New soft-measuring system of polarized light [4222-65] (English)
- New search for: Zheng, Y.
- New search for: Huang, Y.
- New search for: Zheng, Y.
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In:
Process control and inspection for industry
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292-295
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2000
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ISBN:
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ISSN:
- Conference paper / Print
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Title:New soft-measuring system of polarized light [4222-65]
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Contributors:
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Conference:Conference, Process control and inspection for industry ; 2000 ; Beijing
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Published in:PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4222 ; 292-295
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Publisher:
- New search for: SPIE
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Publication date:2000-01-01
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Size:4 pages
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Three-dimensional welding and cutting using high-power CO~2 or YAG laser (Invited Paper) [4222-17]Zuo, T. / Chen, J. / Xiao, R. / Bao, Y. et al. | 2000
- 8
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Mapping matrices and weight function in high-precision EST of flatness by optical probe (Invited Paper) [4222-22]Hong, M. / Wei, Y. / Li, Z. / Li, J. et al. | 2000
- 16
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Fiber optic sensors for safety control of civil structures (Invited Paper) [4222-23]Chen, W. / Zhu, Y. / Fu, Y. / Feng, J. / Huang, S. et al. | 2000
- 21
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Development of research on super-precision measurement techniques for circle and cylindrical contour (Invited Paper) [4222-37]Tan, J. / Zhao, W. / Yang, W. et al. | 2000
- 27
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Phase unwrapping algorithm based on fringe density analysis in Fourier transform profilometry (Invited Paper) [4222-54]Su, X. / Xue, L. et al. | 2000
- 32
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New progress in shearography (Invited Paper) [4222-86]Shi, H. / Ni, S. / Fu, L. / Wang, H. et al. | 2000
- 39
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Automatic inspection of geometric accuracy of optical fiber ferrules by machine vision (Invited Paper) [4222-215]Kim, G.-H. / Kim, S.-W. / Lim, S.-G. et al. | 2000
- 44
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Three-dimensional laser inverse scattering phase method for evaluating microstructure (Invited Paper) [4222-229]Takaya, Y. / Taguchi, A. / Takahashi, S. / Miyoshi, T. et al. | 2000
- 48
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Vision-based precision inspection system for profile and performance of small and micro gears using the intelligent image processing techniques and virtual master gears (Invited Paper) [4222-237]Pahk, H. J. / Hwang, Y. M. / Lee, I. H. / Ahn, W. J. et al. | 2000
- 54
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Digital fringe projection technique for high-speed 3D shape measurement (Invited Paper) [4222-261]Huang, P. S. / Zhang, C. / Chiang, F.-P. et al. | 2000
- 61
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Novel high-resolution vibration sensor based on laser frequency splitting technology [4222-02]Zhang, Y. / Zhang, S. et al. | 2000
- 66
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Position and attitude measurement of moving target using laser tracking system with multiple measuring stations [4222-03]Hu, Z. / Wang, J. / Liu, Y. / Liang, J. et al. | 2000
- 71
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Measuring particulate concentration by means of scattered light scintillation [4222-04]Chen, A. / Hao, J. / Zhou, Z. / Ma, Y. et al. | 2000
- 76
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High-precision measurement of the wavelength shift of in-fiber Bragg grating with strain gauge [4222-06]Xie, F. / Zhang, S. / Li, Y. / Zhang, A. / Lee, S. B. et al. | 2000
- 81
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Processing application used in beam characterization [4222-07]Sun, W. / Gao, C. / Wei, G. et al. | 2000
- 87
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Model characteristics of quartz tuning-fork angular rate microsensor by means of FEM [4222-08]Wang, Y. / Sun, Y. / Qin, B. / Yin, P. et al. | 2000
- 91
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Interferogram processing with wavelet analysis and spectrogram reconstruction [4222-09]Chu, J. / Jiang, Y. / Li, Q. / Zhao, D. et al. | 2000
- 95
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Online measuring system for amorphous strip thickness [4222-10]Hao, Q. / Wang, Y. / Sha, D. et al. | 2000
- 100
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Digital simulation for low-light-level night vision imaging system [4222-11]Bai, T. / Li, N. / Zou, Z. / Lu, H. / Yan, G. et al. | 2000
- 105
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Image simulation for photoelectric imaging system [4222-12]Zou, Z. / Lu, H. / Bai, T. / Gao, Z. et al. | 2000
- 110
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Quick and dynamic measurements of geometric errors of CNC machines [4222-13]Feng, Q. / Hocken, R. J. / Miller, J. A. et al. | 2000
- 114
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Remote sensing to ocean by using Brillouin scattering: test of sound speed and submerged object [4222-14]Liu, D. / Xu, J. / Wang, H. / Zhou, J. et al. | 2000
- 118
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Approach to application of segment and its deformation measurement [4222-15]Li, T. / Liu, Z. / Zhang, J. / Fang, Y. / Wang, X. et al. | 2000
- 124
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Computer simulation of laser drilling in permanent magnetic material [4222-16]Liu, S. / Li, C. et al. | 2000
- 129
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Optoelectronic inspection method for IC shell blanks [4222-18]Sun, C. / Shi, H. / Xue, X. / Ye, S. et al. | 2000
- 133
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Novel image connection method used in the measurement of geometrical parameters [4222-19]Lin, Y. / Niu, X. / Zhao, M. / Wen, L. et al. | 2000
- 138
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Fast integrated multiparameter detecting system for shaft parts [4222-20]Zhao, M. / Lin, Y. et al. | 2000
- 142
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Defect inspection in optical fibers based on a quasi-joint transform correlator [4222-21]Liu, Y. / Liu, W. / Zhang, Y. / Zhou, G. et al. | 2000
- 147
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Detection and estimation of signal time of arrival (TOA) for wireless location based on mobile telecommunication network [4222-25]Zhang, Y. / Wang, J. / Luo, Y. / Li, Z. et al. | 2000
- 153
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Fast algorithm of calculating invariant features for image matching [4222-26]Feng, G. / Lin, Q. et al. | 2000
- 158
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Adaptive Sobel operator and its uses [4222-27]Feng, G. / Lin, Q. et al. | 2000
- 161
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Computer control system based on fuzzy control for boilers [4222-28]Zheng, D. / Shang, L. / Shi, J. et al. | 2000
- 166
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Minimum stable speed for Ground Servo System launching laser beam to interfere with an air target [4222-30]Chen, J. / Wang, J. / Ge, W. et al. | 2000
- 170
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Low-speed jitter adaptive control in an optoelectronic tracking system [4222-31]Chen, J. / Tan, H. / Chen, T. et al. | 2000
- 174
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Chaos self-adapting parameter modulate system based on electro-optics device [4222-32]Bai, F. / Shen, K. et al. | 2000
- 179
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Electronic parameter modulate hyperchaos system based on semiconductor laser [4222-33]Bai, F. / Shen, K. et al. | 2000
- 184
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Method of real-time control and data processing of the laser roundness instrument [4222-34]Xu, X. / Zhang, G. / An, Z. / Li, C. et al. | 2000
- 189
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Fault diagnosis method using network and fuzziness [4222-36]Song, T. / Song, B. / Fu, Q. et al. | 2000
- 194
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Optical probe using differential confocal technique for surface profile [4222-38]Wang, F. / Tan, J. / Zhao, W. et al. | 2000
- 198
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Optical fiber interference target flowmeter II: damper design [4222-41]Sun, Z. / Li, P. / Qiang, X. / Zhao, Y. et al. | 2000
- 202
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Visual servo control system of space robot [4222-45]Bo, Y. et al. | 2000
- 209
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Auto-testing system for measuring optic characteristics of vehicular lamp [4222-46]Zheng, Y. / Gu, F. / Shen, X. et al. | 2000
- 214
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Fast 3D measurement method for multibeam confocal system and system error calibrating [4222-47]Kong, B. / Wang, Z. / Tan, Y. / Mi, N. et al. | 2000
- 219
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Multisensor image fusion based on wavelet transform [4222-48]Liu, G. / Yang, W. et al. | 2000
- 224
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Fuzzy feature matching between radar image and optical image [4222-49]Li, T. / Ma, X. / Chen, Z. / Wang, R. / Xiong, X. et al. | 2000
- 230
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Estimation of navigation parameters from real-time aerial scene [4222-50]Li, T. / Chen, Z. / Liu, Z. / Wang, R. et al. | 2000
- 236
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Analysis of the effect on electron density along the laser path by adding magnetic field in laser beam welding [4222-51]Liu, J. / Hu, W. / Liu, Y. et al. | 2000
- 240
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Computer platform for the analysis of the process of laser welding [4222-52]Liu, J. / Liu, Y. et al. | 2000
- 245
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Fourier transform profilometry for dynamic 3D shape [4222-55]Su, X. / Chen, W. et al. | 2000
- 249
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Binary coded grating with error diffusion and its application in 3D sensing [4222-56]Xian, T. / Su, X. et al. | 2000
- 254
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New algorithm for fuzzy biomedical image segmentation [4222-57]He, X. / Wu, X. / Zhou, Y. / Tao, D. / Jiang, L. / Teng, Q. et al. | 2000
- 258
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Core image acquiring and processing [4222-58]Long, J. / Luo, D. / Tao, D. / Liu, X. / He, X. et al. | 2000
- 262
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Distributed optical fiber strain sensor based on a novel microbend structure [4222-59]Meng, A. / Luo, F. / Ma, N. / Yuan, S. et al. | 2000
- 267
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Fusion in frequency-domain of instantaneous laser assistant vision image and low-light-level image [4222-60]Sun, S. / Wang, L. / Zhang, B. et al. | 2000
- 272
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Optimizing design of servo control in Infrared Search and Track (IRST) systems [4222-62]Hu, L. / Chen, Y. / Gao, H. et al. | 2000
- 276
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DDGIPS: a general image processing system in robot vision [4222-63]Tian, Y. / Ying, J. / Ye, X. / Gu, W. et al. | 2000
- 287
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Pulsed laser/background light simulator [4222-64]Yang, Y. / Ni, X. / Lu, Z. / Ding, X. et al. | 2000
- 292
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New soft-measuring system of polarized light [4222-65]Zheng, Y. / Huang, Y. et al. | 2000
- 296
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Low-power optoelectronic count [4222-66]Fang, W. / Fang, T. et al. | 2000
- 299
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Simple image subtraction using phase shift property of photorefractive two-wave mixing [4222-68]Cai, L. / Wang, Y. et al. | 2000
- 304
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Three-dimensional view based on RS and GIS: three-dimensional simulation of Mount Taishan [4222-70]Song, X. / Yang, F. / Han, Z. / Liu, Q. / Zhang, F. et al. | 2000
- 308
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Software solution to counting and subdivision of moire fringes with wide dynamic range [4222-72]Su, S. / Lu, H. / Zhou, W. / Wang, G. et al. | 2000
- 313
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Reflective fiber optic displacement sensor with intensity compensation [4222-73]Lu, H. / Xu, T. / Yang, H. / Chen, Z. et al. | 2000
- 318
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Effect on intensity modulation caused by perpendicularity between the axes of fiber pair and reflector [4222-75]Yang, H. / Lu, H. / Xu, T. / Yan, S. / Chen, Z. et al. | 2000
- 323
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Wide-range and high-resolution displacement measurement with grating [4222-76]Lu, H. / Cao, J. / Chen, J. et al. | 2000
- 327
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Camera calibration in augumented reality [4222-77]Li, Y. / Zhang, M. / Qi, Y. / Wu, L. et al. | 2000
- 332
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Feature matching and improved Hough transform in visible measurement [4222-78]Shen, B. / Yang, Y. / Chen, L. / Shen, L. / Dai, Y. et al. | 2000
- 337
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New image matching method based on principal component analysis [4222-79]Zhang, G. / Jiang, M. / Hu, R. / Chen, Z. et al. | 2000
- 341
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Distance inspection for robot vision and 3D imaging using defocusing pixel dither [4222-80]Zhang, X. / Zhang, G. / Zhu, Z. / Chen, Y. et al. | 2000
- 345
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Development and industrial solutions of laser marking with a model on escutcheon of section bar [4222-81]Zhang, P. et al. | 2000
- 349
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Stereoscopic neurovision system for part recognition in intelligent assembly system [4222-82]Xiong, Y. / Hu, H. et al. | 2000
- 361
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Imaging projection lens for excimer laser micromachining [4222-83]Wan, Y. / Zuo, T. / Jiang, Y. et al. | 2000
- 366
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Measurement of high-power laser resonator mirror's misalignment using PSD [4222-85]Zhang, L. / Fu, L. / Shi, H. / Lu, Y. et al. | 2000
- 372
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Characteristic models of a new structural LVDT [4222-87]Zhou, W. / Lu, G. / Cai, P. / Shi, W. et al. | 2000
- 378
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Calibration of angle function in angle-grid-based 2D-position measurement system [4222-88]Cai, P. / Kiyono, S. / Gao, W. / Lin, L. et al. | 2000
- 383
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Laser alignment system used for coaxiality measurement of large-scale holes [4222-89]Lu, N. / Den, W. / Yan, B. / Chen, Q. / Liu, G. et al. | 2000
- 387
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Process control by computer in laser processing system [4222-90]Lu, Y. / Chen, R. / Wang, Y. / Xie, S. et al. | 2000
- 391
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Decomposition of mixed pixels based on Gray System Theory [4222-91]Gui, Y. / Xuan, W. / Ling, Z. / Zhang, J. et al. | 2000
- 396
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Seal imprint recognition with joint transform correlators [4222-226]Chen, C. / Fang, J.-S. et al. | 2000
- 404
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Rotational error analysis of turning surface by using software datum [4222-243]Ogura, I. et al. | 2000
- 408
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Roundness measurement using angle probes [4222-252]Gao, W. / Sato, E. / Kiyono, S. et al. | 2000
- 412
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In-process force monitoring in diamond turning of micropatterns [4222-253]Gao, W. / Genda, S. / Kiyono, S. et al. | 2000
- 417
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Diagnosing abnormal operating conditions of rotational machineries and machine tools with physical wavelets [4222-254]Takeda, F. / Okada, S. / Imade, M. / Miyauchi, H. et al. | 2000
- 427
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Roundness measurement and the radial motion measurement based on the 3-point method using the inverse filtering [4222-257]Okuyama, E. et al. | 2000