Fabrication and test of functional panels for multimission modular satellite platform (English)
- New search for: Coppola, Sara
- New search for: Tortora, Ciro
- New search for: Vespini, Veronica
- New search for: Rippa, Massimo
- New search for: Ferraro, Pietro
- New search for: Coppola, Sara
- New search for: Tortora, Ciro
- New search for: Vespini, Veronica
- New search for: Rippa, Massimo
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In:
Optical Measurement Systems for Industrial Inspection XIII
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126182Z-126182Z-6
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2023
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ISBN:
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ISSN:
- Conference paper / Print
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Title:Fabrication and test of functional panels for multimission modular satellite platform
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Contributors:Coppola, Sara ( author ) / Tortora, Ciro ( author ) / Vespini, Veronica ( author ) / Rippa, Massimo ( author ) / Ferraro, Pietro ( author )
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Conference:Optical Measurement Systems for Industrial Inspection XIII
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Published in:Optical Measurement Systems for Industrial Inspection XIII ; 126182Z-126182Z-6Proceedings of SPIE, the International Society for Optical Engineering ; 12618 ; 126182Z-126182Z-6
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Publisher:
- New search for: SPIE
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Publication date:2023-01-01
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Size:126182Z-126182Z-6
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 126180B
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Improving the accuracy and precision of OCD measurement by systematic error correction in self-interference pupil ellipsometryLee, Seungwoo / Park, Yeeun / Lee, Seungryeol / Chang, Hoonchul / Jung, Jaehwang / Shin, Inho / Jeong, Seoyeon / Lee, Sooyeong / Ahn, Jinwoo / Kim, Taejoong et al. | 2023
- 126180C
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Simultaneous orthogonal shearography using two pairs of parallel slits and a tetra-split lensLima, Tainara Pedrosa / Sánchez Barrera, Estiven / de Oliveira, Bernardo C. F. / Albertazzi G., Armando et al. | 2023
- 126180D
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A fibre optic angle sensing tape for applications in robotics and automationPillai, Sivaji / Charrett, Thomas O. H. / Kissinger, Thomas / James, Stephen W. / Tatam, Ralph P. et al. | 2023
- 126180E
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Multiwavelength study of etalon effects in LCOS-based spatial light modulatorsLiebmann, M. / Engel, P. et al. | 2023
- 126180F
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Three-channel space-qualified high-power pulsed fiber laser system for accurate velocity detection in bistatic configurationMalik, Yagya / Rajan, Lekshmi S. / Umesh, Sharath / Biswas, Shubhajit / Mendheker, Bhavesh / Bhardwaj, Amit / Singh, Nirlesh / Keshavappa, Ravikumar / Lalithya, M. S. / Lohar, K. A. et al. | 2023
- 126180G
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The Nyquist criterion and its applicability in phase-stepping digital shearographyAbedin, Kazi Monowar / Al Jabri, Awatef Rashid / Mujibur Rahman, S. M. et al. | 2023
- 126180H
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Thermal single-shot 3D shape measurement of transparent objects: optimization of the projected statistical LWIR patternLandmann, Martin / Speck, Henri / Das, Saikat Chandra / Heist, Stefan / Kühmstedt, Peter / Notni, Gunther et al. | 2023
- 126180I
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Identification and correction of magnification factor deviations of a telecentric fringe projection systemKern, Pascal / Hinz, Lennart / Kästner, Markus / Reithmeier, Eduard et al. | 2023
- 126180J
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Metrology inside a cryostat using a cutting-edge periscopeGirardot, Adrien / Mignau, Jean-Emmanuel / Renault, Edgard / Loupias, Magali / Jarno, Aurélien / Remillieux, Alban et al. | 2023
- 126180K
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Photogrammetry for optical metrology of parts manufactured by additive manufacturingSemančík, Adam / Hynek, Jakub / Lukačovič, Samuel / Koutecký, Tomáš et al. | 2023
- 126180L
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Microsphere-assisted microscopy: challenges and opportunitiesDarafsheh, Arash / Abbasian, Vahid et al. | 2023
- 126180N
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EUV reflective coherent diffraction imaging system for wafer metrologyShen, Tao / Ansuinelli, Paolo / Mochi, Iacopo / Kang, Young Woo / Ahn, Jinho / Ekinci, Yasin et al. | 2023
- 126180P
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Indirect geometry measurement method based on confocal microscopy and fluorescent microparticlesTausendfreund, Andreas / Espenhahn, Björn / Behrends, Gert / Fischer, Andreas et al. | 2023
- 126180Q
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Robust measurement of surface topography for additive manufacturing using imaging confocal microscopyVilar, Narcís / Artigas, Roger / Duocastella, Martí / Carles, Guillem et al. | 2023
- 126180R
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Double-pass modulated differential confocal microscopy for closed-loop axial control of direct laser writingBelkner, Johannes / Stauffenberg, Jaqueline / Görner Tenorio, Christian / Ortlepp, Ingo / Manske, Eberhard et al. | 2023
- 126180S
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Construction of a time-domain full-field OCT for non-contact volumetric layer thickness measurementBulun, Georgis / Lotz, Marvin / Keksel, Andrej / Stelzer, Gerhard / Seewig, Jörg et al. | 2023
- 126180T
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Improved 3D form profiler based on extending illumination apertureAgour, Mostafa / Falldorf, Claas / Bergmann, Ralf B. et al. | 2023
- 126180U
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Sparse surface profile reconstruction from scattering light distributionsGroche, T. / Seewig, J. / Follmann, V. / Uebel, J. et al. | 2023
- 126180V
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Computational self-correction of scanning nonlinearities in optical profilometryZhukova, Lena / Artigas, Roger / Carles, Guillem et al. | 2023
- 126180W
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Robust semiconductor overlay metrology with non-uniform illumination beams using digital holographic microscopyAdhikary, Manashee / Cromwijk, Tamar / Witte, Stefan / de Boer, Johannes F. / den Boef, Arie et al. | 2023
- 126180X
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Self-assembling of microlenses by pyro-electric effect for the development of compact systemsIncardona, Nicolò / Coppola, Sara / Miccio, Lisa / Bĕhal, Jaromír / Vespini, Veronica / Grilli, Simonetta / Martínez-Corral, Manuel / Ferraro, Pietro et al. | 2023
- 126180Y
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Non-isoplanatic lens aberration corrections in digital holographic microscopyCromwijk, Tamar / Adhikary, Manashee / Konijnenberg, Sander / Coene, Wim / Tukker, Teus / de Boer, Johannes / Witte, Stefan / den Boef, Arie et al. | 2023
- 126180Z
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Nanoscale surface topography using low-cost digital holographic microscopyPandey, Dhruvam / K. N., Subrahmanya / Gannavarapu, Rajshekhar et al. | 2023
- 126181A
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Development of a LiDAR system for low visibility conditionsVierhub-Lorenz, Valentin / Gangelhoff, Jannis / Werner, Christoph S. / Bett, Claudia / Frenner, Karsten / Osten, Wolfgang / Reiterer, Alexander et al. | 2023
- 126181B
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A lightweight laser scanner for UAV-based applicationsGangelhoff, Jannis / von Olshausen, Philipp / Frey, Simon / Reiterer, Alexander et al. | 2023
- 126181C
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Towards image-free object detection for autonomous vehicles under harsh environmental conditionsBett, Claudia M. / Frenner, Karsten / Reichelt, Stephan / Osten, Wolfgang et al. | 2023
- 126181D
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Coherence-gated digital holographic imaging through extended scattering media for autonomous driving vehiclesGröger, Alexander / Pedrini, Giancarlo / Claus, Daniel / Reichelt, Stephan et al. | 2023
- 126181E
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Digital holographic microscopy with functionally-integrated waveguide illuminatorWatanabe, Eriko et al. | 2023
- 126181F
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Surface roughness measurement of large areas with high spatial resolution by spectral speckle correlationLaux, Patrick / Schiller, Annelie / Bertz, Alexander / Carl, Daniel / Reichelt, Stephan et al. | 2023
- 126181G
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Application and performance of laser speckle odometry applied to a mobile industrial robotCharrett, Thomas O. H. / Gibson, Sam J. / Tatam, Ralph P. et al. | 2023
- 126181I
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Portable low-cost setup for outdoor implementation of dynamic speckle techniqueLevchenko, Mikhail / Stoykova, Elena / Hong, Keehoon / Park, Joongki et al. | 2023
- 126181K
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Optimal Mueller matrix imaging polarimeter in the visible band based on division-of-aperturePeña-Gutiérrez, Sara / Royo, Santiago et al. | 2023
- 126181L
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An infrared optical sensor for quantitative inline inspection of nanocoatings on plastic productsHauer, Benedikt / Dorfschmidt, Adrian D. / Münch, Friederike / Scherer, Jens / Carl, Daniel et al. | 2023
- 126181M
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Diffraction-limited mid-infrared hyperspectral single-pixel imaging microscopyZorin, Ivan / Gattinger, Paul / Brandstetter, Markus / Rankl, Christian / Ebner, Alexander et al. | 2023
- 126181N
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Tolerance analysis and design optimization of additively manufactured mechanical structure for a Raman spectrometer systemXia, Panpan / Grabe, Tobias / Biermann, Tobias / Ziebehl, Arved / Teves, Simon / Lachmayer, Roland et al. | 2023
- 126181O
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In-line fluorescence detector for production control in robot-driven environmentsBehrendt, Vivien / Buchta, Dominic / Adolph, Stefan / Lutz, Christian / Scherer, Jens / Blättermann, Alexander et al. | 2023
- 126181Q
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Laser tracker system supporting 3D digital image correlation with dispersed measurement fields of viewStyk, A. / Budiakivska, D. / Jankowski, M. / Kowaluk, T. / Kujawińska, M. et al. | 2023
- 126181S
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Accelerated measurement and defect characterization on large optical componentsLiedmann, Matthias / Machleidt, Torsten et al. | 2023
- 126181T
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An extended model for the kinematic identification of a tiltable laser plane in adaptive light-section triangulationBossemeyer, Hagen / Kästner, Markus / Reithmeier, Eduard et al. | 2023
- 126181U
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Digital holography in a machine tool: measuring large-scale objects with micron accuracySeyler, Tobias / Fratz, Markus / Schiller, Annelie / Bertz, Alexander / Carl, Daniel / Schmitt-Manderbach, Tobias / Langer, Markus et al. | 2023
- 126181V
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Forging measurement using passive stereo visionVítek, Petr / Hurník, Jakub / Vaverka, Ondrěj / Koutný, Daniel et al. | 2023
- 126181W
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Measurement analysis of optical micrometers with polygonal mirror-based laser scannersTeodorovits, Attila Tiberiu / Mnerie, Corina / Duma, Virgil-Florin et al. | 2023
- 126181X
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Comparative performance of high and medium resolution cameras for defect detection in carbon-fiber reinforced composites by digital shearographyAbedin, Kazi Monowar / Tao, Nan / Anisimov, Andrei G. / Groves, Roger M. et al. | 2023
- 126181Z
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Uncertainty reduction of CO2 laser calibration system in National Institute of Metrology (Thailand)Nontapot, Kanokwan / Nutsathaporn, Chanasorn et al. | 2023
- 126182A
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High NA lens assessment using self-interference incoherent digital holographyKim, Youngrok / Sung, Hyunsik / Son, Wonseok / Min, Sung-Wook et al. | 2023
- 126182D
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Adaptive Shack-Hartmann wavefront system with extended dynamic range for lens characterizationAbdelazeem, Rania M. / Ahmed, Mahmoud M. A. / Agour, Mostafa et al. | 2023
- 126182E
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Accurate spectral transmittance measurement method of highly-opaque materials in the UV-to-IR using optical attenuatorsMahmoud, Khaled M. / AlMakhlifi, Khalid E. et al. | 2023
- 126182K
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Automated assessment for grinding spots on aircraft landing gear components using robotic white light interferometryEhrbar, Jessica / Kähler, Falko / Schüppstuhl, Thorsten et al. | 2023
- 126182L
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Characterization of the maximum measurable slope of optical topography measuring instrumentsGao, Sai / Felgner, Andre / Hueser, Dorothee / Wyss, Silvana / Brand, Uwe et al. | 2023
- 126182N
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Detection of geometrical patterns of self-assembled gold nanospheres and top-down fabricated nanostructures using coherent Fourier scatterometryKrämer, Sandra / Kroth, Kathrin / Sure, Thomas / Klar, Peter J. et al. | 2023
- 126182O
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Studies on micromanipulation capabilities of micro-objects and combined Raman spectroscopy based on photonic jet fiber opticSchmiedel, K. / Kabardiadi-Virkovski, A. / Baselt, T. / Hartmann, P. et al. | 2023
- 126182P
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Investigation to evaluate the aging condition utilizing UV radiation of carbon black filled rubber compounds as measured by ATR spectroscopyRudek, F. / Weichenhain, L. / Hartmann, P. et al. | 2023
- 126182Q
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Improving the phase modulation of spatial light modulator using Shack-Hartmann wavefront sensorAbdelazeem, Rania M. / Ahmed, Mahmoud M. A. / Hassab-Elnaby, Salah / Agour, Mostafa et al. | 2023
- 126182R
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Conical null-screen design for evaluating fast free-form convex surfacesBautista-Clemente, Francisco J. / Campos-García, Manuel / Aguirre, Daniel / Gonzalez-Utrera, Dulce / Villalobos-Mendoza, Brenda et al. | 2023
- 126182S
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Shape measurement of phase objects using fringe projection techniqueTrivedi, V. / Joglekar, M. / Utadiya, S. / Chhiller, N. / Sharma, S. / Sheoran, G. / Anand, A. et al. | 2023
- 126182T
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Detection of delaminated areas in thermal barrier coatings by active infrared thermography using different heat sourcesGarcía-Revuelta, Andrés / Román, Jhonatan / Arboleda, Alexander / Toro, Alejandro / Restrepo-Martínez, Alejandro et al. | 2023
- 126182U
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Rapid surface metrology of freeform shapes using CGH interferometryLaVilla, Edward / Burge, James H. / Ament, Shelby D. V. / Beverage, Jake / Steele, Tyler / Zhao, Chunyu et al. | 2023
- 126182V
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Non-destructive evaluation of thermal barrier coating thickness using IR thermography in chemical removal processesRomán-Román, Jhonatan / García-Revuelta, Andrés / Restrepo-Martínez, Alejandro / Toro-Betancur, Alejandro / Muñoz-Giraldo, Oscar D. et al. | 2023
- 126182W
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Development of a liquid interferometric optical microscope (L-IOM) in phase-shift mode with standard Mirau objectivesJobin, Marc et al. | 2023
- 126182X
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New wafer shape measurement technique for 300mm blank vertically held silicon wafersTrujillo-Sevilla, Juan M. / Abrante, Rubén / Jiménez, Miguel / Ivanov Kurtev, Kiril / Castro Luis, Guillermo / Gaudestad, Jan O. et al. | 2023
- 126182Y
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3D hologram optical element for angle measuring devices and sighting systemsTyurin, A. V. / Zhukov, S. A. / Akhmerov, A. Yu. et al. | 2023
- 126182Z
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Fabrication and test of functional panels for multimission modular satellite platformCoppola, Sara / Tortora, Ciro / Vespini, Veronica / Rippa, Massimo / Ferraro, Pietro et al. | 2023
- 1261801
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Front Matter: Volume 12618| 2023
- 1261802
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The use of deep learning for computational optical imaging: from data driven to physics drivenSitu, Guohai et al. | 2023
- 1261803
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AI-based solution for robust detection with optical microresonatorsSaetchnikov, Anton / Hack, Ben Luis / Vonk, Daniel / Glasmachers, Tobias / Mosig, Axel / Ostendorf, Andreas et al. | 2023
- 1261804
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Thin-film thickness measurement based on spectral reflectometer using artificial neural network algorithmJin, Jonghan / Lee, Joonyoung et al. | 2023
- 1261805
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AI-guided numerical-aperture-controlled scatterometry for measurement of deep HAR and thin-film structures with a large depth variationFu, Zih-Ying / Yang, Fu-Sheng / Wu, Min-Ru / Hung, Yen-Hung / Chen, Liang-Chia et al. | 2023
- 1261806
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In-process powder bed monitoring with angular illuminationMilde, Thomas / Freytag, Alexander / Ghazaei, Ghazal et al. | 2023
- 1261808
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Laser drilling controlled by laser-generated soundKomatsu, Sotaro / Miura, Takuma / Hayasaki, Yoshio et al. | 2023
- 1261809
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Sensor-guided machining of large-scale CFRP components based on resin transfer molded featuresMuth, M. / Carstensen, P. / Hintze, W. / Gnadt, S. / Brillinger, C. / Möller, C. / Böhlmann, C. et al. | 2023
- 1261812
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Compatibility analysis of profile and areal material measuresEifler, Matthias / Hering-Stratemeier, Julian / von Freymann, Georg / Seewig, Jörg et al. | 2023
- 1261813
-
Investigations on the accuracy and evaluation of the uncertainty of stitching in optical surface metrologySchaude, Janik / Hausotte, Tino et al. | 2023
- 1261815
-
Improved alignment of the setup for traceable measurements of the modulation transfer function (MTF)Dierke, Hanno / Schake, Markus et al. | 2023
- 1261816
-
Long-term wavelength stabilisation of widely modulated lasersWiseman, Kieran B. / Kissinger, Thomas / Tatam, Ralph P. et al. | 2023
- 1261817
-
Precision form measurement of biconic surfaces using scanning Fizeau interferometryDresel, Thomas et al. | 2023
- 1261818
-
Versatile modulation transfer function and direct point spread function measurement with a random target methodMichaud, F. et al. | 2023
- 1261820
-
Photoelastic and Stokes images through deep convolutional neural networks: a comparison of stress fieldsEusse Naranjo, Diego / Restrepo-Martínez, Alejandro et al. | 2023
- 1261821
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Optical design of refractive imaging spectrometer for semiconductor metrologyPeng, Wei-Jei / Chen, Ming-Fu / Lee, Tsung-Xian et al. | 2023
- 1261823
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Interferograms analysis for measuring the thickness of aluminum thin filmsChoque, Ivan / Asmad, Miguel / Miranda, Josue / Quispe, Alberto et al. | 2023
- 1261824
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Laser-based measurement system for the detection of delamination in tunnel liningsVierhub-Lorenz, Valentin / Werner, Christoph S. / Weiher, Karsten / Heinze, Christoph / Reiterer, Alexander et al. | 2023
- 1261825
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OCT versus x-ray imaging in the inspection of ball grid arrays (BGAs)Coroban, Sorina / Mnerie, Corina Anca / Duma, Virgil-Florin et al. | 2023
- 1261826
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Thickness analysis of double-layered thin-film sample using spectral reflectometryPark, J. / Bae, J. / Jang, Y.-S. / Jin, J. et al. | 2023
- 1261829
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Intensity-based dynamic speckle method for analysis of variable-rate dynamic eventsStoykova, Elena / Nedelchev, Lian / Blagoeva, Blaga / Ivanov, Branimir / Levchenko, Mikhail / Berberova-Buhova, Nataliya / Nazarova, Dimana et al. | 2023
- 1261831
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Pyro-electrohydrodynamic printing of liquid crystalsVespini, Veronica / Behal, Jaromir / Miccio, Lisa / De Sio, Luciano / Coppola, Sara / Ferraro, Pietro et al. | 2023
- 1261833
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Robotization of engineering equipment to improve the safety of emergency rescue operations using optical methodsKazaryan, M. / Shakhramanyan, M. / Zelensky, A. / Semenishchev, E. et al. | 2023
- 1261834
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Block-based multi-scale image enhancement method for industrial inspection systemVoronin, V. / Gapon, N. / Zhdanova, M. / Semenishchev, E. / Zelensky, A. / Ilyukhin, Yu. et al. | 2023
- 1261835
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Development of a full-field polarization interferometer for measurement of wafer surface profileTsai, Yue-Jhe / Tsai, Hsing-Hsien / Lee, Ju-Yi / Hsieh, Hung-Lin et al. | 2023
- 1261836
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Absolute flatness measurement based on shift-rotation method using the second deviationZhang, Jiayi / Chen, Dapeng / Liu, Shijie / Bai, Yunbo / Shao, Jianda / Lu, Qi et al. | 2023