 55,
Issue 1
Volume 52,
Issue 4
Volume 52,
Issue 2
Volume 52,
Issue 1
Volume 51,
Issue 4
Volume 51,
Issue 3
Volume 51,
Issue 2
Volume 51,
Issue 1
Volume 50,
Issue 4
Volume 50,
Issue 1
Volume 49,
Issue complete
Volume 48,
Issue complete
Volume 47,
Issue 4
Volume 47,
Issue 3
Volume 47,
Issue 2
Volume 47,
Issue 1
Volume 46,
Issue 4
Volume 46,
Issue 1
Volume 45,
Issue 4
Volume 45,
Issue 3
Volume 45,
Issue 1
Volume 44,
Issue 4
Volume 44,
Issue 3
Volume 44,
Issue 2
Volume 44,
Issue 1
Volume 43,
Issue 4
Volume 43,
Issue 1
Volume 40,
Issue 4
Volume 40,
Issue 3
Volume 40,
Issue 2
Volume 40,
Issue 1
Volume 39,
Issue 4
Volume 39,
Issue 1
Volume 38,
Issue 4
Volume 38,
Issue 1
Volume 37,
Issue 4
Volume 37,
Issue 3
Volume 37,
Issue 2
Volume 37,
Issue 1
Volume 36,
Issue 4
Volume 36,
Issue 1
Volume 35,
Issue 4
Volume 35,
Issue 2
Volume 35,
Issue 1
Volume 34,
Issue 4
Volume 34,
Issue 1
Volume 33,
Issue 4
Volume 33,
Issue 1
Volume 32,
Issue 4
Volume 32,
Issue 2
Volume 32,
Issue 1
Volume 31,
Issue 4
Volume 31,
Issue 1
Volume 30,
Issue 4
Volume 30,
Issue 1
Volume 29,
Issue 4
Volume 29,
Issue 3
Volume 29,
Issue 2
Volume 29,
Issue 1
Volume 28,
Issue 4
Volume 28,
Issue 3
Volume 28,
Issue 2
Volume 28,
Issue 1
Volume 27,
Issue 4
Volume 27,
Issue 3
Volume 27,
Issue 2
Volume 27,
Issue 1
Volume 26,
Issue 4
Volume 26,
Issue 3
Volume 26,
Issue 2
Volume 26,
Issue 1
Volume 25,
Issue 4
Volume 25,
Issue 3
Volume 25,
Issue 2
Volume 25,
Issue 1
Volume 24,
Issue 4
Volume 24,
Issue 3
Volume 24,
Issue 2
Volume 24,
Issue 1
Volume 4,
Issue 3
>
Table of contents
1
13th Applied Surface Analysis Workshop (AOFA 13)
Wetzig, Klaus
et al.
| 2005
3
Depth profile and interface analysis in the nm-range
Oswald, S.
/ Reiche, R.
/ Zier, M.
et al.
| 2005
11
Phase analysis of TaN/Ta barrier layers in sub-micrometer trench structures for Cu interconnects
Traving, M.
/ Zienert, I.
/ Zschech, E.
et al.
| 2005
18
New physical techniques for IC functional analysis of on-chip devices and interconnects
Boit, Christian
et al.
| 2005
24
Visible-light attachment of SiC linked functionalized organic monolayers on silicon surfaces
de Smet, Louis C.P.M.
/ Pukin, Aliaksei V.
/ Sun, Qiao-Yu
et al.
| 2005
31
Elementary processes at semiconductor/electrolyte interfaces: perspectives and limits of electron spectroscopy
Mayer, Th.
/ Lebedev, M.
/ Hunger, R.
et al.
| 2005
43
Morphological and elemental characterisation with the high-energy ion-nanoprobe LIPSION
Butz, T.
/ Meinecke, Ch.
/ Morawski, M.
et al.
| 2005
49
Comparison of reference-free X-ray fluorescence analysis and X-ray reflectometry for thickness determination in the nanometer range
Kolbe, Michael
/ Beckhoff, Burkhard
/ Krumrey, Michael
et al.
| 2005
53
Determination of layer thickness with #956XRF
Vogt, Carla
et al.
| 2006
53
Determination of layer thickness with mXRF
Vogt, C.
/ Dargel, R.
et al.
| 2005
53
Determination of layer thickness with μXRF
Vogt, Carla
/ Dargel, Rainer
et al.
| 2005
57
Laboratory LPP EUV reflectometer working with non-polarized radiation
van Loyen, Ludwig
/ Böttger, Thomas
/ Schädlich, Stefan
et al.
| 2005
61
Quantitative XPS imaging#8212new possibilities with the delay-line detector
Vohrer, U.
et al.
| 2006
61
Quantitative XPS imaging—new possibilities with the delay-line detector
Vohrer, U.
/ Blomfield, C.
/ Page, S.
et al.
| 2005
66
A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films
Kothleitner, Gerald
/ Rogers, M.
/ Berendes, A.
et al.
| 2005
77
Chemisorption at interfaces between organic semiconductors and metals: role of the electron affinity
Knupfer, M.
/ Schwieger, T.
et al.
| 2005
81
IR and SFM study of PTCDA thin films on different substrates
Berger, Steffen
/ Heimer, Kathrin
/ Mack, H.G.
et al.
| 2005
85
Photoelectron spectroscopy of nanocrystalline anatase TiO2 films
Orendorz, Adam
/ Wüsten, Jens
/ Ziegler, Christiane
et al.
| 2005
89
Characterization of thin Ta–Si–Nx layers of different nitrogen content using XPS, UPS and STM
Zahn, W.
/ Hildebrand, D.
/ Menzel, S.
et al.
| 2005
89
Characterization of thin Ta#8211Si#8211N x layers of different nitrogen content using XPS, UPS and STM
Zahn, W.
et al.
| 2006
94
Nm-scale resolution studies of the bond interface between ultrasonically welded Al-alloys by an analytical TEM: a path to comprehend bonding phenomena?
Brodyanski, A.
/ Born, C.
/ Kopnarski, M.
et al.
| 2005
98
On the cleaning of monocrystalline metallic samples from impurities
Arabczyk, W.
/ Narkiewicz, U.
et al.
| 2005
104
Post deposition purification of PTCDA thin films
Wüsten, J.
/ Ertl, Th.
/ Lach, S.
et al.
| 2005
108
Corrosion of aluminium components studied with MIES, UPS and XPS
Frerichs, Martin
/ Voigts, Florian
/ Hollunder, Sven
et al.
| 2005
113
Analytical methods for the characterisation of leaf surfaces: a contribution to understand the processes of biomineralization
Hinke, Simone
/ Marx, Günter
/ Fehlhaber, Rüdiger
et al.
| 2005
117
Initial bioadhesion on surfaces in the oral cavity investigated by scanning force microscopy
Schwender, N.
/ Huber, K.
/ Marrawi, F. Al
et al.
| 2005
123
Low energy RBS and SIMS analysis of the SiGe quantum well
Krecar, D.
/ Rosner, M.
/ Draxler, M.
et al.
| 2005
127
Quantitative element mapping of Mg alloys by laser ablation ICP-MS and EPMA
Latkoczy, Christopher
/ Müller, Yves
/ Schmutz, Patrik
et al.
| 2005
133
Investigations of corrosion phenomena on gold coins with SIMS
Mayerhofer, K.E.
/ Piplits, K.
/ Traum, R.
et al.
| 2005
139
Alkyl chain effects in thin films of substituted phthalocyanines studied using infrared spectroscopy
Haug, A.
/ Harbeck, S.
/ Dini, D.
et al.
| 2005
143
Electronic properties of the organic semiconductor hetero-interface CuPc/C60
Molodtsova, O.V.
/ Schwieger, T.
/ Knupfer, M.
et al.
| 2005
148
XPS investigation of the PTFE induced hydrophobic properties of electrodes for low temperature fuel cells
Schulze, M.
/ Christenn, C.
et al.
| 2005
154
Protein adsorption on solid#8211liquid interfaces monitored by laser-ellipsometry
Seitz, R.
et al.
| 2006
154
Protein adsorption on solid–liquid interfaces monitored by laser-ellipsometry
Seitz, R.
/ Brings, R.
/ Geiger, R.
et al.
| 2005
158
Investigation of organic impurities adsorbed on and incorporated into electroplated copper layers
Stangl, M.
/ Dittel, V.
/ Acker, J.
et al.
| 2005
162
Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling
Baunack, S.
/ Mudali, U. Kamachi
/ Gebert, A.
et al.
| 2005
167
Analysis of Mg–B compounds by means of Auger electron microprobe
Baunack, S.
/ Perner, O.
/ Fischer, C.
et al.
| 2005
167
Analysis of Mg#8211B compounds by means of Auger electron microprobe
Baunack, S.
et al.
| 2006
172
Surface characterisation and interface studies of high-k materials by XPS and TOF-SIMS
Besmehn, A.
/ Scholl, A.
/ Rije, E.
et al.
| 2005
177
Comparing the chemical properties of evaporated and sputtered niobium films on oxidized Si(100) wafers #8211 preparation of oxynitride films
Brunkahl, O.
et al.
| 2006
177
Comparing the chemical properties of evaporated and sputtered niobium films on oxidized Si(100) wafers – preparation of oxynitride films
Brunkahl, O.
/ Bock, W.
/ Thoma, K.
et al.
| 2005
185
Investigation of ultrathin tantalum based diffusion barrier films using AES and TEM
Dittmar, Kornelia
/ Engelmann, Hans-Jürgen
/ Peikert, M.
et al.
| 2005
189
First nucleation steps of vanadium oxide thin films studied by XPS inelastic peak shape analysis
Gracia, F.
/ Yubero, F.
/ Espinós, J.P.
et al.
| 2005
196
Electronic structure and topography of annealed SrTiO3(111) surfaces studied with MIES and STM
Gömann, Anissa
/ Gömann, Karsten
/ Frerichs, Martin
et al.
| 2005
200
Mechanical stress in ALD-Al2O3 films
Krautheim, Gunter
/ Hecht, Thomas
/ Jakschik, Stefan
et al.
| 2005
205
Formation of niobium oxynitrides by rapid thermal processing (RTP)
Matylitskaya, V.A.
/ Bock, W.
/ Thoma, K.
et al.
| 2005
211
Effect of Ag-alloying addition on the stress–temperature behavior of electroplated copper thin films
Menzel, S.
/ Strehle, S.
/ Wendrock, H.
et al.
| 2005
211
Effect of Ag-alloying addition on the stress#8211temperature behavior of electroplated copper thin films
Menzel, S.
et al.
| 2006
215
Material transport in Al-metallizations of power-loaded SAW structures
Menzel, S.
/ Pekarčikova, M.
/ Hofmann, M.
et al.
| 2005
218
XPS and AES investigations of hard magnetic Nd#8211Fe#8211B films
Oswald, S.
et al.
| 2006
218
XPS and AES investigations of hard magnetic Nd–Fe–B films
Oswald, S.
/ Fähler, S.
/ Baunack, S.
et al.
| 2005
223
Characterization of PECVD boron carbonitride layers
Thamm, T.
/ Körner, K.-U.
/ Bohne, W.
et al.
| 2005
227
Analysis of chemical dissolution of the barrier layer of porous oxide on aluminum thin films using a re-anodizing technique
Vrublevsky, I.
/ Parkoun, V.
/ Sokol, V.
et al.
| 2005
234
XPS and ARXPS investigations of ultra thin TaN films deposited on SiO2 and Si
Zier, M.
/ Oswald, S.
/ Reiche, R.
et al.
| 2005
240
Advances in X-ray excitation of Kossel patterns by a focusing polycapillary lens
Langer, E.
/ Däbritz, S.
/ Hauffe, W.
et al.
| 2005
245
Shells on nanowires detected by analytical TEM
Thomas, Jürgen
/ Gemming, Thomas
et al.
| 2005
252
Multivariate data analysis for depth resolved chemical classification and quantification of sulfur in SNMS
Sommer, M.
/ Goschnick, J.
et al.
| 2005
257
SNMS investigations of platinum-doped nanogranular tin dioxide layers
Schneider, T.
/ Sommer, M.
/ Goschnick, J.
et al.
| 2005
261
Analysis of new electrical signals in respect to quantification of radio frequency glow discharge emission spectrometry
Wilken, L.
/ Hoffmann, V.
/ Wetzig, K.
et al.
| 2005
266
Characterisation of molybdenum intermediate layers in Cu–C system with SIMS method
Mayerhofer, K.E.
/ Schrank, C.
/ Eisenmenger-Sittner, C.
et al.
| 2005
266
Characterisation of molybdenum intermediate layers in Cu#8211C system with SIMS method
Mayerhofer, K.E.
et al.
| 2006
271
Range evaluation in SIMS depth profiles of Er-implantations in silicon
Mayerhofer, K.
/ Foisner, H.
/ Piplits, K.
et al.
| 2005
278
SIMS investigation of gettering centres produced by phosphorus MeV ion implantation
Krecar, D.
/ Fuchs, M.
/ Kögler, R.
et al.
| 2005
282
2D and 3D SIMS investigations on sintered steels
Krecar, Dragan
/ Zwanziger, Jürgen
/ Vassileva, Vassilka
et al.
| 2005