Correlation between mechanical stress and optical properties of SiO~2/Ta~2O~5 multilayer UV narrow-bandpass filters deposited by plasma ion-assisted deposition [5870-13] (English)
- New search for: Wang, J.
- New search for: Maier, R. L.
- New search for: SPIE--the International Society for Optical Engineering
- New search for: Wang, J.
- New search for: Maier, R. L.
- New search for: Fulton, Michael L.
- New search for: Kruschwitz, Jennifer D. T.
- New search for: SPIE--the International Society for Optical Engineering
In:
Advances in thin-film coatings for optical applications
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58700E
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2005
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ISBN:
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ISSN:
- Conference paper / Print
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Title:Correlation between mechanical stress and optical properties of SiO~2/Ta~2O~5 multilayer UV narrow-bandpass filters deposited by plasma ion-assisted deposition [5870-13]
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Contributors:Wang, J. ( author ) / Maier, R. L. ( author ) / Fulton, Michael L. / Kruschwitz, Jennifer D. T. / SPIE--the International Society for Optical Engineering
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Conference:Conference; 2nd, Advances in thin-film coatings for optical applications ; 2005 ; San Diego, CA
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Published in:
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Publisher:
- New search for: SPIE
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Publication date:2005-01-01
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Size:58700E
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 58700A
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Ellipsometric monitoring of multilayer coatingsNetterfield, Roger P. et al. | 2005
- 58700B
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Usage of total reflection for optical quality control of anisotropic thin filmsKonstantinova, Alisa / Konstantinov, Konstantin et al. | 2005
- 58700C
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Double optical monitoring of time-dependent film formationMichels, Alexandre F. / Menegotto, Thiago / Grieneisen, Hans-Peter H. / Santilli, Celso V. / Horowitz, Flavio et al. | 2005
- 58700D
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Virtual deposition plantTikhonravov, Alexander et al. | 2005
- 58700E
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Correlation between mechanical stress and optical property of SiO2/Ta2O5 multilayer UV narrow band filter deposited by plasma ion-assisted depositionWang, Jue / Maier, Robert L. et al. | 2005
- 58700F
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Effects of ion assist and substrate temperature on the optical properties and microstructure of MgF2films produced by e-beam evaporationJaing, Cheng-Chung / Shiao, Ming-Hua / Lee, Cheng-Chung / Lu, Chih-Jung / Liu, Ming-Chung / Lee, Chin-Han / Chen, His-Chao et al. | 2005
- 58700G
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Comparison of silicon oxide films deposited by RF ion beam sputtering and e-beam gun evaporation in visible to UV rangesWu, Jean-Yee / Lee, Cheng-Chung et al. | 2005
- 58700H
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Low mechanical loss coatings for LIGO optics: progress reportNetterfield, Roger P. / Gross, Mark / Baynes, Fred N. / Green, Katie L. / Harry, Gregory M. / Armandula, Helena / Rowan, Sheila / Hough, Jim / Crooks, David R. M. / Fejer, Martin M. et al. | 2005
- 58700J
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Low-loss gratings for next-generation gravitational wave detectorsClausnitzer, T. / Kley, E.-B. / Tuennermann, A. / Bunkowski, A. / Burmeister, O. / Danzmann, K. / Schnabel, R. / Duparre, A. / Gliech, S. et al. | 2005
- 58700K
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Angular and spectroscopic ellipsometry of ion bombarded surface layerPoperenko, L. V. / Kosel, P. B. / Vinnichenko, M. V. et al. | 2005
- 58700L
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Dielectric coatings for customised tunable lithium niobate filtersDligatch, Svetlana / Netterfield, Roger P. / Farrant, David I. et al. | 2005
- 58700M
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Hafnium oxide for optical applications deposited by different CMOS compatible methodsAlbert, Matthias / Roessler, Thorsten / Adolphi, Barbara / Bartha, Johann W. / Grueger, Heinrich / Kunath, Christian / Sorge, Stephan et al. | 2005
- 58700N
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Design of transmission linear partial polarizers using a negative film-substrate systemZaghloul, A. R. M. / Berzett, W. A. / Keeling, D. A. et al. | 2005
- 587001
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Inorganic polarizing materials grown by physical vapor depositionHodgkinson, Ian / De Silva, Lakshman / Arnold, Matthew et al. | 2005
- 587001
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Inorganic polarizing materials grown by physical vapor deposition (Invited Paper) [5870-01]Hodgkinson, I. / De Silva, L. / Arnold, M. / SPIE--the International Society for Optical Engineering et al. | 2005
- 587002
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Double-handed circular Bragg reflection bands in chiral thin films [5870-02]van Popta, A. C. / Sit, J. C. / Brett, M. J. / SPIE--the International Society for Optical Engineering et al. | 2005
- 587002
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Double-handed circular Bragg reflection bands in chiral thin filmsvan Popta, Andy C. / Sit, Jeremy C. / Brett, Michael J. et al. | 2005
- 587003
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Optical and thermal characterizations of AgSbTe chalcogenide-based thin films [5870-03]Sharma, Y. D. / Bhatnagar, P. / Suhara, T. / SPIE--the International Society for Optical Engineering et al. | 2005
- 587003
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Optical and thermal characterizations of AgSbTe chalcogenide-based thin filmsSharma, Y. D. / Bhatnagar, P. / Suhara, T. et al. | 2005
- 587005
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Ion-air gun cleaning of substrates prior to thin film depositionZito, Richard R. et al. | 2005
- 587005
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Ion-air gun cleaning of substrates prior to thin film deposition [5870-05]Zito, R. R. / SPIE--the International Society for Optical Engineering et al. | 2005
- 587006
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Silvering substrates after CO2snow cleaningZito, Richard R. et al. | 2005
- 587006
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Silvering substrates after CO~2 snow cleaning [5870-06]Zito, R. R. / SPIE--the International Society for Optical Engineering et al. | 2005
- 587007
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Gold coatings for cube-corner retro-reflectors [5870-07]Dligatch, S. / Gross, M. / Netterfield, R. P. / Pereira, N. / Platt, B. C. / Nemati, B. / SPIE--the International Society for Optical Engineering et al. | 2005
- 587007
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Gold coatings for cube-corner retro-reflectorsDligatch, Svetlana / Gross, Mark / Netterfield, Roger P. / Pereira, Nathan / Platt, Benjamin C. / Nemati, Bijan et al. | 2005
- 587008
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Improved AR coating reflection color uniformity and stability using multiple anodes and fuzzy logic control in DC reactive sputter coating [5870-08]Burton, C. H. / SPIE--the International Society for Optical Engineering et al. | 2005
- 587008
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Improved AR coating reflection color uniformity and stability using multiple anodes and fuzzy logic control in DC reactive sputter coatingBurton, C. H. et al. | 2005
- 587009
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Atomic layer deposition of TiO2/ Al2O3films for optical applicationsTriani, Gerry / Evans, Peter J. / Mitchell, David R. G. / Attard, Darren J. / Finnie, Kim S. / James, Michael / Hanley, Tracey / Latella, Bruno / Prince, Kathryn E. / Bartlett, John et al. | 2005
- 587009
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Atomic layer deposition of TiO~2/ Al~2O~3 films for optical applications [5870-23]Triani, G. / Evans, P. J. / Mitchell, D. R. G. / Attard, D. J. / Finnie, K. S. / James, M. / Hanley, T. / Latella, B. / Prince, K. E. / Bartlett, J. et al. | 2005
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Dielectric coatings for customised tunable lithium niobate filters [5870-20]Dligatch, S. / Netterfield, R. P. / Farrant, D. I. / SPIE--the International Society for Optical Engineering et al. | 2005
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Low mechanical loss coatings for LIGO optics: progress report [5870-16]Netterfield, R. P. / Gross, M. / Baynes, F. N. / Green, K. L. / Harry, G. M. / Armandula, H. / Rowan, S. / Hough, J. / Crooks, D. R. M. / Fejer, M. M. et al. | 2005
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Angular and spectroscopic ellipsometry of ion bombarded surface layer [5870-19]Poperenko, L. V. / Kosel, P. B. / Vinnichenko, M. V. / SPIE--the International Society for Optical Engineering et al. | 2005
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Correlation between mechanical stress and optical properties of SiO~2/Ta~2O~5 multilayer UV narrow-bandpass filters deposited by plasma ion-assisted deposition [5870-13]Wang, J. / Maier, R. L. / SPIE--the International Society for Optical Engineering et al. | 2005
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Comparison of silicon oxide films deposited by RF ion beam sputtering and e-beam gun evaporation in visible to UV ranges [5870-15]Wu, J.-Y. / Lee, C.-C. / SPIE--the International Society for Optical Engineering et al. | 2005
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Effects of ion assist and substrate temperature on the optical properties and microstructure of MgF~2 films produced by e-beam evaporation [5870-14]Jaing, C.-C. / Shiao, M.-H. / Lee, C.-C. / Lu, C.-J. / Liu, M.-C. / Lee, C.-H. / Chen, H.-C. / SPIE--the International Society for Optical Engineering et al. | 2005
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Virtual deposition plant (Invited Paper) [5870-12]Tikhonravov, A. / SPIE--the International Society for Optical Engineering et al. | 2005
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Hafnium oxide for optical applications deposited by different CMOS compatible methods [5870-21]Albert, M. / Rossler, T. / Adolphi, B. / Bartha, J. W. / Gruger, H. / Kunath, C. / Sorge, S. / SPIE--the International Society for Optical Engineering et al. | 2005
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Usage of total reflection for optical quality control of anisotropic thin films [5870-10]Konstantinova, A. / Konstantinov, K. / SPIE--the International Society for Optical Engineering et al. | 2005
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Design of transmission linear partial polarizers using a negative film-substrate system [5870-22]Zaghloul, A. R. M. / Berzett, W. A. / Keeling, D. A. / SPIE--the International Society for Optical Engineering et al. | 2005
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Low-loss gratings for next-generation gravitational wave detectors [5870-18]Clausnitzer, T. / Kley, E.-B. / Tunnermann, A. / Bunkowski, A. / Burmeister, O. / Danzmann, K. / Schnabel, R. / Duparre, A. / Gliech, S. / SPIE--the International Society for Optical Engineering et al. | 2005
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Ellipsometric monitoring of multilayer coatings (Invited Paper) [5870-09]Netterfield, R. P. / SPIE--the International Society for Optical Engineering et al. | 2005
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Double optical monitoring of time-dependent film formation [5870-11]Michels, A. F. / Menegotto, T. / Grieneisen, H. P. H. / Santilli, C. V. / Horowitz, F. / SPIE--the International Society for Optical Engineering et al. | 2005