Magnetically-oscillated probe AFM for imaging and stiffness measurements at the liquid-solid interface (English)
- New search for: Lindsay, S. M.
- New search for: Han, W.
- New search for: Tao, N.
- New search for: Microscopy Society of America
- New search for: Microbeam Analysis Society
- New search for: Lindsay, S. M.
- New search for: Han, W.
- New search for: Tao, N.
- New search for: Bailey, G. W.
- New search for: Microscopy Society of America
- New search for: Microbeam Analysis Society
In:
Microscopy Society of America
;
324-325
;
1998
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ISSN:
- Conference paper / Print
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Title:Magnetically-oscillated probe AFM for imaging and stiffness measurements at the liquid-solid interface
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Contributors:Lindsay, S. M. ( author ) / Han, W. ( author ) / Tao, N. ( author ) / Bailey, G. W. / Microscopy Society of America / Microbeam Analysis Society
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Conference:Annual meeting; 56th, Microscopy Society of America ; 1998 ; Atlanta; GA
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Published in:Microscopy Society of America ; 324-325MICROSCOPY AND MICROANALYSIS ; 4 ; 324-325
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Publisher:
- New search for: Springer-Verlag
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Place of publication:New York
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Publication date:1998-01-01
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Size:2 pages
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Remarks:Held in conjunction with the 32nd annual meeting of the Microbeam Analysis Society. The joint title is Microscopy and microanalysis '98
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
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