In Situ Study of Stresses in Ag/Cu Thin Film Multilayers During Deposition (English)
- New search for: Shull, A. L.
- New search for: Zolla, H. G.
- New search for: Spaepen, F.
- New search for: MRS
- New search for: Shull, A. L.
- New search for: Zolla, H. G.
- New search for: Spaepen, F.
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In:
Thin films: stresses and mechanical properties V
;
345-350
;
1995
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ISBN:
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ISSN:
- Conference paper / Print
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Title:In Situ Study of Stresses in Ag/Cu Thin Film Multilayers During Deposition
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Contributors:
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Conference:Symposium; Fall meeting, Thin films: stresses and mechanical properties V ; 1994 ; Boston; MA
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Published in:MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS ; 356 ; 345-350
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Publisher:
- New search for: Materials Research Society
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Publication date:1995-01-01
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Size:6 pages
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 3
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Stress and Its Effect on Intermixing in Si~1~-~xGe~x/Si SuperlatticesProkes, S. M. / MRS et al. | 1995
- 15
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Pressure-Enhanced Interdiffusion in Amorphous Si/Ge Multilayers: Implications for Defect-Mediated DiffusionTheiss, S. D. / Spaepen, F. / Aziz, M. J. / MRS et al. | 1995
- 21
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Modelling and Measurements of Stress-Controlled Interdiffusion in Multilayered Amorphous AlloysYang, F. L. / Shih, W. C. / Greer, A. L. / MRS et al. | 1995
- 27
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Mechanical Stresses During Solid State Amorphization of Zr/Co MultilayersMoske, M. / Samwer, K. / MRS et al. | 1995
- 33
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A Numerical Study of Stress Controlled Surface Diffusion During Epitaxial Film GrowthChiu, C.-H. / Gao, H. / MRS et al. | 1995
- 45
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Three Dimensional Surface Waviness of an Epitaxial Layer Due to Surface Diffusion Induced by Interface Misfit DislocationsJonsdottir, F. / MRS et al. | 1995
- 51
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Strained Layer Epitaxy: A Microscopic Description of Stress Driven Surface DiffusionLefebvre, I. / Priester, C. / Allan, G. / Lannoo, M. / MRS et al. | 1995
- 57
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Relationship Between Stress and Surface Roughness in Krypton Implanted MgOGea, L. / Loubet, J.-L. / Brenier, R. / Thevenard, P. / MRS et al. | 1995
- 63
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Instability Analysis of Strained Interfaces Via a Discrete Atom MethodLee, J. K. / MRS et al. | 1995
- 69
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Stress Evolution Kinetics in Ultra Thin Sputtered Au FilmsSu, Q. / Bailly, C. / Wuttig, M. / Corcoran, S. / MRS et al. | 1995
- 75
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A TEM Investigation of the Effects of Tensile Stress on Thin Film Microstructure and Surface MorphologyHarris, K. E. / King, A. H. / MRS et al. | 1995
- 81
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Effect of Stresses in Thin Films on Defect NucleationNandedkar, A. S. / MRS et al. | 1995
- 87
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Nonhydrostatic Stress Effects on Solid Phase Epitaxial Growth in SiliconCarter, W. B. / Aziz, M. J. / MRS et al. | 1995
- 93
-
Dislocation Emission at SurfacesBeltz, G. E. / Freund, L. B. / MRS et al. | 1995
- 99
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Manipulation of Stresses in Metallic Thin Films by AlloyingNandedkar, A. S. / MRS et al. | 1995
- 105
-
Relationship Between Crystal Structure, Internal Stress and Properties in the Naturally Occurring Supportless Thin Films of Chrysotile AsbestosDenes, G. / Le Van Mao, R. / Vaillancourt, A. / MRS et al. | 1995
- 111
-
Computer Simulation of Creation and Motion of Edge Dislocations in Face Centered CrystalsTajima, N. / Nozaki, T. / Hirade, T. / Kogure, Y. / MRS et al. | 1995
- 119
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Aspects of the Mechanical Properties of ElectrodepositsWeil, R. / MRS et al. | 1995
- 131
-
Intrinsic Stress in Sputtered Thin FilmsNguyen, T. D. / Nguyen, T. / Underwood, J. H. / MRS et al. | 1995
- 137
-
Dependence of Stress on Background Pressure in Sputtered Mo/Si Multilayer FilmsWindt, D. L. / Brown, W. L. / Volkert, C. A. / Waskiewicz, W. K. / MRS et al. | 1995
- 143
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The Growth of Amorphous Cu~xTi~1~-~x Films: Relationship Between Intrinsic Stresses and Microstructure Observed by STMVon Huelsen, U. / Geyer, U. / Dina, S. / Von Minnigerode, G. / MRS et al. | 1995
- 149
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W/Si Schottky Diodes: Effect of Metal Deposition Conditions on the Barrier HeightMamor, M. / Finkman, E. / Meyer, F. / Bouziane, K. / MRS et al. | 1995
- 155
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Properties of Ti~1~-~xAl~xN Deposited Using Dual Rotatable Magnetrons for Automotive Glass Privacy CoatingsMorley, T. S. / Vyletel, B. N. / Crawley, R. L. / Nietering, K. E. / MRS et al. | 1995
- 161
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Amorphous SiC-N Coatings: Its Properties and ApplicationsYee, A. L. / Ong, H. / Xiong, F. / Chang, R. P. H. / MRS et al. | 1995
- 167
-
Stress Evolution During the Formation and Transformation of Titanium SilicideSvilan, V. / Harper, J. M. E. / Cabral, C. / Clevenger, L. A. / MRS et al. | 1995
- 173
-
Underlayer Effects on the Growth Stress of Titanium FilmsPoppeller, M. / Abermann, R. / MRS et al. | 1995
- 181
-
Growth, Structure and Stress of DC Magnetron Sputtered TiB~2 Thin FilmsDeng, H. / Chen, J. / Inturi, R. B. / Barnard, J. A. / MRS et al. | 1995
- 187
-
Stress and Density of Thin TiO~2 Films Produced by Different MethodsOttermann, C. R. / Heming, M. / Bange, K. / MRS et al. | 1995
- 195
-
Tunability of Intrinsic Stress in SiO~x Dielectric Films Formed by Molecular Beam DepositionChand, N. / Kola, R. R. / Osenbach, J. W. / Tsang, W. T. / MRS et al. | 1995
- 201
-
Mechanical Properties of Alumina Films Sputtered Over StepsRoss, C. A. / Barrese, J. J. / MRS et al. | 1995
- 209
-
Growth of Hydrogenated Amorphous Silicon (a-Si:H) on Patterned Substrates for Increased Mechanical StabilityHong, W.-S. / Delgado, J. C. / Ruiz, O. / Perez-Mendez, V. / MRS et al. | 1995
- 215
-
Elastic Properties of Silicate Glass and Spin-On Glass Thin FilmsDoucet, L. / Carlotti, G. / MRS et al. | 1995
- 221
-
Temperature Dependence of the Intrinsic Stress and Biaxial Modulus of Plasma Deposited Silicon Nitride and Silicon Oxynitride FilmsHarding, D. R. / Ogbuji, L. T. / MRS et al. | 1995
- 227
-
DC-Magnetron Sputtered Silicon CarbideTenhover, M. / Ruppel, I. B. / MRS et al. | 1995
- 233
-
Structure and Mechanical Properties of Nitrogen Incorporated Diamond-Like Carbon FilmsLee, K.-R. / Kwang Yong Eun / Rhee, J.-S. / MRS et al. | 1995
- 239
-
Potential Limitations of Conventional Photomasks Due to Inherent Internal Stress-The Need for an Alternative Opaque LayerCairns, J. A. / Liu, C.-W. / Hourd, A. C. / Keatch, R. P. / MRS et al. | 1995
- 247
-
Metallic Thin Films on Ceramic Substrates: Stress-Enhanced Intermixing and Spinel FormationPirouz, P. / Ikuhara, Y. / Flynn, C. P. / MRS et al. | 1995
- 259
-
Stacking Fault Tetrahedra Formation During Growth of Si~1~-~xGe~x Strained Layers on (111) Oriented Si Substrates: TEM Observations and Defect ModelingHoward, D. J. / Bower, A. F. / Paine, D. C. / MRS et al. | 1995
- 265
-
Misfit Strain Relief Beyond the Critical Thickness Using Curvature Measurements and In Situ Characterization of the Magneto-Optic Kerr EffectInglefield, H. E. / Bochi, G. / Ballentine, C. A. / O'Handley, R. C. / MRS et al. | 1995
- 271
-
Nanoindentation of Epitaxial Films: A Study of Pop-In EventsMann, A. B. / Pethica, J. B. / Nix, W. D. / Tomiya, S. / MRS et al. | 1995
- 277
-
Composition Dependence of Hardness and Moduli in GeSi/Si-Heterostructures Measured by NanoindentationRoos, B. S. / Richter, H. / Morgenstern, T. / Tillack, B. / MRS et al. | 1995
- 283
-
Role of Dislocation Interactions in Decreasing Mobile Threading Dislocation Density and Limiting Strain Relaxation in Si~1~-~xGe~x Heteroepitaxial FilmsGillard, V. T. / Nix, W. D. / MRS et al. | 1995
- 289
-
Emission of a Half-Rectangular Dislocation Loop from the Surface of a Compositionally Graded EpilayerZhang, T.-Y. / MRS et al. | 1995
- 295
-
Lattice Properties of Ge and GaAs Strained-Layers on SiEryigit, R. / Sui, Z. / Herman, I. P. / MRS et al. | 1995
- 301
-
Dislocation Distributions in Cd~1~-~xHg~xTe/CdTe and Cd~1~-~xHg~xTe/Cd~1~-~yZn~y Te Grown by Liquid Phase EpitaxyWatson, C. C. R. / Durose, K. / O'Keefe, E. / Hudson, J. M. / MRS et al. | 1995
- 307
-
Plasma Potential Measurements and Strain Effects in Epitaxial GaN Grown on AlN Buffered Si(111) by Radio Frequency Reactive SputteringMeng, W. J. / Perry, T. A. / MRS et al. | 1995
- 313
-
X-Ray Measurements of Deformations in Films and Substrates in Heteroepitaxial System GaAs/GeBurle, N. / Pichaud, B. / Thomas, O. / MRS et al. | 1995
- 319
-
A Study on the Strain and Microstructure in SiGe Film Grown on Si(001) Substrate by MBECho, K.-I. / Nahm, S. / Kim, S.-G. / Lee, S.-C. / MRS et al. | 1995
- 325
-
Elastic Constant Effect on the Critical Thickness of an EpilayerZhang, T.-Y. / MRS et al. | 1995
- 331
-
Microstructure and Strain in GaAs/AlGaAs MQW Thin Films Bonded to Different Substrates by Eutectic AlloyingLin, C. H. / Kuo, H. C. / Lu, Y. / Shen, H. / MRS et al. | 1995
- 337
-
Two Step Growth and Characterization of BaF~2/Si(III) HeterostructuresBelenchuk, A. / Fedorov, A. / Lucash, V. / Vasilyev, A. / MRS et al. | 1995
- 345
-
In Situ Study of Stresses in Ag/Cu Thin Film Multilayers During DepositionShull, A. L. / Zolla, H. G. / Spaepen, F. / MRS et al. | 1995
- 351
-
Measurement of the Effect of Temperature on Stress Distribution and Deformation in Multilayer Optical Thin Film StructuresMadras, C. G. / Wong, P. Y. / Miaoulis, I. N. / Goldman, L. M. / MRS et al. | 1995
- 357
-
Determining Interfacial Free Energies from Creep Experiments on Silver-Iron MultilayersJosell, D. / Wang, Z. L. / MRS et al. | 1995
- 363
-
Mechanical Properties of Ag/Cr Multilayered Epitaxial Thin FilmsEnglish, G. R. / Simenson, G. F. / Clemens, B. M. / Nix, W. D. / MRS et al. | 1995
- 369
-
Dependence of Hardness on Modulation Amplitude in Compositionally Modulated Cu-Ni Thin FilmsOberle, R. R. / Cammarata, R. C. / MRS et al. | 1995
- 373
-
Effect of Structure, Stress, Strain, and Alloying on the Hardness of Fe(001)/Pt(001) Epitaxial MultilayersDaniels, B. J. / Nix, W. D. / Clemens, B. M. / MRS et al. | 1995
- 379
-
Strain and Interdiffusion Profiles in Epitaxied Au/Ni(100) Multilayers Deduced From X-Ray Diffraction ExperimentsGilles, B. / Marty, A. / MRS et al. | 1995
- 385
-
Brillouin Light Scattering Investigation of the Elastic Properties of Ta/Al Metallic SuperlatticesCarlotti, G. / Fioretto, D. / Socino, G. / Xia, H. / MRS et al. | 1995
- 391
-
Mechanical Properties and Microstructure of Cu/Cu-Ni and Cu/Ag Multilayer Thin FilmsKrzanowski, J. E. / Duggan, P. / MRS et al. | 1995
- 397
-
Mechanical Properties of Sputter-Deposited Nb~5Si~3 Film and Nb~5Si~3/Nb MicrolaminatesRawal, S. P. / Swanson, G. M. / Moshier, W. C. / Misra, M. S. / MRS et al. | 1995
- 403
-
Stress in Giant Magnetoresistive Ni~6~6Fe~1~6Co~1~8/Ag Multilayer Thin FilmsJarratt, J. D. / Barnard, J. A. / MRS et al. | 1995
- 409
-
Calculation of the (GaAs)~m(AlAs)~n Superlattice Piezoelectric ConstantsMirovitskii, V. Y. / MRS et al. | 1995
- 417
-
In-Situ Electromigration Stressing in Transmission Electron Microscopy for Al-Cu InterconnectsShih, W. C. / Greer, A. L. / MRS et al. | 1995
- 423
-
Thermal Stresses in Passivated AlSiCu-Lines from Wafer Curvature MeasurementBurges, U. / Helneder, H. / Schneegans, M. / Beckers, D. / MRS et al. | 1995
- 429
-
Measurement of the Dependence of Stress and Strain on Crystallographic Orientation in Cu and Al Thin FilmsZielinski, E. M. / Vinci, R. P. / Bravman, J. C. / MRS et al. | 1995
- 435
-
Mechanical Properties and Microstructure of Al(1wt%Si) and Al(1wt%Si, 0.5wt%Cu) Thin Films. The Role of Diffusional Creep in the Tensile Stress RegimeBader, S. / Kalaugher, E. M. / Arzt, E. / MRS et al. | 1995
- 441
-
Stress Relaxation in Al-Si-Cu Thin Films and LinesWitvrouw, A. / Proost, J. / Deweerdt, B. / Roussel, P. / MRS et al. | 1995
- 447
-
Correlation of the Stress-Temperature History with Microstructure in Al-0.5Cu and Al-0.15Pd Thin FilmsKnorr, D. D. / Rodbell, K. P. / MRS et al. | 1995
- 453
-
Influence of a Capping Layer on the Mechanical Properties of Copper FilmsKeller, R.-M. / Bader, S. / Vinci, R. P. / Arzt, E. / MRS et al. | 1995
- 459
-
Effect of Copper Film Thickness on Stress and Strain in Grains of Different OrientationVinci, R. P. / Zielinski, E. M. / Bravman, J. C. / MRS et al. | 1995
- 465
-
The Effect of Intrinsic Passivation Stress on Stress in Encapsulated Interconnect LinesSauter Mack, A. / Flinn, P. / MRS et al. | 1995
- 471
-
Effect of Cu and Si in Aluminum on Stress Change and on TiAl~3 Formation in Al Alloy/Ti Bilayer Films During AnnealingBrown, D. D. / Besser, P. R. / Sanchez, J. E. / Korhonen, M. A. / MRS et al. | 1995
- 477
-
Stress that Counteracts Electromigration: Threshold Versus Kinetic ApproachGlickman, E. / Osipov, N. / Ivanov, A. / MRS et al. | 1995
- 483
-
Electroplasticity and ElectromigrationBaker, S. P. / Knauss, M. P. / Moeckl, U. E. / Arzt, E. / MRS et al. | 1995
- 489
-
AFM/SEM Study of Thermally Induced Hillock CoalescenceChaiken, J. / Goodisman, J. / Villarica, R. M. / Beasock, J. V. / MRS et al. | 1995
- 495
-
Stress Behavior of CVD-PSG Films Depending on Deposition Methods and Hillock SuppressionKim, E. / Kang, S.-H. / Lim, S.-K. / MRS et al. | 1995
- 501
-
Morphology of Damage in Al Films Tested Under Electromigration Conditions Using the Drift Velocity MethodKononenko, O. V. / Matveev, V. N. / MRS et al. | 1995
- 507
-
Effect of Mechanical Stress on Electromigration Failure Mode During Accelerated Electromigration TestsPramanick, S. / Brown, D. D. / Pham, V. / Besser, P. / MRS et al. | 1995
- 515
-
A Method for Analyzing the Critical Adhesion Energy of Thin Film CoatingsMcGarry, F. J. / Shaffer, E. O. / MRS et al. | 1995
- 529
-
Elastic Properties and Stresses in Polyimide Thin Films and CoatingsSheth, K. C. / Chen, M. J. / Farris, R. J. / MRS et al. | 1995
- 535
-
Effect of Annealing on High Frequency Viscoelastic Waves in Spincoated Polymer Thin FilmsDutcher, J. R. / Wang, Z. / Neal, B. J. / Copeland, T. / MRS et al. | 1995
- 541
-
Development of a Technique for the In-Situ Measurement of the Mechanical Properties of Ultra-Thin Interfacially Polymerized FilmsGreenberg, A. R. / Khare, V. P. / Krantz, W. B. / MRS et al. | 1995
- 547
-
Stress Effects in Drying Polymer FilmsTam, S. Y. / Scriven, L. E. / Stolarski, H. K. / MRS et al. | 1995
- 555
-
In-Process Evaluation of Kinetic Energy of Sputter Depositing Atoms Using Multijunction Thermal ConvertersSu, Q. / Huang, D. X. / Wuttig, M. / MRS et al. | 1995
- 561
-
Measurements of Elastic Modulus Using Laser-Induced Surface WavesChang, D. J. / Amimoto, S. T. / Gross, R. W. / Glenn, T. S. / MRS et al. | 1995
- 567
-
Elastic Properties of Thin FilmsWhite, B. E. / Pohl, R. O. / MRS et al. | 1995
- 573
-
In Situ Measurement of Young's Modulus and Residual Stress of Thin Electroless Nickel Films for MEMS ApplicationsRoy, S. / Furukawa, S. / Miyajima, H. / Mehregany, M. / MRS et al. | 1995
- 579
-
Measuring the Mechanical Properties of Thin Metal Films by Means of Bulge Testing of Micromachined WindowsPaviot, V. M. / Vlassak, J. J. / Nix, W. D. / MRS et al. | 1995
- 585
-
Blister Test Analysis MethodsHohlfelder, R. J. / Vlassak, J. J. / Nix, W. D. / Luo, H. / MRS et al. | 1995
- 591
-
In-Situ Fluorescence Strain Sensing of the Stress in InterconnectsWen, Q. / Ma, Q. / Clarke, D. R. / MRS et al. | 1995
- 597
-
Measurement of Residual Stress in TiO~2 Sol-Gel Thin Films Using Raman SpectroscopyHess, N. J. / Exarhos, G. J. / MRS et al. | 1995
- 603
-
Principal Residual Strains as a Function of Depth for Sputter Deposited Mo Thin FilmsMalhotra, S. G. / Rek, Z. U. / Parfitt, L. J. / Yalisove, S. M. / MRS et al. | 1995
- 609
-
Temperature Dependence of Residual Stresses and Stress Relaxation in Blanket Films of Various ThicknessesClarke, A. P. / Langelaan, G. / Saimoto, S. / MRS et al. | 1995
- 615
-
Maskless Single-Sided Wet Etching Process for the Fabrication of Ultra-Low Distortion Polyimide MembranesSchattenburg, M. L. / Fuentes, R. I. / Czernienko, G. / Fleming, R. C. / MRS et al. | 1995
- 621
-
Photoacoustic Method for Obtaining Strength Characteristics of Thin FilmsKonovalov, I. A. / Sklyarenko, S. K. / MRS et al. | 1995
- 629
-
Yield Point Phenomena and Dislocation Velocities Underneath Indentations into BCC CrystalsGerberich, W. W. / Venkataraman, S. / Nelson, J. / Huang, H. / MRS et al. | 1995
- 645
-
Time Dependent Indentation Testing at Non-Ambient Temperatures Utilizing the High Temperature Mechanical Properties MicroprobeLucas, B. N. / Oliver, W. C. / MRS et al. | 1995
- 651
-
Indentation Creep of Molybdenum: Comparison Between Thin Film and Bulk MaterialYoder, K. B. / Stone, D. S. / Lin, J. C. / Hoffmann, R. A. / MRS et al. | 1995
- 657
-
Indentation at the Nanometer Scale on Ultra Thin Films of Diamond-Like CarbonBec, S. / Tonck, A. / Loubet, J.-L. / MRS et al. | 1995
- 663
-
Cracking During Nanoindentation and Its Use in the Measurement of Fracture ToughnessHarding, D. S. / Oliver, W. C. / Pharr, G. M. / MRS et al. | 1995
- 669
-
Indentation Behavior of a Brittle Film/Brittle Substrate CompositeCzarnik, C. M. / Gibala, R. / Baron, O. / Nastasi, M. / MRS et al. | 1995
- 675
-
An Explanation for the Shape of Nanoindentation Unloading Curves Based on Finite Element SimulationBolshakov, A. / Oliver, W. C. / Pharr, G. M. / MRS et al. | 1995
- 681
-
Nanomechanical Response of Materials and Thin Film Systems: Finite Element SimulationSyed Asif, S. A. / Derby, B. / Roberts, S. G. / MRS et al. | 1995
- 687
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Elastic, Transversely Isotropic Film Indented by a Punch; Application to Multilayered Thin FilmsStone, D. S. / MRS et al. | 1995
- 693
-
Thin Film Fine Line Work of Adhesion by Microwedge IndentationDe Boer, M. P. / Moody, N. R. / Huang, H. / Gerberich, W. W. / MRS et al. | 1995
- 699
-
The Indentation Elastic Response-Indentation Shape and the Stress DistributionHendrix, B. C. / Xu, K.-W. / Liu, J.-H. / He, J.-W. / MRS et al. | 1995
- 705
-
Nanohardness Measurements on Thin FilmsUpadhyaya, K. R. / Saimoto, S. / Timsit, R. S. / MRS et al. | 1995
- 711
-
Studies of Ultra Micro Indented Multilayered Sol-Gel Zirconia FilmsJaemting, A. / Ben-Nissan, B. / Ashcroft, I. / Swain, M. V. / MRS et al. | 1995
- 717
-
Error Analysis in NanoindentationShafirstein, G. / Gee, M. G. / Osgerby, S. / Saunders, S. R. J. / MRS et al. | 1995
- 723
-
Elastic Modulus and Hardness as Derived from Nanoindentation of Ni and Mo Films Prepared by Ion Beam Assisted DepositionWroblewski, A. / Chechenin, N. / Boettiger, J. / Chevallier, J. / MRS et al. | 1995
- 729
-
Mechanical Properties of Platinum Films on Silicon and Glass Determined by Ultra-MicroindentationMencik, J. / Swain, M. V. / MRS et al. | 1995
- 737
-
Nano-Hardness, Nano-Friction and Nano-Wear of Ultra-Thin OvercoatsBogy, D. B. / Jiang, Z. / MRS et al. | 1995
- 749
-
Ultra-Thin Carbon Coatings for Head-Disk Interface TribologyGlosli, J. N. / Belak, J. / Philpott, M. R. / MRS et al. | 1995
- 755
-
Studies on Wear Mechanism of Ultrathin Protective Carbon Overcoat by Micro-Wear Scan TechniqueWu, T. W. / MRS et al. | 1995
- 761
-
Wear and Adhesion of Thin Carbon CoatingsWang, H.-F. / Nelson, J. C. / Lin, C.-L. / Hoehn, J. W. / MRS et al. | 1995
- 767
-
Nanoindentation and Nanoscratching of Hard Coating Materials for Magnetic DisksTsui, T. Y. / Pharr, G. M. / Oliver, W. C. / Chung, Y. W. / MRS et al. | 1995
- 773
-
Mechanical Properties and Wear Resistance of High Moment Thin Film Head MaterialsDeng, H. / Inturi, V. R. / Barnard, J. A. / MRS et al. | 1995
- 779
-
Measurement of Friction Coefficients Between Diamond-Like Carbon Coated VCR Head Drum and VCR TapesLee, K.-R. / Kwang Yong Eun / MRS et al. | 1995
- 785
-
Micro-Tribological Study of Cobalt Alloys with and Without a Carbon CoatingWang, H.-F. / Nelson, J. C. / Gerberich, W. W. / MRS et al. | 1995
- 791
-
Ion Beam Mixing of Titanium Overlayers with Hydroxyapatite SubstratesLevine, T. E. / Nastasi, M. / Alford, T. L. / Suchicital, C. / MRS et al. | 1995
- 797
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Tribology and Surface Mechanical Properties of Excimer Laser Nitrided TitaniumJervis, T. R. / Hirvonen, J. P. / Zocco, T. G. / Tesmer, J. R. / MRS et al. | 1995
- 803
-
Hardness and Tribological Effects of Ion Implantation on Electroplated ChromiumNoll, K. E. / Steinbruechel, C. / MRS et al. | 1995
- 809
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Effects of Interlayers of the Scratch Adhesion Performance of Ultra-Thin Films of Copper and Gold on Silicon SubstratesMcAdams, S. D. / Tsui, T. Y. / Oliver, W. C. / Pharr, G. M. / MRS et al. | 1995
- 815
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Evaluation of the Mechanical Properties of Tribochemical Films of AluminaGee, M. G. / Jennett, N. M. / MRS et al. | 1995
- 821
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Thin Film Adhesion Characterization by Microwedge Scratching of Precracked Fine LinesDe Boer, M. P. / Huang, H. / Gerberich, W. W. / MRS et al. | 1995
- 827
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Hydrogen Effects on the Fracture of Thin Tantalum Nitride FilmsMoody, N. R. / Venkataraman, S. K. / Bastasz, B. / Angelo, J. E. / MRS et al. | 1995
- 833
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Dielectric Fracture Leading to Metallic Connections by Laser HeatingBernstein, J. B. / MRS et al. | 1995
- 839
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Influence of Aging Processes on Adhesion Properties of Metallic and Oxidic Thin FilmsOttermann, C. R. / Tomita, Y. / Ishiyama, M. / Bange, K. / MRS et al. | 1995
- 847
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Modeling of Thermal Stresses in Composite Diamond Coatings and Mechanisms of Improvement of AdhesionFan, W. D. / Jagannadham, K. / Narayan, J. / MRS et al. | 1995
- 853
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Fracture Behavior in Amorphous and Ceramic Coatings on Aluminum Alloy SubstrateKameda, J. / Ranjan, R. / MRS et al. | 1995
- 859
-
Stress and Adhesion of CVD Copper and TiNNguyen, T. / Evans, D. R. / MRS et al. | 1995
- 863
-
Scanning Scratch Tests for Evaluating the Adhesion of Thin Oxide Films on Stainless SteelHaanappel, V. A. C. / Van Corbach, H. D. / Fransen, T. / Gellings, P. J. / MRS et al. | 1995
- 869
-
Die Attach Adhesion and Void Formation at the GaAs Substrate InterfaceStrifas, N. / Christou, A. / MRS et al. | 1995
- 875
-
Practical and Fundamental Studies of Nanocrystalline Composite Thin FilmsCheng, Y.-T. / Qiu, B. / Tung, S. / Blanchard, J. P. / MRS et al. | 1995
- 881
-
On Separating Bonding Strength from Film and Substrate PropertiesHe, J.-W. / Hendrix, B. C. / Yi, M.-Z. / Hu, N.-S. / MRS et al. | 1995
- 887
-
Evaluation of Diamond-Like Carbon as a Protective Coating for Holographic FiltersYip, P. W. / Dehmer, P. G. / MRS et al. | 1995