Exploring Pd-Si(001) and Pd-Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements (English)
- New search for: Richard, M. I.
- New search for: Fouet, J.
- New search for: Guichet, C.
- New search for: Mocuta, C.
- New search for: Thomas, O.
- New search for: Richard, M. I.
- New search for: Fouet, J.
- New search for: Guichet, C.
- New search for: Mocuta, C.
- New search for: Thomas, O.
- New search for: Thomas, Olivier
- New search for: Guinebretiere, Rene
In:
Size and strain conference; 6th size-strain international conference: diffraction analysis of the microstructure of materials /
;
100-104
;
2013
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ISSN:
- Conference paper / Print
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Title:Exploring Pd-Si(001) and Pd-Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements
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Contributors:Richard, M. I. ( author ) / Fouet, J. ( author ) / Guichet, C. ( author ) / Mocuta, C. ( author ) / Thomas, O. ( author ) / Thomas, Olivier / Guinebretiere, Rene
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Conference:6th, Size and strain conference; 6th size-strain international conference: diffraction analysis of the microstructure of materials / ; 2011 ; Presqu'ile de Giens, France
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Published in:THIN SOLID FILMS ; 530 ; 100-104
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Publisher:
- New search for: Elsevier Sequoia
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Place of publication:[Lausanne]
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Publication date:2013-01-01
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Size:5 pages
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Remarks:ESTAR title.
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
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