Physics-informed machine-learning for modeling aero-optics (English)
- New search for: Kutz, J. Nathan
- New search for: Sashidhar, Diya
- New search for: Sahba, Shervin
- New search for: Brunton, Steven L.
- New search for: McDaniel, Austin
- New search for: Wilcox, Christopher C.
- New search for: Kutz, J. Nathan
- New search for: Sashidhar, Diya
- New search for: Sahba, Shervin
- New search for: Brunton, Steven L.
- New search for: McDaniel, Austin
- New search for: Wilcox, Christopher C.
In:
Applied Optical Metrology IV
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118170E-118170E-8
;
2021
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ISBN:
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ISSN:
- Conference paper / Print
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Title:Physics-informed machine-learning for modeling aero-optics
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Contributors:Kutz, J. Nathan ( author ) / Sashidhar, Diya ( author ) / Sahba, Shervin ( author ) / Brunton, Steven L. ( author ) / McDaniel, Austin ( author ) / Wilcox, Christopher C. ( author )
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Conference:Applied Optical Metrology IV
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Published in:Applied Optical Metrology IV ; 118170E-118170E-8Proceedings of SPIE, the International Society for Optical Engineering ; 11817 ; 118170E-118170E-8
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Publisher:
- New search for: SPIE
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Publication date:2021-01-01
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Size:118170E-118170E-8
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 118170A
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Noise suppression methods in picometer heterodyne displacement interferometerZhang, Yanqi / Guzman, Felipe et al. | 2021
- 118170B
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A versatile digital holography software for three-dimensional investigationsMansoor, M. M. / Trolinger, J. D. / George, J. et al. | 2021
- 118170D
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Fabry-Perot interferometric sensor to measuring vibrations in mechanical structures based on the Doppler effectMuñoz-Pérez, Josue E. / Muñoz-Pérez, Francisco M. / Ortega-Mendoza, J. Gabriel / Zaca-Morán, Placido / Cruz, José Luis / Andrés, Miguel V. et al. | 2021
- 118170E
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Physics-informed machine-learning for modeling aero-opticsKutz, J. Nathan / Sashidhar, Diya / Sahba, Shervin / Brunton, Steven L. / McDaniel, Austin / Wilcox, Christopher C. et al. | 2021
- 118170G
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Micro-fabrication of Si-based optomechanical inertial sensors for cryogenic temperaturesNelson, Andrea / Guzman, Felipe et al. | 2021
- 118170H
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Determining material parameters with resonant acoustic spectroscopyDioumaev, Andrei K. / Lal, Amit K. K. / Dimas, Dave / Trolinger, James D. et al. | 2021
- 118170I
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Defect detection in additive manufactured products with a new photonics procedure: a case studyLal, Amit K. / Dioumaev, Andrei K. / Dimas, Dave / Trolinger, James D. et al. | 2021
- 118170L
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Progress and characterization of battery-operated microplasmas by a portable optical emission spectrometerQuadeer, Laiba / Zhou, Vera / Karanassios, Vassili et al. | 2021
- 118170M
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Fourier optics modelling of coherence scanning interferometersde Groot, Peter / Colonna de Lega, Xavier / Su, Rong / Coupland, Jeremy / Leach, Richard et al. | 2021
- 118170N
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The state of the art in swept-wavelength laser Fizeau interferometryDeck, Leslie L. / de Groot, Peter J. et al. | 2021
- 118170O
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Suppression of light-field shift of CPT resonances in optically dense mediaRadnatarov, D. / Kobtsev, S. / Andryushkov, V. / Steschenko, T. et al. | 2021
- 118170P
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Statistical analysis of speckle patterns modeled with OpticStudio®Díaz Reyes, Román / Delgado Atencio, José A. / Cunill Rodriguez, Margarita / Cárdenas Rosales, Alejandra / Gonzalez Gutierrez, Enrique et al. | 2021
- 118170Q
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Simultaneous direct and indirect wavefront sensing using multiplexed programmable grating patternsPathak, Biswajit et al. | 2021
- 118170R
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An improved programmable grating array based wavefront sensorPathak, Biswajit et al. | 2021
- 118170S
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The two-dimensional Gaussian filter weighting function for the cylindrical surfaceYing, Zhijun / Yu, Yingjie et al. | 2021
- 1181701
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Front Matter: Volume 11817| 2021
- 1181702
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Measurements with a capacitance gauge for sub-nanometer thermal expansion characterization of optical componentsHarding, Kevin et al. | 2021
- 1181704
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Binary pseudo-random array test standard optimized for characterization of interferometric microscopesMunechika, Keiko / Cabrini, Stefano / Chao, Weilun / Lacey, Ian / Pina-Hernandez, Carlos / Rochester, Simon / Yashchuk, Valeriy V. et al. | 2021
- 1181705
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Measurement systems in the UV A/B/C rangeKonjhodzic, Denan et al. | 2021
- 1181707
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A new approach in optical metrology with multi-angle information through self-interferometric ellipsometryKim, Wookrae / Jung, Jaehwang / Kim, Jinseob / Shin, Inho / Kim, Namyoon / Lee, Myungjun et al. | 2021
- 1181709
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A displacement probe using backscattering for profiling the ground surface formSong, In-Ung / Yang, Ho-Soon / Park, Jun-Gyu / Kim, Goeun / Cho, Kyuman / Kim, Sug-Whan et al. | 2021