Advances in X-ray excitation of Kossel patterns by a focusing polycapillary lens (English)
- New search for: Langer, E.
- New search for: Däbritz, S.
- New search for: Hauffe, W.
- New search for: Haschke, M.
- New search for: Langer, E.
- New search for: Däbritz, S.
- New search for: Hauffe, W.
- New search for: Haschke, M.
In:
Applied Surface Science
;
252
, 1
;
240-244
;
2005
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ISSN:
- Article (Journal) / Electronic Resource
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Title:Advances in X-ray excitation of Kossel patterns by a focusing polycapillary lens
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Contributors:
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Published in:Applied Surface Science ; 252, 1 ; 240-244
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Publisher:
- New search for: Elsevier B.V.
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Publication date:2005-01-01
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Size:5 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 252, Issue 1
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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13th Applied Surface Analysis Workshop (AOFA 13)Wetzig, Klaus et al. | 2005
- 3
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Depth profile and interface analysis in the nm-rangeOswald, S. / Reiche, R. / Zier, M. / Baunack, S. / Wetzig, K. et al. | 2005
- 11
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Phase analysis of TaN/Ta barrier layers in sub-micrometer trench structures for Cu interconnectsTraving, M. / Zienert, I. / Zschech, E. / Schindler, G. / Steinhögl, W. / Engelhardt, M. et al. | 2005
- 18
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New physical techniques for IC functional analysis of on-chip devices and interconnectsBoit, Christian et al. | 2005
- 24
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Visible-light attachment of SiC linked functionalized organic monolayers on silicon surfacesde Smet, Louis C.P.M. / Pukin, Aliaksei V. / Sun, Qiao-Yu / Eves, Brian J. / Lopinski, Gregory P. / Visser, Gerben M. / Zuilhof, Han / Sudhölter, Ernst J.R. et al. | 2005
- 31
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Elementary processes at semiconductor/electrolyte interfaces: perspectives and limits of electron spectroscopyMayer, Th. / Lebedev, M. / Hunger, R. / Jaegermann, W. et al. | 2005
- 43
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Morphological and elemental characterisation with the high-energy ion-nanoprobe LIPSIONButz, T. / Meinecke, Ch. / Morawski, M. / Reinert, T. / Schwertner, M. / Spemann, D. / Vogt, J. et al. | 2005
- 49
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Comparison of reference-free X-ray fluorescence analysis and X-ray reflectometry for thickness determination in the nanometer rangeKolbe, Michael / Beckhoff, Burkhard / Krumrey, Michael / Ulm, Gerhard et al. | 2005
- 53
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Determination of layer thickness with #956XRFVogt, Carla et al. | 2006
- 53
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Determination of layer thickness with μXRFVogt, Carla / Dargel, Rainer et al. | 2005
- 53
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Determination of layer thickness with mXRFVogt, C. / Dargel, R. et al. | 2005
- 57
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Laboratory LPP EUV reflectometer working with non-polarized radiationvan Loyen, Ludwig / Böttger, Thomas / Schädlich, Stefan / Braun, Stefan / Foltyn, Thomas / Leson, Andreas / Scholze, Frank / Müllender, Stephan et al. | 2005
- 61
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Quantitative XPS imaging#8212new possibilities with the delay-line detectorVohrer, U. et al. | 2006
- 61
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Quantitative XPS imaging—new possibilities with the delay-line detectorVohrer, U. / Blomfield, C. / Page, S. / Roberts, A. et al. | 2005
- 66
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A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin filmsKothleitner, Gerald / Rogers, M. / Berendes, A. / Bock, W. / Kolbesen, B.O. et al. | 2005
- 77
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Chemisorption at interfaces between organic semiconductors and metals: role of the electron affinityKnupfer, M. / Schwieger, T. et al. | 2005
- 81
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IR and SFM study of PTCDA thin films on different substratesBerger, Steffen / Heimer, Kathrin / Mack, H.G. / Ziegler, Christiane et al. | 2005
- 85
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Photoelectron spectroscopy of nanocrystalline anatase TiO2 filmsOrendorz, Adam / Wüsten, Jens / Ziegler, Christiane / Gnaser, Hubert et al. | 2005
- 89
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Characterization of thin Ta#8211Si#8211N x layers of different nitrogen content using XPS, UPS and STMZahn, W. et al. | 2006
- 89
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Characterization of thin Ta–Si–Nx layers of different nitrogen content using XPS, UPS and STMZahn, W. / Hildebrand, D. / Menzel, S. / Oswald, S. / Heuer, H. et al. | 2005
- 94
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Nm-scale resolution studies of the bond interface between ultrasonically welded Al-alloys by an analytical TEM: a path to comprehend bonding phenomena?Brodyanski, A. / Born, C. / Kopnarski, M. et al. | 2005
- 98
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On the cleaning of monocrystalline metallic samples from impuritiesArabczyk, W. / Narkiewicz, U. et al. | 2005
- 104
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Post deposition purification of PTCDA thin filmsWüsten, J. / Ertl, Th. / Lach, S. / Ziegler, Ch. et al. | 2005
- 108
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Corrosion of aluminium components studied with MIES, UPS and XPSFrerichs, Martin / Voigts, Florian / Hollunder, Sven / Masendorf, Rainer / Esderts, Alfons / Maus-Friedrichs, Wolfgang et al. | 2005
- 113
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Analytical methods for the characterisation of leaf surfaces: a contribution to understand the processes of biomineralizationHinke, Simone / Marx, Günter / Fehlhaber, Rüdiger / Wienhaus, Otto et al. | 2005
- 117
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Initial bioadhesion on surfaces in the oral cavity investigated by scanning force microscopySchwender, N. / Huber, K. / Marrawi, F. Al / Hannig, M. / Ziegler, Ch. et al. | 2005
- 123
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Low energy RBS and SIMS analysis of the SiGe quantum wellKrecar, D. / Rosner, M. / Draxler, M. / Bauer, P. / Hutter, H. et al. | 2005
- 127
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Quantitative element mapping of Mg alloys by laser ablation ICP-MS and EPMALatkoczy, Christopher / Müller, Yves / Schmutz, Patrik / Günther, Detlef et al. | 2005
- 133
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Investigations of corrosion phenomena on gold coins with SIMSMayerhofer, K.E. / Piplits, K. / Traum, R. / Griesser, M. / Hutter, H. et al. | 2005
- 139
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Alkyl chain effects in thin films of substituted phthalocyanines studied using infrared spectroscopyHaug, A. / Harbeck, S. / Dini, D. / Hanack, M. / Cook, M.J. / Peisert, H. / Chassé, T. et al. | 2005
- 143
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Electronic properties of the organic semiconductor hetero-interface CuPc/C60Molodtsova, O.V. / Schwieger, T. / Knupfer, M. et al. | 2005
- 148
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XPS investigation of the PTFE induced hydrophobic properties of electrodes for low temperature fuel cellsSchulze, M. / Christenn, C. et al. | 2005
- 154
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Protein adsorption on solid–liquid interfaces monitored by laser-ellipsometrySeitz, R. / Brings, R. / Geiger, R. et al. | 2005
- 154
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Protein adsorption on solid#8211liquid interfaces monitored by laser-ellipsometrySeitz, R. et al. | 2006
- 158
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Investigation of organic impurities adsorbed on and incorporated into electroplated copper layersStangl, M. / Dittel, V. / Acker, J. / Hoffmann, V. / Gruner, W. / Strehle, S. / Wetzig, K. et al. | 2005
- 162
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Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profilingBaunack, S. / Mudali, U. Kamachi / Gebert, A. et al. | 2005
- 167
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Analysis of Mg#8211B compounds by means of Auger electron microprobeBaunack, S. et al. | 2006
- 167
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Analysis of Mg–B compounds by means of Auger electron microprobeBaunack, S. / Perner, O. / Fischer, C. et al. | 2005
- 172
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Surface characterisation and interface studies of high-k materials by XPS and TOF-SIMSBesmehn, A. / Scholl, A. / Rije, E. / Breuer, U. et al. | 2005
- 177
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Comparing the chemical properties of evaporated and sputtered niobium films on oxidized Si(100) wafers – preparation of oxynitride filmsBrunkahl, O. / Bock, W. / Thoma, K. / Kolbesen, B.O. et al. | 2005
- 177
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Comparing the chemical properties of evaporated and sputtered niobium films on oxidized Si(100) wafers #8211 preparation of oxynitride filmsBrunkahl, O. et al. | 2006
- 185
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Investigation of ultrathin tantalum based diffusion barrier films using AES and TEMDittmar, Kornelia / Engelmann, Hans-Jürgen / Peikert, M. / Wieser, E. / Borany, J.V. et al. | 2005
- 189
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First nucleation steps of vanadium oxide thin films studied by XPS inelastic peak shape analysisGracia, F. / Yubero, F. / Espinós, J.P. / González-Elipe, A.R. et al. | 2005
- 196
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Electronic structure and topography of annealed SrTiO3(111) surfaces studied with MIES and STMGömann, Anissa / Gömann, Karsten / Frerichs, Martin / Kempter, Volker / Borchardt, Günter / Maus-Friedrichs, Wolfgang et al. | 2005
- 200
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Mechanical stress in ALD-Al2O3 filmsKrautheim, Gunter / Hecht, Thomas / Jakschik, Stefan / Schröder, Uwe / Zahn, Wieland et al. | 2005
- 205
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Formation of niobium oxynitrides by rapid thermal processing (RTP)Matylitskaya, V.A. / Bock, W. / Thoma, K. / Kolbesen, B.O. et al. | 2005
- 211
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Effect of Ag-alloying addition on the stress–temperature behavior of electroplated copper thin filmsMenzel, S. / Strehle, S. / Wendrock, H. / Wetzig, K. et al. | 2005
- 211
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Effect of Ag-alloying addition on the stress#8211temperature behavior of electroplated copper thin filmsMenzel, S. et al. | 2006
- 215
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Material transport in Al-metallizations of power-loaded SAW structuresMenzel, S. / Pekarčikova, M. / Hofmann, M. / Gemming, T. / Wetzig, K. et al. | 2005
- 218
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XPS and AES investigations of hard magnetic Nd–Fe–B filmsOswald, S. / Fähler, S. / Baunack, S. et al. | 2005
- 218
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XPS and AES investigations of hard magnetic Nd#8211Fe#8211B filmsOswald, S. et al. | 2006
- 223
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Characterization of PECVD boron carbonitride layersThamm, T. / Körner, K.-U. / Bohne, W. / Strub, E. / Röhrich, J. / Stöckel, S. / Marx, G. et al. | 2005
- 227
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Analysis of chemical dissolution of the barrier layer of porous oxide on aluminum thin films using a re-anodizing techniqueVrublevsky, I. / Parkoun, V. / Sokol, V. / Schreckenbach, J. et al. | 2005
- 234
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XPS and ARXPS investigations of ultra thin TaN films deposited on SiO2 and SiZier, M. / Oswald, S. / Reiche, R. / Wetzig, K. et al. | 2005
- 240
-
Advances in X-ray excitation of Kossel patterns by a focusing polycapillary lensLanger, E. / Däbritz, S. / Hauffe, W. / Haschke, M. et al. | 2005
- 245
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Shells on nanowires detected by analytical TEMThomas, Jürgen / Gemming, Thomas et al. | 2005
- 252
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Multivariate data analysis for depth resolved chemical classification and quantification of sulfur in SNMSSommer, M. / Goschnick, J. et al. | 2005
- 257
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SNMS investigations of platinum-doped nanogranular tin dioxide layersSchneider, T. / Sommer, M. / Goschnick, J. et al. | 2005
- 261
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Analysis of new electrical signals in respect to quantification of radio frequency glow discharge emission spectrometryWilken, L. / Hoffmann, V. / Wetzig, K. et al. | 2005
- 266
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Characterisation of molybdenum intermediate layers in Cu–C system with SIMS methodMayerhofer, K.E. / Schrank, C. / Eisenmenger-Sittner, C. / Hutter, H. et al. | 2005
- 266
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Characterisation of molybdenum intermediate layers in Cu#8211C system with SIMS methodMayerhofer, K.E. et al. | 2006
- 271
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Range evaluation in SIMS depth profiles of Er-implantations in siliconMayerhofer, K. / Foisner, H. / Piplits, K. / Hobler, G. / Palmetshofer, L. / Hutter, H. et al. | 2005
- 278
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SIMS investigation of gettering centres produced by phosphorus MeV ion implantationKrecar, D. / Fuchs, M. / Kögler, R. / Hutter, H. et al. | 2005
- 282
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2D and 3D SIMS investigations on sintered steelsKrecar, Dragan / Zwanziger, Jürgen / Vassileva, Vassilka / Danninger, Herbert / Hutter, Herbert et al. | 2005