Measurement technology of ultrafast optoelectronics [3558-24] (English)
- New search for: Wang, J.
- New search for: Wang, Y.
- New search for: Chen, S.
- New search for: SPIE
- New search for: Chinese Optical Society
- New search for: China Optics & Optoelectronic Manufacturers Association
- New search for: Wang, J.
- New search for: Wang, Y.
- New search for: Chen, S.
- New search for: Ye, S.
- New search for: SPIE
- New search for: Chinese Optical Society
- New search for: China Optics & Optoelectronic Manufacturers Association
In:
Automated optical inspection for industry: theory, technology, and applications II
3558
;
138-141
;
1998
-
ISBN:
-
ISSN:
- Conference paper / Print
-
Title:Measurement technology of ultrafast optoelectronics [3558-24]
-
Contributors:Wang, J. ( author ) / Wang, Y. ( author ) / Chen, S. ( author ) / Ye, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association
-
Conference:Conference, Automated optical inspection for industry: theory, technology, and applications II ; 1998 ; Beijing
-
Published in:PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING , 3558 ; 138-141
-
Publisher:
- New search for: SPIE
-
Publication date:1998-01-01
-
Size:4 pages
-
ISBN:
-
ISSN:
-
Type of media:Conference paper
-
Type of material:Print
-
Language:English
-
Keywords:
-
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
-
New 3D profilometry based on modulation measurement [3558-01]Su, X. / Su, L. / Li, W. / Xiang, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 1
-
New 3D profilometry based on modulation measurementSu, Xianyu / Su, Likun / Li, Wansong / Xiang, Liqun et al. | 1998
- 8
-
Experimental study of determining the optical properties of glass online [3558-02]Liu, Y. / Bi, W. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 8
-
Experimental study of determining the optical properties of glass onlineLiu, Yufeng / Bi, Weihong et al. | 1998
- 12
-
Design of image scanning and sampling system for 3D laser radar [3558-03]Hong, Z. / Wang, W. / Gao, Z. / Li, P. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 12
-
Design of image scanning and sampling system for 3D laser radarHong, Zhi / Wang, Wei / Gao, Zhinhua / Li, Peiyong / Lu, Zukang et al. | 1998
- 18
-
Automonitoring the status of a mobile microsphereYin, Hao / Shi, Baixuan / Li, Caifeng / Huang, Xiao / Wang, JinSong et al. | 1998
- 18
-
Automonitoring the status of a mobile microsphere [3558-04]Yin, H. / Shi, B. / Li, C. / Huang, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 23
-
Technology of online spectral response measurementZong, Zhiyuan / Chang, Benkang et al. | 1998
- 23
-
Technology of online spectral response measurement [3558-05]Zong, Z. / Chang, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 28
-
Online turbidity measurement using light surface scatteringHong, Zhi / Bao, Chengfang / Qiu, Wenfa / Lu, Zukang et al. | 1998
- 28
-
Online turbidity measurement using light surface scattering [3558-06]Hong, Z. / Bao, C. / Qiu, W. / Lu, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 31
-
Visible automeasurement of positional accuracy to complex objects [3558-07]Shen, B. / Tian, C. / Tang, M. / Yang, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 31
-
Visible automeasurement of positional accuracy to complex objectsShen, Bangxin / Tian, Changhui / Tang, Min / Yang, Yincai / Cheng, Jiabo / Shen, Lu et al. | 1998
- 39
-
Topography measurement by changing distanceYu, Yingjie / Li, Pengsheng / Qiang, Xifu et al. | 1998
- 39
-
Topography measurement by changing distance [3558-08]Yu, Y. / Li, P. / Qiang, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 45
-
Photoelectric detection of the position of electric transmission contact net in electrification railway [3558-09]Cao, G. / Zhang, L. / Jiang, T. / Song, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 45
-
Photoelectric detection of the position of electric transmission contact net in electrification railwayCao, Guohua / Zhang, Lizhong / Jiang, Tao / Song, Xueping et al. | 1998
- 49
-
Scannerless laser three-dimensional imaging method [3558-10]Yan, H. / Lu, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 49
-
Scannerless laser three-dimensional imaging methodYan, Huimin / Lu, Zukang et al. | 1998
- 53
-
Measuring rotation angles in high speed with laser interference [3558-11]Fan, Z. / Xu, S. / Long, F. / Fu, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 53
-
Measuring rotation angles in high speed with laser interferenceFan, Zhigang / Xu, Shiwen / Long, Funian / Fu, Ling / Li, Chunxia et al. | 1998
- 58
-
Precision navigation sensor using position-sensitive detector for automatic navigation vehicleZhang, Wenwei / Chang, Shengjiang / Shen, Jinyuan / Zhang, YanXin et al. | 1998
- 58
-
Precision navigation sensor using position-sensitive detector for automatic navigation vehicle [3558-12]Zhang, W. / Chang, S. / Shen, J. / Zhang, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 67
-
Method of dynamic geometric parameter measurement by laser tracking system [3558-13]Liu, Y. / Wang, J. / Liang, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 67
-
Method of dynamic geometric parameter measurement by laser tracking systemLiu, Yongdong / Wang, Jia / Liang, Jinwen et al. | 1998
- 74
-
Computer-vision-based auto-alignment drilling machine for PCBShan, Yuekang / Xu, Chang / Jiang, Qing et al. | 1998
- 74
-
Computer-vision-based auto-alignment drilling machine for PCB [3558-14]Shan, Y. / Xu, C. / Jiang, Q. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 81
-
Automated optical inspection for high-speed electron in synchrotron acceleratorGuo, Congliang / Liu, Tonghui / Wang, Rongsheng et al. | 1998
- 81
-
Automated optical inspection for high-speed electron in synchrotron accelerator [3558-15]Guo, C. / Liu, T. / Wang, R. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 87
-
Automation of temperature measurement by laser [3558-16]Fei, Y. / Xi, Y. / Chen, Y. / Ma, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 87
-
Automation of temperature measurement by laserFei, Yue / Xi, Yangang / Chen, Yuanjie / Ma, Xiufang / Shen, Yuanhua et al. | 1998
- 93
-
Application of TDICCD on real-time Earth reconnaissance satelliteHuang, Qiaolin / Li, Xiangmin et al. | 1998
- 93
-
Application of TDICCD on real-time Earth reconnaissance satellite [3558-17]Huang, Q. / Li, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 105
-
Method of one-dimensional optoelectronic high-speed detection on two-dimensional temperature field [3558-18]Wang, Q. / Chang, J. / Jiang, J. / Liu, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 105
-
Method of one-dimensional optoelectronic high-speed detection on two-dimensional temperature fieldWang, Qi L. / Chang, Jianxin / Jiang, Jianliang / Liu, Xiaohua et al. | 1998
- 110
-
Visual measurement on BGA chip leaders [3558-19]Ye, S. / Qiu, Y. / Sun, C. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 110
-
Visual measurement on BGA chip leadersYe, Shenghua / Qiu, Yu / Sun, Changku et al. | 1998
- 114
-
New method for real-time monitoring of laser power and mode online [3558-20]Wang, Y. / An, C. / Gao, S. / Lu, D. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 114
-
New method for real-time monitoring of laser power and mode onlineWang, You-qing / An, Chengwu / Gao, Shuzhong / Lu, Dongsheng et al. | 1998
- 118
-
Experimental study of vibration measurement based on laser frequency splitting principleZhang, Yi / Deng, Zhibeng / Han, Yanmei / Li, Yan / Zhang, Shulian et al. | 1998
- 118
-
Experimental study of vibration measurement based on laser frequency splitting principle [3558-21]Zhang, Y. / Deng, Z. / Han, Y. / Li, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 125
-
Practical coordinate mapping method for phase-measuring profilometryLi, Wansong / Su, Xianyu / Su, Likun / Xiang, Liqun et al. | 1998
- 125
-
Practical coordinate mapping method for phase-measuring profilometry [3558-22]Li, W. / Su, X. / Su, L. / Xiang, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 131
-
Online inspection system for steel-plate thicknessZhang, Guoyu / Song, Jiawu / An, Zhiyong / Li, Chengzhi / Gao, Yujin / Chen, Rowei et al. | 1998
- 131
-
Online inspection system for steel-plate thickness [3558-23]Zhang, G. / Song, J. / An, Z. / Li, C. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 138
-
Measurement technology of ultrafast optoelectronicsWang, Jilong / Wang, Yuncai / Chen, Shijie et al. | 1998
- 138
-
Measurement technology of ultrafast optoelectronics [3558-24]Wang, J. / Wang, Y. / Chen, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 142
-
New inline field tester on visual distance of night vision instrument with faint lightChen, Zhibin / Zhang, Yong et al. | 1998
- 142
-
New inline field tester on visual distance of night-vision instrument with faint light [3558-25]Chen, Z. / Zhang, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 146
-
New scheme of high-precision visual collimatorGe, Zhaoxiang / Ying, Han / Chen, Lei et al. | 1998
- 146
-
New scheme of high-precision visual collimator [3558-26]Ge, Z. / Han, Y. / Chen, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 150
-
Television automatic video-line tester [3558-27]Ge, Z. / Tang, D. / Feng, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 150
-
Television automatic video-line testerGe, Zhaoxiang / Tang, Dongsheng / Feng, Binghua et al. | 1998
- 155
-
Active trigonometry and its application to thickness measurement on reflective surfaceMiao, Hong / Wu, Xiaoping et al. | 1998
- 155
-
Active trigonometry and its application to thickness measurement on reflective surface [3558-28]Miao, H. / Wu, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 161
-
Interference measurements for roughness of silicon mirror with Twyman interferometerZhang, Yaoning / Zhang, Xiaoli / Cheng, ZuHai et al. | 1998
- 161
-
Interference measurements for roughness of silicon mirror with Twyman interferometer [3558-29]Zhang, Y. / Zhang, X. / Cheng, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 165
-
Displacement quantity test and measurement system with the laser light triangle methodLi, Guiying / Chen, Dianren / Du, Zhenlin / Song, Zhengxun et al. | 1998
- 165
-
Displacement quantity test and measurement system with the laser light triangle method [3558-30]Li, G. / Chen, D. / Du, Z. / Song, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 168
-
Probe imaging vision coordinate measuring system using single cameraZhang, Zhi-jiang / Huang, Qingcheng / Lin, Weiguo / Che, Rensheng et al. | 1998
- 168
-
Probe imaging vision coordinate measuring system using single camera [3558-31]Zhang, Z. / Huang, Q. / Lin, W. / Che, R. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 175
-
CCD-based microscopic measurement system for precision part geometry error [3558-32]Wang, G. L. / Chen, D. W. / Tao, C. D. / Wang, W. P. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 175
-
CCD-based microscopic measurement system for precision part geometry errorWang, GuangLin / Chen, Dawei / Tao, Chongde / Wang, Weiping / Jiang, Jianfeng et al. | 1998
- 186
-
Development of an optoelectronic instrument for detecting roundness of internal surface of artillery barrel [3558-33]Che, Y. / Shen, Y. / Liu, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 186
-
Development of an optoelectronic instrument for detecting roundness of internal surface of artillery barrelChe, Ying / Shen, Yuzhi / Liu, Jiong et al. | 1998
- 191
-
Parallel confocal detection method for three-dimensional surface topography with a micro-optic componentTian, Weijian / Bao, Zhengkang / Ding, Zhihua / Sui, Chenghua / Xu, Zhijun et al. | 1998
- 191
-
Parallel confocal detection method for three-dimensional surface topography with a micro-optic component [3558-34]Tian, W. / Bao, Z. / Ding, Z. / Sui, C. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 197
-
High-accuracy optical prismatic scanner and its application to the measurement of large-axle angularityZhang, Xianhe / Fang, Youbin / Ye, Jiaxiong et al. | 1998
- 197
-
High-accuracy optical prismatic scanner and its application to the measurement of large-axle angularity [3558-35]Zhang, X. / Fang, Y. / Ye, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 201
-
Laser diffraction measurementRan, Duogang et al. | 1998
- 201
-
Laser diffraction measurement [3558-36]Ran, D. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 209
-
Optical method of measuring the thickness of optical films in devices [3558-37]Qian, Y. / Fu, R. / Xu, D. / Chang, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 209
-
Optical method of measuring the thickness of optical films in devicesQian, Yunsheng / Fu, Rongguo / Xu, Denggao / Chang, Benkang et al. | 1998
- 214
-
Large-scale form and position error measurementHao, Qun / Li, Dacheng et al. | 1998
- 214
-
Large-scale form and position error measurement [3558-38]Hao, Q. / Li, D. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 219
-
Detection system of the dynamic starting characteristic of an electric motorSong, Lu / Yen, Fucang / Wang, Xiaoman / Xu, Bo / Song, Zhengxun et al. | 1998
- 219
-
Detection system of the dynamic starting characteristic of an electric motor [3558-39]Song, L. / Yen, F. / Wang, X. / Xu, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 223
-
Research for the cylinder edge-checkout modelsLu, Haibao / Shen, Tingzheng / Zhou, Weihong / Luo, Wusheng / Yang, Huayong et al. | 1998
- 223
-
Research for the cylinder edge-checkout models [3558-40]Lu, H. / Shen, T. / Zhou, W. / Luo, W. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 228
-
Modeling and simulation of optimization design for structure parameters of CCD intersection measurement systemLu, Haibao / Yang, Huayong / Luo, Wusheng / Yan, Shuhua / Feng, Qinqun et al. | 1998
- 228
-
Modeling and simulation of optimization design for structure parameters of CCD intersection measurement system [3558-41]Lu, H. / Yang, H. / Luo, W. / Yan, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 234
-
Computer-aided internal thread parameters testing [3558-42]Tu, D. / Tao, J. / Qi, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 234
-
Computer-aided internal thread parameters testingTu, Dawei / Tao, Jing / Qi, Shan et al. | 1998
- 239
-
Optoelectronic noncontact inspection method of taper [3558-43]Zhang, G. / An, Z. / Jiang, H. / Li, C. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 239
-
Optoelectronic noncontact inspection method of taperZhang, Guoyu / An, Zhiyong / Jiang, Huilin / Li, Chengzhi / Gao, Yujin / Chen, Rowei et al. | 1998
- 244
-
System of photoelectric automeasurement of internal diameter [3558-44]Song, T. / Lin, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 244
-
System of photoelectric automeasurement of internal diameterSong, Tong / Lin, Xinyang et al. | 1998
- 248
-
Stereo-vision system for measurement of 3D objectDeng, Wenyi / Lu, Naiguang / Zhuang, Jingcheng / Guo, Shuyi / Qu, Xuguang et al. | 1998
- 248
-
Stereo-vision system for measurement of 3D object [3558-45]Deng, W. / Lu, N. / Zhuang, J. / Guo, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 253
-
Application of Twyman-CCD computer system in automeasurement displacementWang, Wensheng / Xiang, Yang / Zhang, Haicheng et al. | 1998
- 253
-
Application of Twyman-CCD computer system in automeasurement displacement [3558-46]Wang, W. / Xiang, Y. / Zhang, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 256
-
Three-dimensional profile measurement by using an artificial neural networkLu, Naiguang / Deng, Wenyi / Sun, Shaofeng / Yang, Jiping et al. | 1998
- 256
-
Three-dimensional profile measurement by using an artificial neural network [3558-47]Lu, N. / Deng, W. / Sun, S. / Yang, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 262
-
Nonlinearity of optical triangulation [3558-48]Zhang, X. / Sui, Y. / Yang, J. / Shi, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 262
-
Nonlinearity of optical triangulationZhang, Xinming / Sui, Yongxin / Yang, Jiandong / Shi, Yuxiang et al. | 1998
- 266
-
Photoelectric automeasurement system for shape and position [3558-49]Liu, W. / Xie, J. / Yang, J. / Zhao, T. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 266
-
Photoelectric automeasurement system for shape and positionLiu, Weina / Xie, Jinsong / Yang, Jiandong / Zhao, Tiejun et al. | 1998
- 272
-
Realization of spherical absolute testingWang, Qingyun / Zhu, Rihong / Chen, Jinbang / Chen, Lei et al. | 1998
- 272
-
Realization of spherical absolute testing [3558-50]Wang, Q. / Zhu, R. / Chen, J. / Chen, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 278
-
Submicron position and measurement system for optical edges [3558-51]Yuan, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 278
-
Submicron position and measurement system for optical edgesYuan, JiaHu et al. | 1998
- 283
-
Computer-aided testing for contact-type interferometer [3558-52]Wang, Q. / Chen, L. / Zhu, Y. / Chen, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 283
-
Computer-aided testing for contact-type interferometerWang, Qingyun / Chen, Lei / Zhu, Yu / Chen, Jinbang / Zhu, Rihong et al. | 1998
- 288
-
Noncontact optical sensor for inside-diameter measurementsWang, Xiangjun / Kou, Xinyu et al. | 1998
- 288
-
Noncontact optical sensor for inside-diameter measurements [3558-53]Wang, X. / Kou, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 293
-
Portable laser roughometerWang, Shihua / Wu, Jun et al. | 1998
- 293
-
Portable laser roughometer [3558-54]Wang, S. / Wu, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 298
-
Calibration errors in laser-scanning 3D-vision measurement using the space encoding method [3558-55]Yu, X. / Zhang, J. / Wu, L. / Lin, Q. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 298
-
Calibration errors in laser-scanning 3D-vision measurement using the space encoding methodYu, Xiaoyang / Zhang, Jian / Wu, Liying / Lin, Qing / Qiang, Xifu et al. | 1998
- 304
-
Automated inspection of chip type using image analysis methodLiu, Xianli / Teng, Hong / Yan, Fugang / Meng, An / Li, Zhengjia et al. | 1998
- 304
-
Automated inspection of chip type using image analysis method [3558-56]Liu, X. / Teng, H. / Yan, F. / Meng, A. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 308
-
Distortion compensation in large-FOV CCD optical measurement system [3558-57]Zhang, Y. / Xiong, R. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 308
-
Distortion compensation in large-FOV CCD optical measurement systemZhang, Yun / Xiong, Rensheng et al. | 1998
- 314
-
Exploiting potentialities of linear CCD arrays in real-time dynamic measurementLi, Changgui / Liu, Jinghai / Lin, Youna / Sun, Zhiyong et al. | 1998
- 314
-
Exploiting potentialities of linear CCD arrays in real-time dynamic measurement [3558-58]Li, C. / Liu, J. / Lin, Y. / Sun, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 320
-
Application of CCD camera to test radar-angle tracking performance [3558-59]Wang, Y. / Wang, Z. / Han, Q. / Liu, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 320
-
Application of CCD camera to test radar-angle tracking performanceWang, Yusheng / Wang, Zhiyun / Han, Qingshan / Liu, Limin et al. | 1998
- 323
-
Real-time error compensation of coordinate measurement system using combined gratings [3558-60]Tang, W. / Zhang, Y. / Duan, M. / Li, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 323
-
Real-time error compensation of coordinate measurement system using combined gratingsTang, Wenjun / Zhang, Yukun / Duan, Minmo / Li, Lihua / Fang, Zhongyan et al. | 1998
- 333
-
Measuring the space direction of a laser beam by means of linear-array CCD [3558-61]Liu, B. Q. / Shen, X. J. / Wang, F. / Hu, W. G. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 333
-
Measuring the space direction of a laser beam by means of linear-array CCDLiu, Bingqi / Shen, XueJu / Wang, Fu / Hu, Wengang et al. | 1998
- 336
-
LED automatic graderJin, Shangzhong et al. | 1998
- 336
-
LED automatic grader [3558-62]Jin, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 339
-
Vibration measurements using CCDWang, Qingyou / He, Liu / Guo, Qing / Li, Wei et al. | 1998
- 339
-
Vibration measurements using CCD [3558-63]Wang, Q. / He, L. / Guo, Q. / Li, W. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 344
-
Measuring instantaneous planar motion of rigid body with a linear CCDLi, Kaiming / Wang, Qingyou / Li, Wei / Zhang, Shaoyong et al. | 1998
- 344
-
Measuring instantaneous planar motion of rigid body with a linear CCD [3558-64]Li, K. / Wang, Q. / Li, W. / Zhang, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 348
-
Test of the time and space domain in three-dimensional image [3558-65]Huang, Z. / Cong, Q. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 348
-
Test of the time and space domain in three-dimensional imageHuang, Zuoming / Cong, Qiushi et al. | 1998
- 354
-
Computer vision application for weld defect detection and evaluation [3558-66]Liu, Y. / Li, X. / Ren, D. / Ye, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 354
-
Computer vision application for weld defect detection and evaluationLiu, Yue / Li, Xiaohong / Ren, Dahai / Ye, Shenghua / Wang, Bengang / Sun, Jie et al. | 1998
- 358
-
Analysis of CCD output signal in velocity measurement systemFu, Yongqi et al. | 1998
- 358
-
Analysis of CCD output signal in velocity measurement system [3558-67]Fu, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 362
-
Range finding precision analysis of long-distance high-precision laser range finderLiu, BaoYing et al. | 1998
- 362
-
Range finding precision analysis of long-distance high-precision laser range finder [3558-68]Liu, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 367
-
Tool-damage analysis based on imaging [3558-69]Liu, X. / Chen, B. / Yu, X. / Meng, A. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 367
-
Tool-damage analysis based on imagingLiu, Xianli / Chen, Bo / Yu, Xiaoyang / Meng, An / Li, Zhengjia et al. | 1998
- 371
-
Technology of speed measurement by CCDWang, Xiaoman / Song, Lu / Xu, Bo / Song, Zhengxun et al. | 1998
- 371
-
Technology of speed measurement by CCD [3558-70]Wang, X. / Song, L. / Xu, B. / Song, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 375
-
Extracting multiple lines from the Hough domain [3558-71]Chen, L. / Shen, Y. / Xie, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 375
-
Extracting multiple lines from the Hough domainChen, Linsen / Shen, Yang / Xie, Jianfong et al. | 1998
- 383
-
Theoretical model for IR imaging of buried object sitesZhang, Jianqi / Fang, Xiaoping / Yang, Weidong / Shao, Xiaopeng / Zhu, Changchun et al. | 1998
- 383
-
Theoretical model for IR imaging of buried object sites [3558-72]Zhang, J. / Fang, X. / Yang, W. / Shao, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 388
-
Design of a measurement and control system of partial environmental illuminance [3558-73]Wang, Y. / Niu, Y. / Guo, X. / Zuo, F. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 388
-
Design of a measurement and control system of partial environmental illuminanceWang, Yuefeng / Niu, Yanxiong / Guo, Xiaowei / Zuo, Fang / Dong, Wei / Xu, Hong et al. | 1998
- 394
-
Measurement of two-dimensional vector velocity using spatial filtering technique [3558-74]Li, P. / Ma, B. / Zhang, B. / Qu, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 394
-
Measurement of two-dimensional vector velocity using spatial filtering techniqueLi, Ping / Ma, Baomin / Zhang, Bingrong / Qu, Xinmei et al. | 1998
- 397
-
Laser-scanner-based self-localization for autonomous mobile robots using neural networkGu, Dongbing / Song, Zhengxun et al. | 1998
- 397
-
Laser-scanner-based self-localization for autonomous mobile robots using neural network [3558-75]Gu, D. / Song, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 402
-
Quantitative detection of subsurface defects by pulse-heating infrared thermography [3558-76]Zong, M. / Ding, T. / Xue, S. / Tang, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 402
-
Quantitative detection of subsurface defects by pulse-heating infrared thermographyZong, Mingcheng / Ding, Tieying / Xue, Shuwen / Tang, Huijun / van der Meer, Theo H. et al. | 1998
- 407
-
Using digital spatial phase-shifting technique to gain quasi-hologramZhu, Shaoming / Peng, Xiang / Zhang, Zonghua / Hu, Xiaotang et al. | 1998
- 407
-
Using digital spatial phase-shifting technique to gain quasi-hologram [3558-77]Zhu, S. M. / Peng, X. / Zhang, Z. / Hu, X. T. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 413
-
Near-field optical imaging properties by passive and active fiber probes [3558-78]Zhang, G. / Ming, H. / Bai, M. / Chen, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 413
-
Near-field optical imaging properties by passive and active fiber probesZhang, Guoping / Ming, Hai / Bai, Ming / Chen, Xiaogang / Wu, Yunxia / Xie, Jiangping et al. | 1998
- 421
-
New intelligent target for laser shooting practice [3558-79]Dai, B. / Ren, H. / Zhou, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 421
-
New intelligent target for laser shooting practiceDai, Bingming / Ren, HongYan / Zhou, Bing et al. | 1998
- 424
-
Simple and easy automation test and measurement method of large-size optical glass homogeneity [3558-80]Yang, W. / Yang, Y. / Yang, T. / Deng, W. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 424
-
Simple and easy automation test and measurement method of large-size optical glass homogeneityYang, Wenku / Yang, Yujing / Yang, Tao / Deng, Wenrong et al. | 1998
- 430
-
Development of infrared nondestructive testing system with laser scanning automatic heat loadingBai, Fengming / Liu, Weina / Ma, Li / Chen, Ling / Ma, Qianli et al. | 1998
- 430
-
Development of infrared nondestructive testing system with laser scanning automatic heat loading [3558-81]Bai, F. / Liu, W. / Ma, L. / Chen, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 436
-
Automeasurement system of belt transmission parameters [3558-82]Li, Z. / Wang, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 436
-
Automeasurement system of belt transmission parametersLi, Zhanguo / Wang, Xiaoman et al. | 1998
- 439
-
Surveying converter lining erosion state based on laser measurement technique [3558-83]Li, H. / Shi, T. / Yang, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 439
-
Surveying converter lining erosion state based on laser measurement techniqueLi, Hongsheng / Shi, Tielin / Yang, Shuzi et al. | 1998
- 445
-
Detecting laser-range-finding signals in surveying converter lining based on wavelet transformLi, Hongsheng / Yang, Xiaofei / Shi, Tielin / Yang, Shuzi et al. | 1998
- 445
-
Detecting laser-range-finding signals in surveying converter lining based on wavelet transform [3558-84]Li, H. / Yang, X. / Shi, T. / Yang, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 451
-
Optoelectronic technology for detecting flaws on internal surface of cylinderChe, Ying / Shen, Yuzhi / Ma, Hong et al. | 1998
- 451
-
Optoelectronic technology for detecting flaws on internal surface of cylinder [3558-85]Che, Y. / Shen, Y. / Ma, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 455
-
Development of high-precision system for measuring rotational inertia of bulletChe, Ying / Li, Zhanguo / Ma, Hong / Yiang, Jun et al. | 1998
- 455
-
Development of high-precision system for measuring rotational inertia of bullet [3558-86]Che, Y. / Li, Z. / Ma, H. / Yiang, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 462
-
New method of measuring photoelastic properties of optical materials by using laser heterodyne interferometry [3558-87]Kou, G. / Tao, C. / Gao, W. / Hao, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 462
-
New method of measuring photoelastic properties of optical materials by using laser heterodyne interferometryKou, Ge / Tao, ChunKan / Gao, Wanrong / Hao, Luguo / Yang, Xuan M. / Li, Ting et al. | 1998
- 470
-
Digital optical profiler with automatic reference phase calibration [3558-88]Wei, C. / Chen, M. / Wang, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 470
-
Digital optical profiler with automatic reference phase calibrationWei, Chunlong / Chen, Mingyi / Wang, Zhijiang et al. | 1998
- 480
-
Robust phase-unwrapping algorithm for flat measurement in phase-stepping interferometry [3558-89]Wei, C. / Chen, M. / Hou, W. / Guo, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 480
-
Robust phase-unwrapping algorithm for flat measurement in phase-stepping interferometryWei, Chunlong / Chen, Mingyi / Hou, Weidong / Guo, Hongwei / Wang, Zhijiang et al. | 1998
- 487
-
Characteristics of laser scanning for bar code recognitionShen, Shuqun / Shen, Yuchao / Fan, Rong / Hsu, Dahsiung et al. | 1998
- 487
-
Characteristics of laser scanning for bar code recognition [3558-90]Shen, S. / Shen, Y. / Fan, R. / Xu, D. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 491
-
Measurement and accuracy analysis of refractive index using a specular reflectivity close to the total internal reflection [3558-91]Li, H. / Lu, Z. / Xie, S. / Lin, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 491
-
Measurement and accuracy analysis of refractive index using a specular reflectivity close to the total internal reflectionLi, Hui / Lu, Zukang / Xie, Shusen / Lin, Lei et al. | 1998
- 498
-
New method of two-color calibration and one-color measurement for real-time inspection of temperature fieldZhang, Hua / Pan, Jiluan / Wang, Huiqin et al. | 1998
- 498
-
New method of two-color calibration and one-color measurement for real-time inspection of temperature field [3558-92]Zhang, H. / Pan, J. / Wang, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 505
-
Effective approach for detecting bands of EBSP with Hough transform [3558-105]Chen, L. / Casasent, D. P. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 505
-
Effective approach for detecting bands of EBSP with Hough transformChen, Linsen / Casasent, David P. et al. | 1998
- 515
-
Experimental method for underwater acoustic field detection from water surface using laser probe [3558-106]Zhou, C. / Liu, K. / He, J. / Sun, J. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 515
-
Experimental method for underwater acoustic field detection from water surface using laser probeZhou, Chenbo / Liu, Kaihua / He, Junqing / Sun, Jinzuo / Jiang, Rongxi / Chui, Guihua / Li, Rongfu / Yun, Taihui / He, Jinlin / Shang, Guoming et al. | 1998
- 522
-
Application of SPD to fast spectral color measurement [3558-107]Xu, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 522
-
Application of SPD to fast spectral color measurementXu, Haisong et al. | 1998
- 526
-
Multifunctional photoelectric detection and measurement systemLiu, Weina / Bai, Fengming / Zhao, Tiejun / Chen, Ling / Li, Yanhong et al. | 1998
- 526
-
Multifunctional photoelectric detection and measurement system [3558-108]Liu, W. / Bai, F. / Zhao, T. / Chen, L. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 531
-
Measuring the thermography of friction-welding process [3558-109]Gao, J. / Li, J. / Feng, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 531
-
Measuring the thermography of friction-welding processGao, JiaoBo / Li, Jing / Feng, Yue-you et al. | 1998
- 535
-
Wedge-ring wavelet detectorFeng, Wenyi / Yan, Yingbai / Jin, Guofan / Huang, Gaogui / Wu, Minxian et al. | 1998
- 535
-
Wedge-ring wavelet detector [3558-110]Feng, W. / Yan, Y. / Jin, G. / Huang, G. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 542
-
New Monte Carlo method of backscattered lidar signals [3558-111]Du, Z. / Lu, Y. / Huang, T. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 542
-
New Monte Carlo method of backscattered lidar signalsDu, Zhufeng / Lu, Yimin / Huang, Tiexia et al. | 1998
- 550
-
Optical method for measuring electric currentZhao, Junliang / Guan, Rongfeng / Wang, Yilu et al. | 1998
- 550
-
Optical method for measuring electric current [3558-112]Zhao, J. / Guan, R. / Wang, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 554
-
Technological research on an application of neural network in character recognition [3558-113]Li, P. / Mu, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 554
-
Technological research on an application of neural network in character recognitionLi, Ping / Mu, Xiaofeng et al. | 1998
- 561
-
Spectroellipsometric study of optical and electrical properties of buried CoSi~2 layers in silicon produced by MEVVA implantation [3558-114]Guo, W. / Wong, S. / Zhu, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 561
-
Spectroellipsometric study of optical and electrical properties of buried CoSi2 layers in silicon produced by MEVVA implantationGuo, Wensheng / Wong, Saipeng / Zhu, Ziqing et al. | 1998
- 571
-
Spectroellipsometric study of diamondlike carbon filmsGuo, Wensheng / Wong, Saipeng / Zhu, Ziqing et al. | 1998
- 571
-
Spectroellipsometric study of diamondlike carbon films [3558-115]Guo, W. / Wong, S. / Zhu, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 578
-
Spectroellipsometric study of SiC/Si heterostructures produced by MEVVA implantationGuo, Wensheng / Zhu, Ziqing / Wong, Saipeng et al. | 1998
- 578
-
Spectroellipsometric study of SiC/Si heterostructures produced by MEVVA implantation [3558-116]Guo, W. / Zhu, Z. / Wong, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 587
-
Processing of infrared thermography images in pulsed-heating infrared thermography nondestructive testingTang, Huijun / Ding, Tieying / Xue, Shuwen / Zong, Mingcheng et al. | 1998
- 587
-
Processing of infrared thermography images in pulsed-heating infrared thermography nondestructive testing [3558-117]Tang, H. / Ding, T. / Xue, S. / Zong, M. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 591
-
Intelligent measuring equipment for the width of fibers [3558-93]Chen, J. / Chang, B. / Qian, Y. / Huang, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 591
-
Intelligent measuring equipment for the width of fibersChen, Jinxiang / Chang, Benkang / Qian, Yunsheng / Huang, Yuanyuan / Yi, Feng / Zhang, Ming et al. | 1998
- 595
-
Picosecond optical sampling method to measure S-parameter of microwave monolithic integrated circuit [3558-94]Lu, F. / Yuan, S. / Pan, J. / Gai, Q. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 595
-
Picosecond optical sampling method to measure S-parameter of microwave monolithic integrated circuitLu, Fuyun / Yuan, Shuzhong / Pan, Jiaqi / Gai, Qi / Zhao, Yuanchao / He, Qingguo et al. | 1998
- 601
-
Fault signal detection with autocorrelation methodYang, Xuexian / Zhang, Qin-Yan / Han, Yueqiu et al. | 1998
- 601
-
Fault signal detection with autocorrelation method [3558-95]Yang, X. / Zhang, Q. / Han, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 607
-
Stress-induced birefringence and extinction ratioLi, Gaoping / Yang, Zhaojing / Lu, Chunli / Liu, Xunzhang / Xiang, Shiming et al. | 1998
- 607
-
Stress-induced birefringence and extinction ratio [3558-96]Li, G. / Yang, Z. / Lu, C. / Liu, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 615
-
Optical measurement method of necking process in the material tensile testZhang, Lizhong / Song, Xueping / Cao, Guohua / Yu, Zhenglin et al. | 1998
- 615
-
Optical measurement method of necking process in the material tensile test [3558-97]Zhang, L. / Song, X. / Cao, G. / Yu, Z. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 618
-
Infrared detection technique based on multicorrelation of frequency and timeGu, Guohua / Chen, Qian / Bai, Lianfa / Zhang, Baomin et al. | 1998
- 618
-
Infrared detection technique based on multicorrelation of frequency and time [3558-98]Gu, G. / Chen, Q. / Bai, L. / Zhang, B. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 622
-
New kind of spectral analysis instrument for measuring time-resolved spectrum of single-pulse lightYang, Jingguo / Yang, Cangli / Ha, Yuanqian / Chen, Xiaobo / Jin, Lihong / Tan, Hua / Hu, Shaolou / Wang, Xiang / Peng, Qixian et al. | 1998
- 622
-
New kind of spectral analysis instrument for measuring time-resolved spectrum of single-pulse light [3558-99]Yang, J. / Yang, C. / Ha, Y. / Chen, X. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 626
-
Constraint of Laplace transform method used in the reconstruction of axisymmetric fieldWu, Donglou / He, Anzhi / Yao, Wei et al. | 1998
- 626
-
Constraint of Laplace transform method used in the reconstruction of axisymmetric field [3558-100]Wu, D. / He, A. / Yao, W. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 630
-
Apparatus for highly accurate measurement of transmittance and reflectance of large-sized optical components [3558-101]Hu, Y. / Chen, Z. / Liao, Y. / Chang, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 630
-
Apparatus for highly accurate measurement of transmittance and reflectance of large-sized optical componentsHu, Yongming / Chen, Zhe / Liao, Yanbiao / Chang, Shengli / Meng, Zhou / Han, Zhe et al. | 1998
- 637
-
Design of weak-signal detection filters [3558-102]Cao, Y. / Li, F. / Lin, Y. / Gu, Y. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 637
-
Design of weak-signal detection filtersCao, Yang / Li, Fang / Lin, YongChang / Gu, Yonglin et al. | 1998
- 643
-
Mine dust optical measurement methodHe, Bin / Chen, Jidong / Tian, Xiaoyan / Qiao, Song et al. | 1998
- 643
-
Mine-dust optical measurement method [3558-103]He, B. / Chen, J. / Tian, X. / Qiao, S. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 646
-
Photoelectric detection system in equipment for recognition and sorting of bills [3558-104]Liao, J. / Yin, B. / Lao, W. / Xie, H. / SPIE / Chinese Optical Society / China Optics & Optoelectronic Manufacturers Association et al. | 1998
- 646
-
Photoelectric detection system in equipment for recognition and sorting of billsLiao, Jihong / Yin, Baozhi / Lao, Wenwei / Xie, Hua et al. | 1998