INTERNATIONAL JOURNAL OF MACHINE TOOLS AND MANUFACTURE
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
Table of contents
- 405
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Trends in surface roughnessThomas, T.R. et al. | 1998
- 413
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Opportunities and problems when standardising and implementing surface structure parameters in industryWestberg, J. et al. | 1998
- 417
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Problems in surface metrologyVorburger, T.V. et al. | 1998
- 419
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Roller burnishing of hard turned surfacesKlocke, F. et al. | 1998
- 425
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Optimization of gear tooth surfacesAmini, N. et al. | 1998
- 437
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The 3-D characterisation of the surface topography of the ballizing processWang, K.H. et al. | 1998
- 445
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A development of three-dimensional surface measurement on cylinderSasajima, K. et al. | 1998
- 451
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Visual comparators of propeller surface roughnessMosaad, M.A. et al. | 1998
- 457
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Analysis of surface topography changes in steel sheet strips during bending under tension friction testJonasson, M. et al. | 1998
- 469
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Surface treatment of cutting tool substratesTönshoff, H.K. et al. | 1998
- 477
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Surface analysis of injection molded TV componentsSkands, U. et al. | 1998
- 485
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3-D surface analysis of worn spherical roller thrust bearingsOlofsson, U. et al. | 1998
- 495
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Levels of topography in mechanics of precision jointsChizhik, S.A. et al. | 1998
- 503
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Quantification of galling in sheet metal forming by surface topography characterisationAndreasen, J.L. et al. | 1998
- 511
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Contact and thermal analysis of bronze and steel machined surfaces in sliding contactVáradi, K. et al. | 1998
- 519
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Nano metrology of cylinder bore wearRosén, B.-G. et al. | 1998
- 529
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Characterization of surface texture generated by multi-process manufactureSannareddy, H. et al. | 1998
- 537
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A vector modelling technique for the representation of 3-dimensional surface topographyBurrows, J.M. et al. | 1998
- 543
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A surface topography model for automated surface finishingChen, C.-C.A. et al. | 1998
- 551
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A new fractal model for anisotropic surfacesBlackmore, D. et al. | 1998
- 559
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Foundations of topological characterization of surface textureScott, P.J. et al. | 1998
- 567
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Fractal dimension measurement of engineering surfacesRuss, J.C. et al. | 1998
- 573
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Geometrical description of surface topography by means of an equivalent conformal profile modelRoques-Carmes, C. et al. | 1998
- 581
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Morphological characterisation of engineered surfaces by wavelet transformLee, S.-H. et al. | 1998
- 591
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Neural network applications in surface topographyMainsah, E. et al. | 1998
- 599
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Approximate numerical models of 3-D surface topography generated using sparse frequency domain descriptionsSherrington, I. et al. | 1998
- 607
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3D-surface parameters and their application on deterministic textured metal sheetsPfestorf, M. et al. | 1998
- 615
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Spectral and 3D motifs identification of anisotropic topographical components. Analysis and filtering of anisotropic patterns by morphological rose approachZahouani, H. et al. | 1998
- 625
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The MOTIF-method (ISO 12085) - A suitable description for functional, manufactural and metrological requirementsDietzsch, M. et al. | 1998
- 633
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Scale-sensitivity, fractal analysis and simulationsBrown, C.A. et al. | 1998
- 639
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Why filtering surface profiles?Trumpold, H. et al. | 1998
- 647
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Assessment of steel surface roughness and waviness in relation with paint appearanceScheers, J. et al. | 1998
- 657
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The importance of surface roughness for implant incorporationWennerberg, A. et al. | 1998
- 663
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Surface roughness of (110) orientation silicon based micro heat exchanger channelKang, S.-W. et al. | 1998
- 669
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Surface characterisation of electro-active thin polymeric film bearingsLiu, X. et al. | 1998
- 677
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Direct length comparison between regular crystalline lattice and SEM standard grating using dual tunneling unit STMAketagawa, M. et al. | 1998
- 685
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Evaluation of surface roughness by vision systemKiran, M.B. et al. | 1998
- 691
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Large field of view, high spatial resolution, surface measurementsWyant, J.C. et al. | 1998
- 699
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Measurement of optical surfaces generated by diamond turningBrinksmeier, E. et al. | 1998
- 707
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Nanometrology of surface topography: application to the research in development of a new mass standardLin, T. Y. / Peng, G. S. et al. | 1998
- 707
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Nanometrology of surface topography: Application to the reseach in development of a new mass standardLin, T.Y. et al. | 1998
- 715
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Roughness measurements in the picometric range using a polarization interferometer and a multichannel lockin detection techniqueGleyzes, P. et al. | 1998
- 719
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Texture classification of engineering surfaces with nanoscale roughnessGrigoriev, A.Ya et al. | 1998
- 725
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The in-process surface roughness measurement using fringe field capacitive (FFC) methodNowicki, B. et al. | 1998
- 733
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AFM and light scattering measurements of optical thin films for applications in the UV spectral regionJakobs, S. et al. | 1998
- 741
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The Abbott curve -- Well known in metrology but not on technical drawingsProstrednik, D. et al. | 1998
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IntroductionCrafoord, R.J. et al. | 1998