INVESTIGATION OF HELIUM ION INDUCED DAMAGE IN NANO-W USING UNU/ICPT DENSE PLASMA FOCUS DEVICE (English)
- New search for: Sharma, Priya
- New search for: Xiao, Chijin
- New search for: Vas, Joseph Vimal
- New search for: Medwal, Rohit
- New search for: Mishra, Mayank
- New search for: Chaurasiya, Avinash
- New search for: Rawat, Rajdeep Singh
- New search for: Luai, Meng Tzee
- New search for: Zheng, Zhang
- New search for: Chaudhary, Varun
- New search for: Sharma, Priya
- New search for: Xiao, Chijin
- New search for: Vas, Joseph Vimal
- New search for: Medwal, Rohit
- New search for: Mishra, Mayank
- New search for: Chaurasiya, Avinash
- New search for: Rawat, Rajdeep Singh
- New search for: Luai, Meng Tzee
- New search for: Zheng, Zhang
- New search for: Chaudhary, Varun
In:
2020 IEEE international conference on plasma science (ICOPS 2020)
;
410-410
;
2020
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ISSN:
- Conference paper / Print
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Title:INVESTIGATION OF HELIUM ION INDUCED DAMAGE IN NANO-W USING UNU/ICPT DENSE PLASMA FOCUS DEVICE
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Contributors:Sharma, Priya ( author ) / Xiao, Chijin ( author ) / Vas, Joseph Vimal ( author ) / Medwal, Rohit ( author ) / Mishra, Mayank ( author ) / Chaurasiya, Avinash ( author ) / Rawat, Rajdeep Singh ( author ) / Luai, Meng Tzee ( author ) / Zheng, Zhang ( author ) / Chaudhary, Varun ( author )
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Conference:2020 IEEE international conference on plasma science (ICOPS 2020)
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Published in:IEEE conference record-abstracts ; 2020 ; 410-410
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Publisher:
- New search for: Institute of Electrical and Electronics Engineers
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Publication date:2020-01-01
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Size:1 pages
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Source:
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