X-Ray Standing Wave Imaging of Atoms at Interfaces (English)
- New search for: Bedzyk, M.
- New search for: Kim, C.
- New search for: Kazimirov, A.
- New search for: Elam, J.
- New search for: Christensen, S.
- New search for: Goswami, D.
- New search for: Hersam, M.
- New search for: Pellin, M.
- New search for: Stair, P.
- New search for: Bedzyk, M.
- New search for: Kim, C.
- New search for: Kazimirov, A.
- New search for: Elam, J.
- New search for: Christensen, S.
- New search for: Goswami, D.
- New search for: Hersam, M.
- New search for: Pellin, M.
- New search for: Stair, P.
In:
Advances in in situ characterization of film growth and interface processes
;
337-361
;
2007
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ISBN:
- Conference paper / Print
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Title:X-Ray Standing Wave Imaging of Atoms at Interfaces
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Contributors:Bedzyk, M. ( author ) / Kim, C. ( author ) / Kazimirov, A. ( author ) / Elam, J. ( author ) / Christensen, S. ( author ) / Goswami, D. ( author ) / Hersam, M. ( author ) / Pellin, M. ( author ) / Stair, P. ( author )
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Conference:Symposium, Advances in in situ characterization of film growth and interface processes ; 2006 ; Boston, Mass.
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Published in:MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS ; 967 ; 337-361
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Publisher:
- New search for: Materials Research Society
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Place of publication:Warrendale, Pa.
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Publication date:2007-01-01
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Size:25 pages
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ISBN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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In Situ Electron Microscopy as a Tool for Imaging the Growth of NanostructuresKodambaka, S. / Ross, F. / Hannon, J. / Tromp, R. / Reuter, M. / Ellis, A. / Tersoff, J. / Kim, B. / Stach, E. et al. | 2007
- 33
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Quantum Effects in Low Energy Electron Microscopy: A 3D View of Thin Film Growth and StructureAltman, M. et al. | 2007
- 59
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In Situ Scanning Electron Microscopy of Single-Walled Carbon Nanotube Growth during Chemical Vapor DepositionHomma, Y. / Takagi, D. / Chokan, T. et al. | 2007
- 83
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High-Pressure RHEED Controlled PLD of Complex OxidesBlank, D. et al. | 2007
- 130
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Advances in the Use of RHEED-TRAX and Cathodoluminescence for In-Situ Growth Characterization and ControlLee, K. / Thompkins, R. / Chandril, S. / Keenan, C. / Schires, E. / Lederman, D. / Myers, T. et al. | 2007
- 159
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Quantitative Study of Sub-Monolayer Growth of Ge(001) Homoepitaxy using Reflection High Energy Electron DiffractionShin, B. / Aziz, M. et al. | 2007
- 173
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In Situ RHEED Monitoring of Epitaxial Film Growth on Continuously Moving TapeMatias, V. / Steenwelle, R. et al. | 2007
- 184
-
Magnetic Interface Interactions in Cuprate - Manganite Heterostructures and SuperlatticesHabermeier, H. / Chakhalian, J. / Christiani, G. / Bernhard, C. / Keimer, B. et al. | 2007
- 209
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In Situ Characterization of Iron Oxides Quantum Dots and Thin Film Growth Using UHV AFMThery, J. / Gordon, M. / Baron, T. / Dubourdieu, C. et al. | 2007
- 229
-
Optical Conductivity of Electroless Deposited Percolating Silver FilmsKooij, S. / de Vries, A. / Wormeester, H. / Mewe, A. / Poelsema, B. et al. | 2007
- 244
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In-Situ Investigation of Surface Oxygen Vacancies in PerovskitesGranozio, F. et al. | 2007
- 280
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Stress Evolution During Electrochemical Deposition of Thin FilmsLuo, T. / Cammarata, R. et al. | 2007
- 294
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Stress Evolution Due to Island Coalescence During Film GrowthBhandari, A. / Sheldon, B. / Hearne, S. et al. | 2007
- 307
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The Electronic Structure of 1,7-PCB10H11 Molecular FilmsBalaz, S. / Boag, N. / Platt, N. / Dimov, D. / Brand, J. / Dowben, P. et al. | 2007
- 313
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Surface Reactions of Metal Catalysts for Carbon Nanotubes on an Oxide Thin Layer/Si Substrates Studied by In-Situ Micro X-Ray Adsorption Spectroscopy Using SPELEEMMaeda, F. / Hibino, H. / Suzuki, S. / Guo, F. / Watanabe, Y. et al. | 2007
- 319
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Characterization of Alumina Optical Waveguides Grown by Ion Beam Assisted Deposition for SPARROW BiosensorsPoloju, P. / Samudrala, P. / Nightingale, J. / Korakakis, D. / Hornak, L. et al. | 2007
- 325
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Efficient and Broad-range Zoom Optics Beam Delivery Systems for Laser Material ProcessingKirilov, D. / Eom, C. / Gebale, T. / Branescu, M. / Naudin, C. / Teodorescu, V. / Socol, G. / Balasz, I. / Ducu, C. / Jaklovszky, J. et al. | 2007
- 337
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X-Ray Standing Wave Imaging of Atoms at InterfacesBedzyk, M. / Kim, C. / Kazimirov, A. / Elam, J. / Christensen, S. / Goswami, D. / Hersam, M. / Pellin, M. / Stair, P. et al. | 2007
- 362
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Synchrotron-Based In Situ X-Ray Studies of Pulsed Laser DepositionBrock, J. et al. | 2007
- 463
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Determining the Growth Mode of SrTiO3 (001) via Pulsed Laser Deposition using In-situ X-Ray ReflectivityFerguson, J. / Arikan, G. / Amassian, A. / Dale, D. / Woll, A. / Brock, J. et al. | 2007
- 478
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Interlayer Transport in Pulsed Laser Deposition of SrTiO3 Studied by Time-Resolved Surface X-Ray DiffractionEres, G. et al. | 2007
- 489
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Quantitative Determination of Ion Impact- Induced Smoothing on Sapphire SurfacesZhou, H. / Zhou, L. / Wang, Y. / Headrick, R. / Ozcan, A. / Ozaydin, G. / Ludwig, K. et al. | 2007
- 506
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In-Situ Synchrotron X-Ray Diffraction During Pulsed Laser Deposition of Complex OxidesRijnders, G. / Janssens, A. / Vonk, V. / Huijben, M. / Harkema, S. / Blank, D. et al. | 2007
- 522
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Time-Resolved X-Ray Reflectivity Study of Interfacial Reactions and Intermetallic Formation During In-Situ Continuous Heat-Treatment of Cu/Mg/Cu LayersGonzalez-Silveira, M. / Rodriguez-Viejo, J. / Clavaguera-Mora, M. / Bigault, T. et al. | 2007
- 539
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Significant Shift of Phase Transition Temperature of Strained SrRuO3 Thin FilmsChoi, K. / Baek, S. / Jang, H. / Belenky, L. / Eom, C. et al. | 2007
- 549
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In Situ Infrared Absorption Spectroscopy for Thin Film Growth by Atomic Layer DepositionWang, Y. / Dai, M. / Ho, M. / Rivillon, S. / Chabal, Y. et al. | 2007
- 569
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The ``Silanone'' Structure as the First Step of the Silicon OxidationHemeryck, A. et al. | 2007
- 581
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Nano-Scale Imaging with Table-top Extreme Ultraviolet LasersMenoni, C. / Vaschenko, G. / Brewer, C. / Brizuela, F. / Wang, Y. / Larotonda, M. / Luther, B. / Marconi, M. / Rocca, J. / Chao, W. et al. | 2007
- 599
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In Situ Temperature Measurement; What is the Temperature of a Growing Oxide Thin FilmKoster, G. et al. | 2007
- 620
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In Situ Characterization of Gas-Phase Processes During Hafnium Oxide Atomic Layer DepositionMaslar, J. / Hurst, W. / Burgess, D. / Kimes, W. / Nguyen, N. / Moore, E. et al. | 2007
- 632
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In Situ Defect Spectroscopy: Probing Dangling Bonds During a-Si:H Growth by Subgap AbsorptionVan de Sanden, R. / Aarts, I. / Pipino, A. / Kessels, E. et al. | 2007